Patents by Inventor James A. Kyle

James A. Kyle has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7765445
    Abstract: System-accessible frequency measuring circuits and procedures permit on-chip testing of the oscillators and provide test results observable off chip via LSSD scan paths. This allows a rapid ensemble of ring oscillators in a standard ASIC test flow without the need for on chip analog test equipment (the test apparatus has effectively been created on device and can be digitally configured, operated and read). Frequency measuring logic that can 1) functionally operate to measure the frequency of the ring oscillators; 2) participate in traditional logical tests such as LSSD and LBIST to verify that the circuit is manufactured correctly and is likely to operate and 3) operate in a special ring-oscillator test mode, that allows the logic to operate on a tester very similarly to the way it does functionally. In this mode, the frequency measuring logic can be scanned to a specific state, started by pulsing a digital I/O, and the measured analog value can be scanned out sometime later after the test has completed.
    Type: Grant
    Filed: February 16, 2008
    Date of Patent: July 27, 2010
    Assignee: International Business Machines Corporation
    Inventors: Joseph E. Eckelman, Kevin C. Gotze, James A. Kyle, Jennifer Yuk Sim Yan
  • Publication number: 20090210760
    Abstract: System-accessible frequency measuring circuits and procedures permit on-chip testing of the oscillators and provide test results observable off chip via LSSD scan paths. This allows a rapid ensemble of ring oscillators in a standard ASIC test flow without the need for on chip analog test equipment (the test apparatus has effectively been created on device and can be digitally configured, operated and read). Frequency measuring logic that can 1) functionally operate to measure the frequency of the ring oscillators; 2) participate in traditional logical tests such as LSSD and LBIST to verify that the circuit is manufactured correctly and is likely to operate and 3) operate in a special ring-oscillator test mode, that allows the logic to operate on a tester very similarly to the way it does functionally. In this mode, the frequency measuring logic can be scanned to a specific state, started by pulsing a digital I/O, and the measured analog value can be scanned out sometime later after the test has completed.
    Type: Application
    Filed: February 16, 2008
    Publication date: August 20, 2009
    Applicant: INTERNATIONAL BUSINESS MACHINES CORPORATION
    Inventors: Joseph E. Eckelman, Kevin C. Gotze, James A. Kyle, Jennifer Yuk Sim Yan