Abstract: A method for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the method includes transferring a substrate on an end effector relative to a testing platform having a plurality of testing columns coupled thereto, the substrate having a plurality of electronic devices located thereon, and moving the substrate in a single directional axis relative to an optical axis of each of the plurality of testing columns, the single directional axis being substantially orthogonal to the optical axis to define a test area on the substrate, wherein the test area is configured to cover an entire length or an entire width of the substrate such that the testing columns are capable of testing the entire substrate as the substrate is moved through the test area.

Abstract: A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system.

Abstract: A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system.

Abstract: A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system.

Abstract: A method and apparatus for testing a plurality of electronic devices formed on a large area substrate is described. In one embodiment, the apparatus performs a test on the substrate in one linear axis in at least one chamber that is slightly wider than a dimension of the substrate to be tested. Clean room space and process time is minimized due to the smaller dimensions and volume of the system.

Abstract: This invention is an abdominal, and low back exercise machine used to tone and strengthen the muscles of the user. The machine includes a frame upon which a slidable foot rest or carriage and a seat are attached. The machine additionally includes a harness coupled to the carriage through a strap such that as the harness moves in a first direction, the carriage moves in the opposite second direction along the frame. The harness is placed around the shoulders and neck of the user such that when the user sits on the seat and brings the shoulders towards the knees, the legs will be drawn up to the shoulders by the movement of the carriage. This exercise device strengthens the user's upper and lower abdominal muscles. The machine further includes an exercise ball which supports the back or stomach while performing hyper-extension type exercises.

Abstract: The invention relates to an alkaline zinc cell that uses a conductive anode current collector comprising a conductive substrate, such as a copper-zinc alloy substrate, and wherein the surface of the substrate is coated with a lead-containing layer containing a discontinuous dispersion of lead to effectively reduce gassing at the surface of the anode current collector during storage of the cell.

Abstract: A new form of manganese dioxide having an x-ray diffraction pattern resembling none of the x-ray patterns of the known forms of manganese dioxide is manufactured by acid treatment of LiMn.sub.2 O.sub.4.

Abstract: A new form of manganese dioxide having an x-ray diffraction pattern resembling none of the x-ray patterns of the known forms of manganese dioxide is manufactured by acid treatment of LiMn.sub.2 O.sub.4.