Abstract: Provided are aminopyridine compounds and pharmaceutically acceptable compositions thereof which exhibit inhibition activity against certain mutated forms of EGFR.

Abstract: Entity resolution techniques and systems are described. An entity resolution method may include estimating a joint probability of occurrence of a plurality of values of a respective plurality of descriptors of an entity. The plurality of descriptor values may be included in a first data set. The method may further include determining that the joint probability of occurrence of the plurality of descriptor values is less than a threshold probability, identifying a second data set including the same plurality of values of the same respective plurality of descriptors, and determining, based at least in part on the joint probability of occurrence of the plurality of descriptor values being less than the threshold probability and on the first and second data sets including the same plurality of descriptor values, that the first and second data sets describe the same entity.

Abstract: Entity resolution techniques and systems are described. An entity resolution method may include estimating a joint probability of occurrence of a plurality of values of a respective plurality of descriptors of an entity. The plurality of descriptor values may be included in a first data set. The method may further include determining that the joint probability of occurrence of the plurality of descriptor values is less than a threshold probability, identifying a second data set including the same plurality of values of the same respective plurality of descriptors, and determining, based at least in part on the joint probability of occurrence of the plurality of descriptor values being less than the threshold probability and on the first and second data sets including the same plurality of descriptor values, that the first and second data sets describe the same entity.

Abstract: A microwave integrated circuit internal-node waveform probing arrangement using a portable ungrounded voltage sensing probe and a commercially available transition analyzer instrument are disclosed. Harmonic frequency and phase processing are accomplished on the probe sensed voltage waveforms from internal nodes of for example a C-band monolithic microwave integrated circuit (MMIC) power amplifier circuit device. The disclosed probing is applied to determining signal voltage and signal current flow waveforms for the MMIC device. Examples relating to use of the invention to analyze operation of microwave circuits and prevent premature device failures are included; these include variation of waveforms as a function of frequency, drive and measurement location in a device. The potential impact of the disclosed technique includes MMIC design verification, in-situ device model extraction, process diagnosis, and reliability assessment.

Abstract: Strain-free mounting and uniform heating of deposition substrates are achieved by coating the backside of the substrate such as a GaAs substrate with a reflective layer. A reflective environment formed, for example, by tantalum foils allows reflections between the reflective surface of the substrate and the reflective surface of the environment. These multiple reflections, in turn, produce uniform heating of the substrate.

Abstract: Extremely high-purity and defect-free layers of III-V semiconductor materials are produced by a specific MBE process. This process as applied to GaAs includes protecting the deposition substrate with a passivating surface, removing this surface in situ, treating the bared substrate heated to a temperature below its incongruent melting point with an arsenic-containing gas, and initiating the MBE growth in an environment containing an excess of arsenic over gallium.

Abstract: GaAs FETs exhibit excellent long-term stability if they have a drain ledge, a drain contact with reduced dendrite size, and a silicon nitride passivation layer. Accelerated aging tests at device case temperatures of 250 degrees C. indicate essentially no device failures after 200 hours of observation and a median failure time of approximately 500 hours.