Abstract: Methods and systems mitigate a soft error in an integrated circuit. A map is stored in a memory, and the map specifies a criticality class for each storage bit in the integrated circuit. A mitigative technique is associated with each criticality class. The soft error is detected in a corrupted one of the storage bits. The mitigative technique is performed that is associated with the criticality class specified in the map for the corrupted storage bit.

Abstract: Methods and systems estimate a rate of corruption of storage bits in a logic circuit. One or more processors execute instructions that cause the processors to perform the operations that follow. A description is input describing an environment of the logic circuit, and the description of the environment includes a position of the logic circuit. An atomic particle flux density at the logic circuit is estimated as a function of the description of the environment. A specification is input that specifies the storage bits in the logic circuit. The rate of corruption of the storage bits is determined as a function of the atomic particle flux density and a quantification of the storage bits in the logic circuit.

Abstract: A method of verifying configuration data to be loaded into a device having programmable logic is described. The method comprising the steps of validating a configuration bitstream to be loaded into the device having programmable logic; storing a validation indicator with the configuration bitstream in a non-volatile memory device; and configuring the programmable logic according to the configuration bitstream if the validation indicator indicates that valid data is stored in the non-volatile memory device. A system for verifying configuration data to be loaded into a device having programmable logic is also described.