Abstract: This invention comprises a combined optical wavefront aberrometer and topographer system that is used in conjunction with a contact lens that has a plurality of fiducial marks disposed on the lens. The fiducial marks are located radially inside of the undilated pupil's diameter. The optical imaging capacity of the aberrometer is used to measure and monitor any misalignments of the contact lens's position (XY decentration) and/or rotation. Image analysis algorithms are used to track the positions of the fiducial marks, and, hence, the amount of geometric misalignment of the contact lens can be calculated. The fiducial marks can comprise micro ink spots, or depressions in the surface of the contact lens (e.g., divots, dimples, pits), or other small surface features, including raised bumps, which can help to stabilize motions of the contact lens on the eye.

Abstract: Method steps for correcting vision in an eye that uses a customized phakic IOL composing: (1) measuring one or more wavefront aberrations of the eye: (2) designing a wavefront-customized correction profile for an Intraocular Lens (IOL); (3) creating a customized IOL with the customized correction profile; and (4) implanting the customized IOL in the eye. Alternatively, an uncorrected IOL is first implanted and aligned in the eye, followed by in-situ scanning a femtosecond laser spot across the implanted IOL to locally change the Index of Refraction of the IOL material and create an in-situ customized IOL.

Abstract: A system for correcting vision in an eye that uses a premium, customized IOL, the system comprising: (1) optical aberrometer means for measuring wavefront aberrations of the eye; (2) computer means for designing a wavefront-customized correction profile for the IOL; (3) manufacturing means for creating a customized IOL with the wavefront-corrected profile; and (4) surgical means for implanting the customized IOL in the eye. Alternatively an uncorrected IOL is first implanted and aligned in the eye, followed by in-situ scanning a femtosecond laser spot across the implanted IOL to locally change an index of Refraction of the IOL material in-situ.

Abstract: A method and system for correcting vision in an eye that uses a wavefront-customized phakic or pseudophakic Intraocular Lens (IOL), the method comprising: (1) measuring wavefront aberrations of the eye; (2) designing a wavefront-customized correction profile for an IOL; (3) creating a customized IOL with the customized correction profile; and (4) implanting the customized IOL in the eye, without having to remove the natural lens. Alternatively, an uncorrected IOL is implanted first, followed by scanning a femtosecond laser spot across the implanted IOL to locally change the Index of Refraction of the IOL material and create an in-situ customized IOL.

Abstract: This invention relates to methods and devices for designing customized contact lenses, by initially making dynamic wavefront sensor measurements through a trial contact lens that is fitted on an eye, and then calculating a WaveFront Guided (WFG) correction to be applied to the trial contact lens that reduces the RMS level of aberrations as much as practically possible. The output of the wavefront correction program is a customized lathe file that the manufacturer can use to make customized contact lenses on a lathe. The method works best for soft contact lenses and scleral lenses.

Abstract: This invention relates to optical methods and optical systems for making both on-axis and wide-field, peripheral off-axis wavefront measurements of an eye; and for designing and manufacturing wavefront-guided customized contact lens useful for myopia control. The wide-field optical instrument can comprise either (1) a multi-axis optical configuration using multiple off-axis beamlets, or (2) an instrument comprising a rotatable scanning mirror that generates off-axis probe beams.

Abstract: This invention, a Purkinjenator™ optical system, is an eye-tracker and methodology for tracking Purkinje reflection images from a human eye in real-time, which allows for the XYZ position and tip/tilt of structures inside the eye to be determined in real-time. When used in combination with programmable groups of IR LED light sources, unique patterns of Purkinje reflections from internal surfaces (and corneal surfaces) can be identified. Thus, XYZ positioning and tip/tilt of internal structures can be accurately and rapidly determined. An Optical Coherence Tomography (OCT) optical system can be combined with the Purkinjenator™ optical system to provide Z-axis distance information.

