Patents by Inventor James C. Tsang

James C. Tsang has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 8927057
    Abstract: A method for forming a single, few-layer, or multi-layer graphene and structure is described incorporating selecting a substrate having a buried layer of carbon underneath a metal layer, providing an ambient and providing a heat treatment to pass carbon through the metal layer to form a graphene layer on the metal layer surface or incorporating a metal-carbon layer which is heated to segregate carbon in the form of graphene to the surface or chemically reacting the metal in the metal-carbon layer with a substrate containing Si driving the carbon to the surface whereby graphene is formed.
    Type: Grant
    Filed: February 22, 2010
    Date of Patent: January 6, 2015
    Assignee: International Business Machines Corporation
    Inventors: Ageeth A. Bol, Roy A. Carruthers, Jack O. Chu, Alfred Grill, Christian Lavoie, Katherine L. Saenger, James C. Tsang
  • Publication number: 20110206934
    Abstract: A method for forming a single, few-layer, or multi-layer graphene and structure is described incorporating selecting a substrate having a buried layer of carbon underneath a metal layer, providing an ambient and providing a heat treatment to pass carbon through the metal layer to form a graphene layer on the metal layer surface or incorporating a metal-carbon layer which is heated to segregate carbon in the form of graphene to the surface or chemically reacting the metal in the metal-carbon layer with a substrate containing Si driving the carbon to the surface whereby graphene is formed.
    Type: Application
    Filed: February 22, 2010
    Publication date: August 25, 2011
    Applicant: International Business Machines Corporation
    Inventors: Ageeth A. Bol, Roy A. Carruthers, Jack O. Chu, Alfred Grill, Christian Lavoie, Katherine L. Saenger, James C. Tsang
  • Patent number: 7791087
    Abstract: An integrated circuit and method are provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the integrated circuit. The method prevents, in an integrated circuit, a pattern of light emitted from at least one active device in the integrated circuit from being detected external to the integrated circuit by fading the light emitted from the at least one active device in the integrated circuit and that is emitted external to the integrated circuit. Bright light emission emitted in substantial close proximity to the at least one active device in the integrated circuit, and emitted external to the integrated circuit, fades a pattern of light emission emitted from the at least one active device.
    Type: Grant
    Filed: November 2, 2009
    Date of Patent: September 7, 2010
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Patent number: 7791086
    Abstract: An integrated circuit and method are provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the integrated circuit. The method prevents, in an integrated circuit, a pattern of light emitted from at least one active device in the integrated circuit from being detected external to the integrated circuit by reduction of the intensity of light emitted from the at least one active device in the integrated circuit thereby preventing the reduced intensity light emitted from the at least one active device in the integrated circuit from being detected external to the integrated circuit. The intensity of light emitted from the at least one active device in the integrated circuit can be reduced by modification of operational characteristics of the at least one active device during switching transitions.
    Type: Grant
    Filed: November 2, 2009
    Date of Patent: September 7, 2010
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Patent number: 7781782
    Abstract: An integrated circuit and method are provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the integrated circuit. The method prevents, in an integrated circuit, a pattern of light emitted from at least one active device in the integrated circuit from being detected external to the integrated circuit by randomizing a pattern of light emitted from the at least one active device in an integrated circuit and that is emitted external to the integrated circuit. The pattern of light emitted from the at least one active device in the integrated circuit and that is emitted external to the integrated circuit can be randomized by randomizing a clock signal applied to a clocked circuit comprising the at least one active device in the integrated circuit.
    Type: Grant
    Filed: November 2, 2009
    Date of Patent: August 24, 2010
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Publication number: 20100044725
    Abstract: An integrated circuit and method are provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the integrated circuit. The method prevents, in an integrated circuit, a pattern of light emitted from at least one active device in the integrated circuit from being detected external to the integrated circuit by fading the light emitted from the at least one active device in the integrated circuit and that is emitted external to the integrated circuit. Bright light emission emitted in substantial close proximity to the at least one active device in the integrated circuit, and emitted external to the integrated circuit, fades a pattern of light emission emitted from the at least one active device.
