Abstract: Systems and methods for detecting defects on a reticle are provided. One system is configured for generating different stacked difference images for multiple instances of first patterned areas in different rows on a wafer based on images generated for the first patterned areas in the different rows. The system is also configured for performing double detection based on the different stacked difference images. The system then identifies defects on the reticle based on the defects detected by the double detection. As described further herein, the systems and methods detect defects from multiple reticle rows printed on a wafer, which can reduce noise and enable detection of substantially small repeater defects. The embodiments are particularly useful for high sensitivity repeater defect detection for extreme ultraviolet (EUV) reticles and multi-die reticles (MDR).

Abstract: Systems and methods for managing third party data are provided. A third party data management system includes a processing circuit. The processing circuit is configured to receive first third party activity data from a source computing system and via a cybersecurity correlation and analytics computing system, determine a computing entity external to the third party data management system associated with the third party activity data based on at least one item extracted from the first third party activity data, periodically monitor third party activity associated with the computing entity, comprising operations to collect second third party activity data, and correlate the monitored second third party activity data to an entity profile.

Abstract: A system may comprise a sensor, a transmitter, and a receiver where the transmitter and receiver are remote from the sensor. The receiver may include a processor and instructions to receive a signal comprising a plurality of subcarriers and including first radio waves and second radio waves, determine a signal to noise ratio of each of the subcarriers, and extract the first radio waves from the signal responsive to the signal to noise ratio of each of the subcarriers. Methods and non-transitory computer-readable media are also disclosed.

Abstract: Systems and methods for managing third party data are provided. A third party data management system includes a processing circuit. The processing circuit is configured to receive first third party activity data from a source computing system and via a cybersecurity correlation and analytics computing system, determine a computing entity external to the third party data management system associated with the third party activity data based on at least one item extracted from the first third party activity data, periodically monitor third party activity associated with the computing entity, comprising operations to collect second third party activity data, and correlate the monitored second third party activity data to an entity profile.

Abstract: Disclosed are methods and devices for minimally-invasive appendectomies. The methods may comprise inserting an inverter apparatus into an interior cavity of the appendix of a subject and inverting the appendix, closing the base portion of the inverted appendix with the one or more closure devices, separating the inverted appendix from the cecum with a separation apparatus positioned at the base portion of the inverted appendix adjacent to the one or more closure devices, and removing the separated appendix from the subject through the colon.

Abstract: Systems and methods for detecting defects on a reticle are provided. One system is configured for generating different stacked difference images for multiple instances of first patterned areas in different rows on a wafer based on images generated for the first patterned areas in the different rows. The system is also configured for performing double detection based on the different stacked difference images. The system then identifies defects on the reticle based on the defects detected by the double detection. As described further herein, the systems and methods detect defects from multiple reticle rows printed on a wafer, which can reduce noise and enable detection of substantially small repeater defects. The embodiments are particularly useful for high sensitivity repeater defect detection for extreme ultraviolet (EUV) reticles and multi-die reticles (MDR).

Abstract: An erodible anhydrous film useful in delivering active agents to a surface including keratinous surfaces, and hard or soft surfaces is disclosed. The erodible anhydrous film contains polyethylene oxide in combination with a support polymer, and optionally, other additives for skin care, fabric care, or hard surface cleaning. The erodible anhydrous film is useful when used as a comfort strip for enhancing shaving.

Abstract: Disclosed are methods and devices for endocardial left atrial appendage management (LAAM) by inversion and excision. The methods may comprise inserting an inverter apparatus into an interior cavity of the left atrial appendage (LAA) of a subject and inverting the LAA, closing the base portion of the inverted LAA with the one or more closure devices, separating the inverted LAA from the left atrium with a separation apparatus positioned at the base portion of the inverted LAA adjacent to the one or more closure devices, and removing the separated LAA from the subject.

Abstract: Systems, devices, and methods related to generating and/or transmitting sensor measurement data are described. A device may include a first conductive pad positioned on a first surface of a substrate. The device may also include a second conductive pad positioned on a second, opposite surface of the substrate. Further, the device may include an inductive coil coupled between the first electrical pad and the second electrical pad. Also, the device may include a third conductive pad positioned on a third surface of the substrate and configured to couple to a sensor. The device may include a fourth conductive pad positioned on a fourth surface of the substrate and configured to couple to the sensor. The device may be configured to wirelessly transmit a signal.

Abstract: A sample characterization system is disclosed. In embodiments, the sample characterization system includes a controller communicatively coupled to an inspection sub-system, the controller including one or more processors configured to execute a set of program instructions stored in memory, the set of program instructions configured to cause the one or more processors to: acquire one or more target image frames of a sample; generate a target tensor with the one or more acquired target image frames; perform a first set of one or more decomposition processes on the target tensor to generate one or more reference tensors including one or more reference image frames; identify one or more differences between the one or more target image frames and the one or more reference image frames; and determine one or more characteristics of the sample based on the one or more identified differences.

