Abstract: Methods for establishing benchmarks and for analyzing benefits associated with voltage scaling are provided. In one embodiment, the method for establishing benchmarks includes: (1) synthesizing a netlist from a RTL of a functional IC design; (2) implementing a layout of an IC from the netlist, wherein the synthesizing and the implementing are performed at designated voltages and frequencies over a voltage and a frequency range, the voltage range including a voltage scaling range and a voltage associated with a designated implementation of the IC; (3) obtaining measurements of at least one voltage scaling metric associated with the IC at each of the designated voltages and frequencies; and (4) normalizing measurements associated with the voltage scaling range to measurements associated with the designated implementation employing a processor to obtain normalized benchmarks for analyzing optimization of the IC associated with voltage scaling. EDA tools may be used for synthesizing, implementing and obtaining.

Abstract: A method of designing an integrated circuit, an EDA tool, an apparatus and a computer-readable medium are disclosed herein. In one embodiment, the method includes: (1) generating a set of constraint equations representing clock-insertion delay values for the integrated circuit as variables, (2) determining bounds on each of the clock-insertion delay values based on the constraint equations and (3) generating a set of closing commands based on the bounds for driving a design of the integrated circuit to closure, wherein each step of the method is carried out by at least one EDA tool.

Abstract: One aspect provides a method of standardized data creation and analysis of semiconductor technology node characteristics. In one embodiment, the method includes: (1) designing representative benchmark circuits for a clock path, a data path and a flip-flop path, (2) establishing at least one standard sensitization and measurement rule for delay and power for the representative benchmark circuits and across corners in the technology nodes, (3) performing a simulation by sweeping through a range of values and at predetermined intervals across the corners, (4) extracting data from the simulation, (5) writing the data to a databank and (6) parsing and interpreting the data to produce at least one report.

Abstract: One aspect provides a method of standardized data creation and analysis of semiconductor technology node characteristics. In one embodiment, the method includes: (1) designing at least one representative benchmark circuit, (2) establishing standard sensitization and measurement rules for delay and power for the at least one representative benchmark circuit and across corners in the technology nodes, (3) performing a simulation by sweeping through a range of values and at predetermined intervals across the corners, (4) extracting data from the simulation and (5) parsing and interpreting the data to produce at least one report.

Abstract: A first integrated circuit design with a first maximum operating frequency is modified to achieve a second integrated circuit design with a second maximum operating frequency. The integrated circuit design comprises an arrangement of cells. Each of these cells drives a signal that propagates through a net of other circuit elements to one or more nodes that are limited by respective signal timing constraints. An analytical cost function is assigned to each of the cells. Each analytical cost function comprises a value for its respective cell that is based on one or more speed-related factors indicative of the impact of the respective cell on the first maximum operating frequency of the first integrated circuit design. One or more of the cells are replaced with different cells based on the determined analytical cost functions.

Abstract: Methods of designing an IC and an apparatus are disclosed. In one embodiment, a method includes: (1) creating a functional circuit for a functional block of an IC design, (2) verifying said functional circuit satisfies a rule-set for said IC design, wherein said rule-set is context-based with respect to said design flow, (3) synthesizing a logical circuit based on the functional circuit; (4) verifying the logical circuit satisfies the rule set; (5) implementing a physical layout of the logical circuit; and (6) verifying the physical layout satisfies the rule set, wherein each step of the method is carried out by at least one EDA tool.

Abstract: Methods of designing an IC and a hierarchical design flow generator are disclosed. In one embodiment, a method includes: (1) partitioning a design implementation flow for an IC into a late design flow portion and an early design flow portion employing a processor, (2) dividing components of the late design flow portion and the early design flow portion into a functional block implementation section and a top level implementation section employing the processor, (3) aligning dependencies between the functional block implementation sections and the top level implementation sections in both of the early design flow portion and the late design flow portion employing the processor and (4) implementing a layout for the IC based on the early and the late design flow portions employing the processor.

Abstract: Methods for establishing benchmarks and for analyzing benefits associated with voltage scaling are provided. In one embodiment, the method for establishing benchmarks includes: (1) synthesizing a netlist from a RTL of a functional IC design; (2) implementing a layout of an IC from the netlist, wherein the synthesizing and the implementing are performed at designated voltages and frequencies over a voltage and a frequency range, the voltage range including a voltage scaling range and a voltage associated with a designated implementation of the IC; (3) obtaining measurements of at least one voltage scaling metric associated with the IC at each of the designated voltages and frequencies; and (4) normalizing measurements associated with the voltage scaling range to measurements associated with the designated implementation employing a processor to obtain normalized benchmarks for analyzing optimization of the IC associated with voltage scaling. EDA tools may be used for synthesizing, implementing and obtaining.

