Abstract: Methods and systems for remotely controlling a device through a wireless headset of a cellular phone are provided. In one implementation, the method includes storing a lookup table in a memory, in which the lookup table includes a digitized voice input and a corresponding control signal for the device. The method further includes receiving a voice input through a microphone, converting the voice input into a corresponding digital signal using an analog-to-digital converter, a voice recognition circuit recognizing the digital signal including matching the digital signal to the digitized voice input stored in the memory, and responsive to the digital signal matching the digitized voice input stored in the memory, a processor transmitting the corresponding control signal through the transceiver to the device.

Abstract: Methods and systems for remotely controlling a device through a wireless headset of a cellular phone are provided. In one implementation, the method includes storing a lookup table in a memory, in which the lookup table includes a digitized voice input and a corresponding control signal for the device. The method further includes receiving a voice input through a microphone, converting the voice input into a corresponding digital signal using an analog-to-digital converter, a voice recognition circuit recognizing the digital signal including matching the digital signal to the digitized voice input stored in the memory, and responsive to the digital signal matching the digitized voice input stored in the memory, a processor transmitting the corresponding control signal through the transceiver to the device.

Abstract: A method for determining whether short circuits exist among networks within a circuit under test includes bringing test probes into contact with each such network and switching groups of the test probes among two sides of a test circuit so that current flows through the testing circuit only when one of the test probes connected to one side of the testing circuit is connected by means of a short circuit to one of the test probes connected to the other side of the test circuit. This first test process establishes the fact that a short circuit exists without determining which networks are connected by the short circuit. A version of this method subsequently applies tests to individual networks to make this determination, in the event that a short circuit is found to exist by the first test process. Other versions of this method additionally determine which networks are connected to which other networks by short circuits.

Abstract: A dual contact probe tip is provided within a flying probe circuit tester to make separate electrical contacts with a circuit under test at two closely-spaced test points. The tip includes a mounting block having an attachment section attached to a carriage of the tester and a pair of flexible cantilever sections, with a probe pin extending from a distal end of each of these cantilever sections to make contact with the circuit. One electrical path is established through the conductive mounting block and one of the probe pins. The other probe pin is coated with an insulating material except for its point and for a surface to which a wire is soldered, so that the other electrical path is established through this other probe pin and the attached wire. Each probe pin is tapered toward its point, and the probe pins extend from the mounting block at an oblique angle toward one another.

Abstract: Accuracy of capacitance measurements taken with flying probes--probes that are movable relative to each other and surfaces of an object containing circuits being tested (e.g. a printed circuit board)--is improved by dynamically applying corrections for stray capacitance as individual probes are selected for measurements. Measuring circuitry to which the probes are linked includes multiplexor circuitry. The latter stray capacitance encompassing the stray capacitance between the one movable probe and the other movable probes as well as the cabling between the latter probes and the multiplexor circuitry. For these measurements, the reference point is contacted either by a fixed conductor or another one of the movable probes (other than the probe aligned with the test point) that is currently usable for that purpose.