Abstract: Systems and methods for detecting defects on a reticle are provided. One system includes computer subsystem(s) configured for performing at least one repeater defect detection step in front-end processing during an inspection process performed on a wafer having features printed in a lithography process using a reticle. The at least one repeater defect detection step performed in the front-end processing includes identifying any defects detected at corresponding locations in two or more test images by double detection and any defects detected by stacked defect detection as first repeater defect candidates. One or more additional repeater defect detections may be performed on the first repeater defect candidates to generate final repeater defect candidates and identify defects on the reticle from the final repeater defect candidates.

Abstract: A slurry outlet system including a top sub, a closure sleeve movable relative to the top sub between a closed position and an open position, a seal mounted on one or the other of the top sub or the closure sleeve, a protector sleeve disposed to cover the seal until displaced by one or the other of the top sub or the closure sleeve that does not include the seal during movement to the closed position. A method for pressure sealingly closing a slurry outlet system including bringing a closure sleeve into proximity with a top sub of the slurry outlet system, displacing a protector sleeve, with the closure sleeve, off a seal disposed about the closure sleeve and simultaneously making sealing contact between the top sub and the seal.

Abstract: A slurry outlet system including a top sub having a seal, a closure sleeve positionable in an open position spaced from the top sub during a slurry pumping operation and a closed position wherein the closure sleeve sealingly interacts with the seal, a protector sleeve disposed to protect the seal and movable upon the closure sleeve becoming sufficiently close to the protector sleeve. A method for pressure sealingly closing a slurry outlet system including bringing a closure sleeve into proximity with a top sub of the slurry outlet system, displacing a protector sleeve, with the closure sleeve, off a seal of the top sub and simultaneously making sealing contact between the closure sleeve and the seal.

Abstract: Systems and methods for detecting defects on a reticle are provided. One system includes computer subsystem(s) configured for performing at least one repeater defect detection step in front-end processing during an inspection process performed on a wafer having features printed in a lithography process using a reticle. The at least one repeater defect detection step performed in the front-end processing includes identifying any defects detected at corresponding locations in two or more test images by double detection and any defects detected by stacked defect detection as first repeater defect candidates. One or more additional repeater defect detections may be performed on the first repeater defect candidates to generate final repeater defect candidates and identify defects on the reticle from the final repeater defect candidates.

Abstract: Systems, devices, and methods related to generating and/or transmitting sensor measurement data are described. A device may include a first conductive pad positioned on a first surface of a substrate. The device may also include a second conductive pad positioned on a second, opposite surface of the substrate. Further, the device may include an inductive coil coupled between the first electrical pad and the second electrical pad. Also, the device may include a third conductive pad positioned on a third surface of the substrate and configured to couple to a sensor. The device may include a fourth conductive pad positioned on a fourth surface of the substrate and configured to couple to the sensor. The device may be configured to wirelessly transmit a signal.

Abstract: A sample characterization system is disclosed. In embodiments, the sample characterization system includes a controller communicatively coupled to an inspection sub-system, the controller including one or more processors configured to execute a set of program instructions stored in memory, the set of program instructions configured to cause the one or more processors to: acquire one or more target image frames of a sample; generate a target tensor with the one or more acquired target image frames; perform a first set of one or more decomposition processes on the target tensor to form generate one or more reference tensors including one or more reference image frames; identify one or more differences between the one or more target image frames and the one or more reference image frames; and determine one or more characteristics of the sample based on the one or more identified differences.

Abstract: Methods for calibration of non-contact velocity measurements and systems for implementing the same are described. Generally, the method comprises inducing a shock wave into a sample at a stress intensity that varies across the sample's elastic limit, which corresponds to the elastic-plastic state transition of the sample. That transition state may be at the sample's Hugoniot elastic limit. The velocity of the sample is measured using a non-contact velocity measurement instrument such as a velocimeter. The measurement may be compared to a predicted velocity or a velocity measurement made by another system to determine calibration parameters.

Abstract: Systems and methods for detecting defects on a wafer are provided. One method includes generating output for a wafer by scanning the wafer with an inspection system using first and second optical states of the inspection system. The first and second optical states are defined by different values for at least one optical parameter of the inspection system. The method also includes generating first image data for the wafer using the output generated using the first optical state and second image data for the wafer using the output generated using the second optical state. In addition, the method includes combining the first image data and the second image data corresponding to substantially the same locations on the wafer thereby creating additional image data for the wafer. The method further includes detecting defects on the wafer using the additional image data.

Abstract: Sealing assemblies for use in creating a fluid seal between two affixed components include a retaining groove and a resilient, compressible sealing element. Rigid back-up members are also disposed within the retaining groove. Interaction of the back-up members with the side surfaces of the retaining groove help to retain the sealing element and back-up members within the retaining groove and prevent extrusion of the sealing element.

Abstract: A rotating ball valve assembly includes a rotatable ball element. The rotatable ball element includes a first side portion, a second side portion, and a central passage. One of the first and second side portions includes first and second outwardly projecting pin elements. A sliding sleeve assembly includes a sliding sleeve member having a first guide track with a first force reducing profile associated with the first outwardly projecting pin element and a second guide track having a second force reducing profile associated with the second outwardly projecting pin element. The sliding sleeve member is shiftable relative to the first and second tubular members to selectively pivot the rotatable ball element between an open orientation and a closed orientation.