Abstract: Methods, systems, and devices for thermal distribution in coupled semiconductor systems are described. A coupled semiconductor system may include a first semiconductor component, a second semiconductor component bonded with a first portion of a surface of the first semiconductor component, and a metallic material over a second portion of the surface of the first semiconductor component and adjacent to the second semiconductor component along one or more sides of the second semiconductor component. In some examples, the coupled semiconductor system may be formed by bonding multiple second semiconductor components to the first semiconductor component and forming the metallic material over one or more second portions of the surface of the first semiconductor component (e.g., between second semiconductor components). In some examples, the semiconductor system may be formed by forming trenches (e.g., through a second semiconductor component) and forming the metallic material in the trenches.

Abstract: Methods, systems, and devices for information broadcast techniques for stacked memory architectures are described. A semiconductor system may include multiple instances of interface circuitry of a semiconductor die that are each operable for accessing a respective set of one or more memory arrays of one or more other semiconductor dies, as well as read-only storage for storing information that is common to the multiple instances of the interface circuitry. In some implementations, such read-only storage may include one-time programmable memory elements (e.g., fuses, antifuses) that are located in at least one of the one or more other semiconductor dies, and are accessible by each of the multiple instances of interface circuitry.

Abstract: Methods, systems, and devices for segmented data lines in memory systems are described. A memory system may include multiple first banks and multiple second banks with logic circuitry coupled with the multiple first and second banks. In such examples, the logic circuitry may be configured to facilitate communication with the multiple first and second banks and be positioned between the multiple first and second banks. The memory system may further include a first segment of a data line coupled with a first set of the multiple first banks and coupled with the logic circuitry and include a second segment of the data line coupled with a second set of multiple first banks. Additionally, the memory system may include repeater circuitry coupled with the first segment and the second segment and positioned between the first set of the multiple first banks and the second set of the multiple first banks.

Abstract: Methods, systems, and devices for repair techniques for coupled host and memory dies are described. For example, to distribute memory access circuitry among multiple semiconductor dies of a stack, a first die may include a set of one or more memory arrays and a first portion of circuitry configured to access the set of memory arrays, and a second die may include a second portion of circuitry configured to access the set of memory arrays. The second portion of the circuitry (e.g., of the second die) may be configured to support various repair techniques for operations with the set of memory arrays, including techniques in response to column failures or serialization failures associated with the first die, or in response to contact or other interconnection failures with or between the first die and the second die, among other techniques that may be differentiated based on an attribution of error conditions.

Abstract: Methods, systems, and devices for bypass interconnections for stacked semiconductor systems are described. An interface between a logic component and a system substrate of a semiconductor system may extend beyond an active area of a memory stack and couple between the logic component and the system substrate via one or more bypass regions. In some examples, through-silicon vias may be formed through portions of a memory stack, such as a semiconductor extension at edges of each memory die, which may be used for transfer of high-speed or high-energy signals. Additionally, or alternatively, a logic component may be placed on top of a stack of memory dies with separate bypass components along one or more sides adjacent to a memory stack, through which bypass interconnects may be formed, allowing for different configurations and avoiding the use of memory component silicon being allocated for such interconnections.

Abstract: Methods, systems, and devices for pass-through power delivery for logic-on-top semiconductor systems are described. A semiconductor system may be configured with a two-dimensional pattern of power delivery conductors that pass through semiconductor components of a stack (e.g., through one or more memory stacks), providing a more-distributed delivery of power to a logic component bonded with the stack. The power delivery conductors may include through-substrate vias that bypass circuitry of the stack, and thus may be allocated for providing power to the logic component. Such techniques may be combined with a redistribution component, such as a package substrate or interposer (e.g., opposite the logic component in the heterogeneous stack), which may include redistribution conductors that convert from relatively fewer interconnections at a surface of the semiconductor system (e.g., for solder interconnection) to relatively more interconnections at a surface bonded with the stack (e.g.

Abstract: Methods, systems, and devices for information broadcast techniques for stacked memory architectures are described. A semiconductor system may include multiple instances of interface circuitry of a semiconductor die that are each operable for accessing a respective set of one or more memory arrays of one or more other semiconductor dies, as well as read-only storage for storing information that is common to the multiple instances of the interface circuitry. In some implementations, such read-only storage may include one-time programmable memory elements (e.g., fuses, antifuses) that are located in at least one of the one or more other semiconductor dies, and are accessible by each of the multiple instances of interface circuitry.