    Type: Application
    Filed: November 2, 2009
    Publication date: February 25, 2010
    Applicant: International Business Machines Corp.
    Inventors: JEFFREY A. KASH, James C. Tsang, Daniel R. Knebel
  • Publication number: 20100044724
    Abstract: An integrated circuit and method are provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the integrated circuit. The method prevents, in an integrated circuit, a pattern of light emitted from at least one active device in the integrated circuit from being detected external to the integrated circuit by reduction of the intensity of light emitted from the at least one active device in the integrated circuit thereby preventing the reduced intensity light emitted from the at least one active device in the integrated circuit from being detected external to the integrated circuit. The intensity of light emitted from the at least one active device in the integrated circuit can be reduced by modification of operational characteristics of the at least one active device during switching transitions.
    Type: Application
    Filed: November 2, 2009
    Publication date: February 25, 2010
    Applicant: International Business Machines Corp.
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Publication number: 20100046756
    Abstract: An integrated circuit and method are provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the integrated circuit. The method prevents, in an integrated circuit, a pattern of light emitted from at least one active device in the integrated circuit from being detected external to the integrated circuit by randomizing a pattern of light emitted from the at least one active device in an integrated circuit and that is emitted external to the integrated circuit. The pattern of light emitted from the at least one active device in the integrated circuit and that is emitted external to the integrated circuit can be randomized by randomizing a clock signal applied to a clocked circuit comprising the at least one active device in the integrated circuit.
    Type: Application
    Filed: November 2, 2009
    Publication date: February 25, 2010
    Inventors: JEFFREY A. KASH, James C. Tsang, Daniel R. Knebel
  • Patent number: 7612382
    Abstract: A method for an electronic device is provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the electronic device. The method emits extraneous randomized light emissions in substantial close proximity to the transistors to hide a pattern of light emissions emitted from the transistors. As one feature, the device can include a source of randomized light emissions in substantial close proximity to the transistors to hide a pattern of the emitted light from the transistors in randomized light emissions emitted by the source. As a second feature, the device can emit the randomized light emissions by randomly delaying an electrical signal that is electrically coupled to the transistors and, in response to the randomly delayed electrical signal, the transistors randomly emitting light emissions thereby hiding a separate pattern of light emission emitted from the transistors.
    Type: Grant
    Filed: June 17, 2008
    Date of Patent: November 3, 2009
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Patent number: 7577233
    Abstract: The rotating X-ray apparatus disclosed has a pair of driven rotatable rings with an X-ray source mounted for impinging a beam that passes through a specimen to an X-ray receptor. A reversible motor, controlled by a reversing switch, drives the rotatable rings around the specimen. The rotatable rings are mounted between a pair of frame plates that are supported on transverse rails for lateral movement.
    Type: Grant
    Filed: August 3, 2007
    Date of Patent: August 18, 2009
    Assignee: Glenbrook Technologies, Inc.
    Inventors: James C. Tsang, Gilbert Zweig, Paul D. Gonzalez
  • Publication number: 20080252331
    Abstract: A method for an electronic device is provided for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in the electronic device. The method emits extraneous randomized light emissions in substantial close proximity to the transistors to hide a pattern of light emissions emitted from the transistors. As one feature, the device can include a source of randomized light emissions in substantial close proximity to the transistors to hide a pattern of the emitted light from the transistors in randomized light emissions emitted by the source. As a second feature, the device can emit the randomized light emissions by randomly delaying an electrical signal that is electrically coupled to the transistors and, in response to the randomly delayed electrical signal, the transistors randomly emitting light emissions thereby hiding a separate pattern of light emission emitted from the transistors.
    Type: Application
    Filed: June 17, 2008
    Publication date: October 16, 2008
    Applicant: International Business Machines Corp.
