Patents by Inventor James Borthwick
James Borthwick has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
-
Publication number: 20220260399Abstract: A vaporizer (20) is shaped to define a flow channel (120) that is open to an environment external to the vaporizer at first and second ends of the flow channel. At the first end of the flow channel is a mouthpiece (112) of the vaporizer. A flow sensor (114) includes (a) a nanoscale resistive element (200) disposed at least partially within the flow channel and (b) sensing circuitry (115) configured to measure a change in the nanoscale resistive element due to airflow within the flow channel. Other applications are also described.Type: ApplicationFiled: July 16, 2020Publication date: August 18, 2022Applicant: INSTRUMEMS INC.Inventors: Gilad ARWATZ, James BORTHWICK, Jeffrey DIAMENT
-
Patent number: 11402348Abstract: Numerous embodiments of a bubble detection apparatus and method are disclosed. In one embodiment, a bubble detection module is placed into a liquid to be monitored. The module comprises a physical structure housing a nanowire sensing element. The liquid flows through the physical structure. An electric bias is placed across the nanowire sensing element, and the resistance of the nanowire sensing element changes when a bubble is in contact with the element. A change in voltage or current of the bias signal can be measured to identify the exact instances when a bubble is in contact with the nanowire sensing element.Type: GrantFiled: June 16, 2020Date of Patent: August 2, 2022Assignee: INSTRUMEMS, INC.Inventors: Gilad Arwatz, Jeffrey Diament, James Borthwick
-
Patent number: 11054444Abstract: A voltage limiting circuit for limiting the voltage developed across a current sensing circuit and a method are disclosed. The voltage limiting circuit includes an input terminal configured to receive an input signal from the current sensing circuit, and an output terminal configured to receive an output signal from the current sensing circuit. A voltage sense circuit is connected to the input terminal and output terminal to detect that a predefined threshold voltage is developed between the input terminal and output terminal. An activation circuit receives a signal from the voltage sense circuit to activate the voltage limiting circuit, and a level shifting circuit interfaces the voltage sense circuitry to the activation circuitry and other circuits by level shifting signals to required levels.Type: GrantFiled: December 19, 2017Date of Patent: July 6, 2021Assignee: QualiTau, Inc.Inventor: James Borthwick
-
Publication number: 20200393396Abstract: Numerous embodiments of a bubble detection apparatus and method are disclosed. In one embodiment, a bubble detection module is placed into a liquid to be monitored. The module comprises a physical structure housing a nanowire sensing element. The liquid flows through the physical structure. An electric bias is placed across the nanowire sensing element, and the resistance of the nanowire sensing element changes when a bubble is in contact with the element. A change in voltage or current of the bias signal can be measured to identify the exact instances when a bubble is in contact with the nanowire sensing element.Type: ApplicationFiled: June 16, 2020Publication date: December 17, 2020Inventors: Gilad ARWATZ, Jeffrey DIAMENT, James BORTHWICK
-
Patent number: 10690715Abstract: A signal distribution apparatus for distributing a stress signal to a plurality of devices under test (DUTs) is disclosed. The distribution apparatus includes a single input that receives the stress voltage signal to be distributed, a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs, and a plurality of integrated current limiter and switch circuits. Each integrated current limiter and switch circuit connects a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and includes at least one combined switching and current limiting element.Type: GrantFiled: May 2, 2018Date of Patent: June 23, 2020Assignee: QualiTau, Inc.Inventor: James Borthwick
-
Publication number: 20180321300Abstract: A signal distribution apparatus for distributing a stress signal to a plurality of devices under test (DUTs) is disclosed. The distribution apparatus includes a single input that receives the stress voltage signal to be distributed, a plurality of outputs that distribute the stress voltage signal to the plurality of DUTs, and a plurality of integrated current limiter and switch circuits. Each integrated current limiter and switch circuit connects a DUT of the plurality of DUTs to the single input through one of the plurality of outputs, and includes at least one combined switching and current limiting element.Type: ApplicationFiled: May 2, 2018Publication date: November 8, 2018Inventor: James BORTHWICK
-
Publication number: 20180172734Abstract: A voltage limiting circuit for limiting the voltage developed across a current sensing circuit and a method are disclosed. The voltage limiting circuit includes an input terminal configured to receive an input signal from the current sensing circuit, and an output terminal configured to receive an output signal from the current sensing circuit. A voltage sense circuit is connected to the input terminal and output terminal to detect that a predefined threshold voltage is developed between the input terminal and output terminal. An activation circuit receives a signal from the voltage sense circuit to activate the voltage limiting circuit, and a level shifting circuit interfaces the voltage sense circuitry to the activation circuitry and other circuits by level shifting signals to required levels.Type: ApplicationFiled: December 19, 2017Publication date: June 21, 2018Inventor: James Borthwick
-
Patent number: 9772351Abstract: Pulsed current circuitry for electromigration testing of semiconductor integrated circuits and components. The circuit includes a multiplexer that outputs analog voltage pulses, and is capable of generating both bipolar and unipolar voltage pulses. At least one operational amplifier and resistor receive the voltage pulses from the multiplexer and convert the voltage pulses to current pulses. A charge booster circuit is provided for minimizing overshoots and undershoots during transitions between current levels in the test circuit.Type: GrantFiled: November 7, 2016Date of Patent: September 26, 2017Assignee: QualiTau, Inc.Inventors: Jens Ullmann, Gedaliahoo Krieger, James Borthwick
-