Abstract: Methods, systems, and devices for repair techniques for coupled host and memory dies are described. For example, to distribute memory access circuitry among multiple semiconductor dies of a stack, a first die may include a set of one or more memory arrays and a first portion of circuitry configured to access the set of memory arrays, and a second die may include a second portion of circuitry configured to access the set of memory arrays. The second portion of the circuitry (e.g., of the second die) may be configured to support various repair techniques for operations with the set of memory arrays, including techniques in response to column failures or serialization failures associated with the first die, or in response to contact or other interconnection failures with or between the first die and the second die, among other techniques that may be differentiated based on an attribution of error conditions.

Abstract: Methods, systems, and devices for row hammer mitigation for stacked memory architectures are described. A semiconductor system, such as a memory system, may distribute operations for row hammer mitigation across circuitry of the semiconductor system. A first interface block of a first die of the semiconductor system may exchange signaling with a second interface block of a second die of the semiconductor system to perform row hammer mitigation operations. The second die may implement counters to track quantities of access operations associated with respective rows of memory cells of the second die. The second interface block may transmit alert signaling to the first interface block based on a value of a counter, and the first interface block may evaluate the alert signaling and transmit refresh signaling to the second interface block to perform one or more refresh operations.

Abstract: Methods, systems, and devices for row hammer mitigation reliability in stacked memory architectures are described. A spare counter may be implemented at a first interface block of a logic die to enable increased reliability and efficiency in row hammer mitigation. The first interface block may use a spare counter in case of an error associated with a counter at a memory array die. A second interface block of an array die may identify an error associated with a counter of a memory array and may transmit an indication of the error to the first interface block. The first interface block may receive the indication and may activate a spare counter to track access operations on (e.g., activations of) the row based on the indication. The first interface block may use the spare counter to evaluate whether to transmit refresh signaling to the second interface block for row hammer mitigation.

Abstract: Methods, systems, and devices for interface techniques for stacked memory architectures are described. A semiconductor system, such as a memory system, may distribute memory access circuitry among multiple semiconductor dies of a stack. A first die of the system may include logic circuitry operable to configure a set of multiple first interface blocks of the first die. Each first interface block may include circuitry operable to communicate with one or more second interface blocks of one or more second dies of the system to access a respective set of one or more memory arrays of the one or more second dies. In some examples, the system may include a respective controller for each first interface block to support access operations via the first interface block. The system may also include non-volatile storage, one or more sensors, or a combination thereof to support various operations of the system.

Abstract: Methods, systems, and devices for information broadcast techniques for stacked memory architectures are described. A semiconductor system may include multiple instances of interface circuitry of a semiconductor die that are each operable for accessing a respective set of one or more memory arrays of one or more other semiconductor dies, as well as read-only storage for storing information that is common to the multiple instances of the interface circuitry. In some implementations, such read-only storage may include one-time programmable memory elements (e.g., fuses, antifuses) that are located in at least one of the one or more other semiconductor dies, and are accessible by each of the multiple instances of interface circuitry.

Abstract: Methods, systems, and devices for memory with parallel main and test interfaces are described. A memory die may be configured with parallel interfaces that may individually (e.g., separately) support evaluation operations (e.g., before or as part of assembly in a multiple-die stack) or access operations (e.g., after assembly in a multiple die stack). For example, a memory die may include a first set of one or more contacts that support communicating signaling with or via another memory die in a multiple-die stack. The memory die may also include a second set of one or more contacts that support probing for pre-assembly evaluations, which may be electrically isolated from the first set of contacts. By implementing such parallel interfaces, evaluation operations may be performed using the second set of contacts without damaging the first set of contacts, which may improve capabilities for supporting a multiple-die stack in a memory device.