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Patent number: 7399992
    Abstract: An integrated circuit chip (IC) is equipped with a device for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in a circuit located in the IC. The device emits extraneous randomized light emissions in substantial close proximity to the transistors to hide a pattern of light emissions emitted from the transistors. As one feature, the device can include a source of randomized light emissions in substantial close proximity to the transistors to hide a pattern of the emitted light from the transistors in randomized light emissions emitted by the source. As a second feature, the device can emit the randomized light emissions by randomly delaying an electrical signal that is electrically coupled to the transistors and, in response to the randomly delayed electrical signal, the transistors randomly emitting light emissions thereby hiding a separate pattern of light emission emitted from the transistors.
    Type: Grant
    Filed: October 2, 2006
    Date of Patent: July 15, 2008
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Patent number: 7115912
    Abstract: An integrated circuit chip (IC) is equipped with a device for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in a circuit located in the IC. The device can be an opaque structure that blocks emissions from being detected external to the IC. Alternatively, the device can reduce light emissions from the transistors to prevent detection of the light emissions external to the IC. The device, in another alternative, can emit extraneous light emissions to hide a pattern of light emissions emitted from the transistors. As a further alternative, the device can add random delay to a signal driving the transistors to randomize the pattern of light emissions emitted from the transistors to prevent detection of a predetermined pattern of light emissions external to the IC.
    Type: Grant
    Filed: December 20, 2002
    Date of Patent: October 3, 2006
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Publication number: 20030122138
    Abstract: An integrated circuit chip (IC) is equipped with a device for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in a circuit located in the IC. The device can be an opaque structure that blocks emissions from being detected external to the IC. Alternatively, the device can reduce light emissions from the transistors to prevent detection of the light emissions external to the IC. The device, in another alternative, can emit extraneous light emissions to hide a pattern of light emissions emitted from the transistors. As a further alternative, the device can add random delay to a signal driving the transistors to randomize the pattern of light emissions emitted from the transistors to prevent detection of a predetermined pattern of light emissions external to the IC.
    Type: Application
    Filed: December 20, 2002
    Publication date: July 3, 2003
    Applicant: International Business Machines Corporation
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Patent number: 6515304
    Abstract: An integrated circuit chip (IC) is equipped with a device for preventing reverse engineering by monitoring light emissions emitted from transistors and such electrically active devices in a circuit located in the IC. The device can be an opaque structure that blocks emissions from being detected external to the IC. Alternatively, the device can reduce light emissions from the transistors to prevent detection of the light emissions external to the IC. The device, in another alternative, can emit extraneous light emissions to hide a pattern of light emissions emitted from the transistors. As a further alternative, the device can add random delay to a signal driving the transistors to randomize the pattern of light emissions emitted from the transistors to prevent detection of a predetermined pattern of light emissions external to the IC.
    Type: Grant
    Filed: June 23, 2000
    Date of Patent: February 4, 2003
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel
  • Patent number: 6496022
    Abstract: A method and apparatus for reverse engineering an integrated circuit chip (IC chip) (120) utilizes an electrical circuit tester (114) for injecting a triggering signal into the IC chip (120) to exercise a circuit under test. In synchronization thereto, a PICA detector (116) monitors optical emissions from the circuit under test. A spatial data extractor, electrically coupled to the PICA detector, collects space information (124) from patterns of light emissions emitted by the circuit under test, and a timing data extractor, electrically coupled to the electrical circuit tester and to the PICA detector (116), collects time information (126) from the patterns of light emissions emitted by the circuit under test. A database memory (105) includes known data about the circuit under test and also includes at least one reference pattern for comparing a captured light emission pattern thereto to identify at least one circuit element in the circuit under test.
    Type: Grant
    Filed: December 21, 1999
    Date of Patent: December 17, 2002
    Assignee: International Business Machines Corporation
    Inventors: Jeffrey A. Kash, James C. Tsang, Daniel R. Knebel