Publication number: 20170131327Abstract: Pulsed current circuitry for electromigration testing of semiconductor integrated circuits and components. The circuit includes a multiplexer that outputs analog voltage pulses, and is capable of generating both bipolar and unipolar voltage pulses. At least one operational amplifier and resistor receive the voltage pulses from the multiplexer and convert the voltage pulses to current pulses. A charge booster circuit is provided for minimizing overshoots and undershoots during transitions between current levels in the test circuit.Type: ApplicationFiled: November 7, 2016Publication date: May 11, 2017Inventors: Jens ULLMANN, Gedaliahoo KRIEGER, James BORTHWICK
-
Patent number: 7812589Abstract: A current source is provided with two resistor banks, and digital potentiometers are used to control how much each resistor bank affects the resulting output current. Furthermore, when the digital potentiometers are at a particular setting such that a particular resistor bank does not affect the resulting output current (i.e., the resistor bank is “inactive”), the resistance of that resistor bank can be switched without affecting the output current, thus minimizing or eliminating discontinuities in the output current during a current sweep operation. Thus, for example, when a resistor bank meets its threshold and becomes inactive, the resistance of the inactive resistor bank may be switched, and then the digital potentiometer setting may be changed to facilitate smoothly reactivating that resistor bank, with the new resistance.Type: GrantFiled: August 28, 2008Date of Patent: October 12, 2010Assignee: QualiTau, Inc.Inventors: James Borthwick, Peter P. Cuevas, Tal Raichman
-
Publication number: 20100052633Abstract: A current source is provided with two resistor banks, and digital potentiometers are used to control how much each resistor bank affects the resulting output current. Furthermore, when the digital potentiometers are at a particular setting such that a particular resistor bank does not affect the resulting output current (i.e., the resistor bank is “inactive”), the resistance of that resistor bank can be switched without affecting the output current, thus minimizing or eliminating discontinuities in the output current during a current sweep operation. Thus, for example, when a resistor bank meets its threshold and becomes inactive, the resistance of the inactive resistor bank may be switched, and then the digital potentiometer setting may be changed to facilitate smoothly reactivating that resistor bank, with the new resistance.Type: ApplicationFiled: August 28, 2008Publication date: March 4, 2010Applicant: QUALITAU, INC.Inventors: James BORTHWICK, Peter P. CUEVAS, Tal RAICHMAN
-
Patent number: 7151389Abstract: A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test caused by the stress simulator. The dual channel source measurement unit decouples the stress and monitor portions of the unit so that the requirements of each can be optimized. Deglitching and current clamp switches can be incorporated in the dual channel source measurement unit to prevent glitches in the switching circuitry and to limit or clamp current flow to or from the monitor and stress sources.Type: GrantFiled: March 2, 2005Date of Patent: December 19, 2006Assignee: Qualitau, Inc.Inventors: Tal Raichman, Peter P. Cuevas, James Borthwick, Michael A. Casolo
-
Patent number: 7098648Abstract: In an electrical circuit for testing electrical current using a plurality of precision resistors connected in parallel or in series, a range finder for receiving the current to be measured with the voltage drop across the range finder being indicative of a current sub-range for measurement. In a preferred embodiment, a range finder has a first bipolar transistor and a second bipolar transistor connected in parallel and in opposite polarity with the emitter and base of each transistor connected together whereby each transistor functions as an emitter-base diode.Type: GrantFiled: June 14, 2004Date of Patent: August 29, 2006Assignee: Qualitau, Inc.Inventors: Gedaliahoo Krieger, Peter P. Cuevas, James Borthwick
-
Publication number: 20050206367Abstract: In an electrical for testing electrical current using a plurality of precision resistors connected in parallel or in series, a range finder for receiving the current to be measured with the voltage drop across the range finder being indicative of a current sub-range for measurement. In a preferred embodiment, a range finder comprises a first bipolar transistor and a second bipolar transistor connected in parallel and in opposite polarity with the emitter and base of each transistor connected together whereby each transistor functions as an emitter-base diode.Type: ApplicationFiled: June 14, 2004Publication date: September 22, 2005Applicant: QualiTau, Inc.Inventors: Gedaliahoo Krieger, Peter Cuevas, James Borthwick
-
Publication number: 20050194963Abstract: A dual channel source measurement unit for reliability testing of electrical devices provides a voltage stress stimulus to a device under test and monitors degradation to the device under test caused by the stress simulator. The dual channel source measurement unit decouples the stress and monitor portions of the unit so that the requirements of each can be optimized. Deglitching and current clamp switches can be incorporated in the dual channel source measurement unit to prevent glitches in the switching circuitry and to limit or clamp current flow to or from the monitor and stress sources.Type: ApplicationFiled: March 2, 2005Publication date: September 8, 2005Applicant: QualiTau, Inc.Inventors: Tal Raichman, Peter Cuevas, James Borthwick, Michael Casolo
-
Patent number: 4033359Abstract: Tobacco based smoking mixture containing a minimum amount of tobacco and a maximum amount of harmless inorganic filler, the composition of the filler having been selected so as to impart a commercially acceptable burning rate to the mixture.Type: GrantFiled: March 5, 1974Date of Patent: July 5, 1977Assignee: Imperial Chemical Industries LimitedInventors: James Borthwick, James Forrester Morman
-
Patent number: 4008723Abstract: Tobacco substitute based smoking mixture containing a minimum amount of organic combustible material and a maximum amount of harmless inorganic filler, the composition of the filler having been selected so as to impart a commercially acceptable burning rate to the mixture.Type: GrantFiled: March 11, 1975Date of Patent: February 22, 1977Assignee: Imperial Chemical Industries LimitedInventors: James Borthwick, James Forrester Morman