Abstract: A model that is stored in a memory is accessed. The model describes a visualization of information related to the operation of one or more industrial control machines or systems. Display information is received from the one or more industrial machines or systems. Context information is received from one or more sensors, or from user input. A display screen is graphically rendered at a graphical display unit to the one or more users. The content of the display screen is based upon the model, the display information, and the context.

Abstract: A model that is stored in a memory is accessed. The model describes a visualization of information related to the operation of one or more industrial control machines or systems. Display information is received from the one or more industrial machines or systems. Context information is received from one or more sensors, or from user input. A display screen is graphically rendered at a graphical display unit to the one or more users. The content of the display screen is based upon the model, the display information, and the context.

Abstract: A system and method are disclosed for controlling an ion beam. A deceleration lens is disclosed for use in an ion implanter. The lens may include a suppression electrode, first and second focus electrodes, and first and second shields. The shields may be positioned between upper and lower portions of the suppression electrode. The first and second shields are positioned between the first focus electrode and an end station of the ion implanter. Thus positioned, the first and second shields protect support surfaces of said first and second focus electrodes from deposition of back-streaming particles generated from said ion beam. In some embodiments, the first and second focus electrodes may be adjustable to enable the electrode surfaces to be adjusted with respect to a direction of the ion beam. By adjusting the angle of the focus electrodes, parallelism of the ion beam can be controlled. Other embodiments are described and claimed.

Abstract: A system and method are disclosed for controlling an ion beam. A deceleration lens is disclosed for use in an ion implanter. The lens may include a suppression electrode, first and second focus electrodes, and first and second shields. The shields may be positioned between upper and lower portions of the suppression electrode. The first and second shields are positioned between the first focus electrode and an end station of the ion implanter. Thus positioned, the first and second shields protect support surfaces of said first and second focus electrodes from deposition of back-streaming particles generated from said ion beam. In some embodiments, the first and second focus electrodes may be adjustable to enable the electrode surfaces to be adjusted with respect to a direction of the ion beam. By adjusting the angle of the focus electrodes, parallelism of the ion beam can be controlled. Other embodiments are described and claimed.