Abstract: Methods, systems, and devices for memory with parallel main and test interfaces are described. A memory die may be configured with parallel interfaces that may individually (e.g., separately) support evaluation operations (e.g., before or as part of assembly in a multiple-die stack) or access operations (e.g., after assembly in a multiple die stack). For example, a memory die may include a first set of one or more contacts that support communicating signaling with or via another memory die in a multiple-die stack. The memory die may also include a second set of one or more contacts that support probing for pre-assembly evaluations, which may be electrically isolated from the first set of contacts. By implementing such parallel interfaces, evaluation operations may be performed using the second set of contacts without damaging the first set of contacts, which may improve capabilities for supporting a multiple-die stack in a memory device.

Abstract: Methods, systems, and devices for row hammer mitigation for stacked memory architectures are described. A semiconductor system, such as a memory system, may distribute operations for row hammer mitigation across circuitry of the semiconductor system. A first interface block of a first die of the semiconductor system may exchange signaling with a second interface block of a second die of the semiconductor system to perform row hammer mitigation operations. The second die may implement counters to track quantities of access operations associated with respective rows of memory cells of the second die. The second interface block may transmit alert signaling to the first interface block based on a value of a counter, and the first interface block may evaluate the alert signaling and transmit refresh signaling to the second interface block to perform one or more refresh operations.

Abstract: Methods, systems, and devices for row hammer mitigation reliability in stacked memory architectures are described. A spare counter may be implemented at a first interface block of a logic die to enable increased reliability and efficiency in row hammer mitigation. The first interface block may use a spare counter in case of an error associated with a counter at a memory array die. A second interface block of an array die may identify an error associated with a counter of a memory array and may transmit an indication of the error to the first interface block. The first interface block may receive the indication and may activate a spare counter to track access operations on (e.g., activations of) the row based on the indication. The first interface block may use the spare counter to evaluate whether to transmit refresh signaling to the second interface block for row hammer mitigation.

Abstract: Methods, systems, and devices for information broadcast techniques for stacked memory architectures are described. A semiconductor system may include multiple instances of interface circuitry of a semiconductor die that are each operable for accessing a respective set of one or more memory arrays of one or more other semiconductor dies, as well as read-only storage for storing information that is common to the multiple instances of the interface circuitry. In some implementations, such read-only storage may include one-time programmable memory elements (e.g., fuses, antifuses) that are located in at least one of the one or more other semiconductor dies, and are accessible by each of the multiple instances of interface circuitry.

Abstract: Methods, systems, and devices for interface techniques for stacked memory architectures are described. A semiconductor system, such as a memory system, may distribute memory access circuitry among multiple semiconductor dies of a stack. A first die of the system may include logic circuitry operable to configure a set of multiple first interface blocks of the first die. Each first interface block may include circuitry operable to communicate with one or more second interface blocks of one or more second dies of the system to access a respective set of one or more memory arrays of the one or more second dies. In some examples, the system may include a respective controller for each first interface block to support access operations via the first interface block. The system may also include non-volatile storage, one or more sensors, or a combination thereof to support various operations of the system.

Abstract: Methods, systems, and devices for data path signal amplification in coupled semiconductor systems are described. A semiconductor system may implement a first die including memory arrays and a second die including a host interface. The first die may include a first portion of a data path between the memory arrays and the host interface, including a first portion of data path signal amplification circuitry. The second die may include a second portion of the data path, including a second portion of data path signal amplification circuitry. The semiconductor system may implement fine-pitch interconnection between dies to support a relatively greater quantity of signal paths of the data path which, in some examples, may support reducing or eliminating serialization/deserialization circuitry associated with coarser interconnection. In some implementations, a semiconductor system may implement a switching component operable to switch between data paths having different amplification configurations of the dies.

Abstract: Methods, systems, and devices for transistor architectures in coupled semiconductor systems are described. A memory system may be formed from multiple semiconductor components (e.g., multiple dies, multiple wafers) that are coupled together, with different semiconductor components implementing different techniques for transistor formation. For example, a first die may include a memory array and first circuitry configured to access the memory array, and a second die coupled with the first die may include second circuitry configured to access the memory array. The first circuitry may include transistors formed in accordance with a first fabrication technique (e.g., to form a first type of transistors) and the second circuitry may include transistors formed in accordance with a second fabrication technique (e.g., to form a second type of transistors). The dies may be coupled in a manner that provides an electrical coupling between the first circuitry and the second circuitry.