Abstract: In an apparatus for determining the level of dynamic force required to cause damage to an electronic device, the electronic device may be placed beneath a ram assembly of a dynamic impact testing device. The dynamic impact testing device has a selection of a plurality of different types of tip members, which may be retained by an attachment portion of the ram assembly. The ram assembly is reciprocally movable relative to a base portion with a target area. The ram assembly being positioned relative to said base portion so that said tip portion can impact said target area when the tip member is mounted to said attachment portion.

Abstract: In a method and apparatus for determining the level of dynamic force required to cause damage to an electronic device, the electronic device may be placed beneath a ram assembly of a dynamic impact testing device. Thereafter, the ram assembly may be used to impact the electronic device to determine a threshold level of dynamic force that will cause damage to the electronic device. The ram assembly may then be used to impact a load cell with the threshold level of dynamic force so that the load cell generates a data output.

Abstract: In a method and apparatus for determining the level of dynamic force required to cause damage to an electronic device, the electronic device may be placed beneath a ram assembly of a dynamic impact testing device. Thereafter, the ram assembly may be used to impact the electronic device to determine a threshold level of dynamic force that will cause damage to the electronic device. The ram assembly may then be used to impact a load cell with the threshold level of dynamic force so that the load cell generates a data output.