Patents by Inventor James Bernard Webb

James Bernard Webb has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • ABIST-assisted detection of scan chain defects
    Patent number: 7225374
    Abstract: An apparatus, program product and method utilize an ABIST circuit provided on an integrated circuit device to assist in the identification and location of defects in a scan chain that is also provided on the integrated circuit device. In particular, a defect in a scan chain may be detected by applying a plurality of pattern sets to a scan chain coupled to an ABIST circuit, collecting scan out data generated as a result of the application of the plurality of pattern sets to the scan chain, and using the collected scan out data to identify a defective latch in the scan chain.
    Type: Grant
    Filed: December 4, 2003
    Date of Patent: May 29, 2007
    Assignee: International Business Machines Corporation
    Inventors: Todd Michael Burdine, Donato Orazio Forlenza, Orazio Pasquale Forlenza, William James Hurley, Steven Michnowski, James Bernard Webb