Abstract: A power switching circuit is provided for use in an integrated circuit including at least a first voltage rail and a second voltage rail. The power switching circuit includes at least one MOS device having a first source/drain adapted for connection to the first voltage rail, a second source/drain adapted for connection to the second voltage rail, and a gate adapted for receiving a control signal. The MOS device selectively connects the first voltage rail to the second voltage rail in response to the control signal. The first and second voltage rails form a grid overlying the power switching circuit, the first and second voltage rails being formed in different planes relative to one another. The connection between the power switching circuit and the first voltage rail is made at an interface between the first and voltage rails.

Abstract: Various embodiments of methods of designing an integrated circuit (IC). One embodiment of one such method includes: (1) generating a functional design for the IC, (2) determining performance objectives for the IC, (3) determining an optimization target voltage for the IC, (4) determining whether the IC needs voltage scaling to achieve the performance objectives at the optimization target voltage and, if so, whether the IC is to employ static voltage scaling or adaptive voltage scaling, (5) using the optimization target voltage to synthesize a layout from the functional IC design that meets the performance objectives by employing a unitless performance/power quantifier as a metric to gauge a degree of optimization thereof and (6) performing a timing signoff of the layout at the optimization target voltage.

Abstract: Various embodiments of methods of designing an integrated circuit (IC). One embodiment of one such method includes: (1) generating a functional design for the IC, (2) determining performance objectives for the IC, (3) determining an optimization target voltage for the IC, (4) determining whether the IC needs voltage scaling to achieve the performance objectives at the optimization target voltage and, if so, whether the IC is to employ static voltage scaling or adaptive voltage scaling, (5) using the optimization target voltage to implement a layout from the functional IC design that meets the performance objectives and (6) performing a timing signoff of the layout at the optimization target voltage.

Abstract: One aspect provides a method of standardized data creation and analysis of semiconductor technology node characteristics. In one embodiment, the method includes: (1) designing at least one representative benchmark circuit, (2) establishing standard sensitization and measurement rules for delay and power for the at least one representative benchmark circuit and across corners in the technology nodes, (3) performing a simulation by sweeping through a range of values and at predetermined intervals across the corners, (4) extracting data from the simulation and (5) parsing and interpreting the data to produce at least one report.

Abstract: A first integrated circuit design with a first maximum operating frequency is modified to achieve a second integrated circuit design with a second maximum operating frequency. The integrated circuit design comprises an arrangement of cells. Each of these cells drives a signal that propagates through a net of other circuit elements to one or more nodes that are limited by respective signal timing constraints. An analytical cost function is assigned to each of the cells. Each analytical cost function comprises a value for its respective cell that is based on one or more speed-related factors indicative of the impact of the respective cell on the first maximum operating frequency of the first integrated circuit design. One or more of the cells are replaced with different cells based on the determined analytical cost functions.

Abstract: A method of simulating the electrical behavior of an ideal transformer. The representation of the ideal transformer is frequency independent and can be used to simulate the behavior of an ideal transformer over the frequency range from DC to infinity. In one embodiment, the ideal transformer is represented as having an input sub-circuit and an output sub-circuit. Each sub-circuit includes a resistor connected in parallel across a current controlled current source. The input current, output current, current sources, and resistances are scaled by a scaling factor representing the turns ratio between the primary and secondary windings of a physical transformer. In the present invention, the current sources are responsible for the current scaling and the resistors are responsible for the impedance scaling. The circuit elements of the representation may be used as the basis for generating a set of input parameters for a circuit emulation program.

Abstract: The subject invention provides a liquid ventilator system which comprises a source of oxygenated liquid, an inspiratory conduit, a bifurcated bronchial tube, and a pump. The bifurcated bronchial tube has a left lumen for directing the flow of oxygenated liquid into the left primary bronchus of a subject, and a right lumen for directing the flow of oxygenated liquid into the right primary bronchus of a subject. The invention further provides a method for liquid ventilation of a subject using the system, as well as a method of increasing ventilation efficiency by continuous isovolumetric flow of oxygenated liquid into the bronchi of the subject.

Abstract: Systems for controlling the current consumption of an integrated circuit chip and the like so as to reduce the inductive voltage drops occurring over the power supply lines within the chip and power supply lines to the chip are disclosed. The systems according to the present invention are applicable to circuits having two or more sub-circuits formed on a semiconductor substrate, each sub-circuit having two or more power supply inputs. An exemplary system comprises two or more current shunting elements formed on the substrate, with each current shunting element coupled in parallel with the power supply inputs of a selected sub-circuit. The system has at least two main power supply lines formed on the semiconductor substrate, with each selected sub-circuit having each of its power supply inputs coupled to a main power supply line. A current shunting element may comprise a Zener diode, an active shunt circuit, or equivalents thereof.