Patents by Inventor James Baggiore

James Baggiore has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Damage reduction method and apparatus for destructive testing of power semiconductors
    Patent number: 9759763
    Abstract: A device and method for limiting damage to a semiconductor device under test when the semiconductor device fails during a high current, or high power test is provided. The occurrence of a failure of the device under test is detected, and power applied to the semiconductor device is diverted through a parallel path element upon detection of failure of the semiconductor device.
    Type: Grant
    Filed: July 27, 2012
    Date of Patent: September 12, 2017
    Assignee: Integrated Technology Corporation
    Inventors: Rodney E. Schwartz, Steve Clauter, David Lohr, Gary Rogers, James Baggiore
  • DAMAGE REDUCTION METHOD AND APPARATUS FOR DESTRUCTIVE TESTING OF POWER SEMICONDUCTORS
    Publication number: 20130027067
    Abstract: A device and method for limiting damage to a semiconductor device under test when the semiconductor device fails during a high current, or high power test is provided. The occurrence of a failure of the device under test is detected, and power applied to the semiconductor device is diverted through a parallel path element upon detection of failure of the semiconductor device.
    Type: Application
    Filed: July 27, 2012
    Publication date: January 31, 2013
    Applicant: INTEGRATED TECHNOLOGY CORPORATION
    Inventors: Rodney E. Schwartz, Steve Clauter, David Lohr, Gary Rogers, James Baggiore