Abstract: A model eye includes an optically transmissive structure having a front curved surface to receive a coherent light beam, and an opposite rear planar surface for directing a portion of the coherent light beam back out the model eye through the front curved surface; and a material structure adhered to the rear planar surface of the optically transmissive structure that has a characteristic to cause a speckle pattern of the portion of the coherent light beam that is directed back out the front curved surface of the optically transmissive structure to have a bright-to-dark ratio of less than 2:1. In some embodiments, the material structure may include a fabric-reinforced polyethylene tape adhered to the rear planar surface of the optically transmissive structure by an adhesive. One example material structure which may be employed is duct tape.

Abstract: A model eye includes an optically transmissive structure having a front curved surface to receive a coherent light beam, and an opposite rear planar surface for directing a portion of the coherent light beam back out the model eye through the front curved surface; and a material structure adhered to the rear planar surface of the optically transmissive structure that has a characteristic to cause a speckle pattern of the portion of the coherent light beam that is directed back out the front curved surface of the optically transmissive structure to have a bright-to-dark ratio of less than 2:1. In some embodiments, the material structure may include a fabric-reinforced polyethylene tape adhered to the rear planar surface of the optically transmissive structure by an adhesive. One example material structure which may be employed is duct tape.

Abstract: A method of compensating for misalignment between an optical measurement instrument and a model eye includes: receiving a light beam from the model eye at the optical measurement instrument; producing image data, including light spot data for a plurality of light spots, from the received light beam; determining an observed location of a corneal reflex from the model eye within an image representing the image data; and determining an angle of misalignment between an axis normal to the front surface of the model eye and the optical axis of the optical measurement instrument from the observed location of the corneal reflex within the image.

Abstract: A model eye includes an optically transmissive structure having a front curved surface to receive a coherent light beam, and an opposite rear planar surface for directing a portion of the coherent light beam back out the model eye through the front curved surface; and a material structure adhered to the rear planar surface of the optically transmissive structure that has a characteristic to cause a speckle pattern of the portion of the coherent light beam that is directed back out the front curved surface of the optically transmissive structure to have a bright-to-dark ratio of less than 2:1. In some embodiments, the material structure may include a fabric-reinforced polyethylene tape adhered to the rear planar surface of the optically transmissive structure by an adhesive. One example material structure which may be employed is duct tape.

Abstract: A method of compensating for misalignment between an optical measurement instrument and a model eye includes: receiving a light beam from the model eye at the optical measurement instrument; producing image data, including light spot data for a plurality of light spots, from the received light beam; determining an observed location of a corneal reflex from the model eye within an image representing the image data; and determining an angle of misalignment between an axis normal to the front surface of the model eye and the optical axis of the optical measurement instrument from the observed location of the corneal reflex within the image.

Abstract: A system for determining a surface shape of a test object includes a pattern having a plurality of first elements dispose about a central axis and defining an aperture containing the central axis. The first elements includes a plurality of common elements having a common form and a reference element having a reference form that is different than the common form. The system further comprises a detector array and an optical system. The optical system is adapted to provide an image of the first elements when light reflects off a surface of a test object, passes through the aperture, and is received by the detector array. The reference form may be configured to facilitate an association between the common elements and the spot images of the common elements.

Abstract: A model eye includes an optically transmissive structure having a front curved surface to receive a coherent light beam, and an opposite rear planar surface for directing a portion of the coherent light beam back out the model eye through the front curved surface; and a material structure adhered to the rear planar surface of the optically transmissive structure that has a characteristic to cause a speckle pattern of the portion of the coherent light beam that is directed back out the front curved surface of the optically transmissive structure to have a bright-to-dark ratio of less than 2:1. In some embodiments, the material structure may include a fabric-reinforced polyethylene tape adhered to the rear planar surface of the optically transmissive structure by an adhesive. One example material structure which may be employed is duct tape.

Abstract: A system for determining a surface shape of a test object includes a pattern having a plurality of first elements dispose about a central axis and defining an aperture containing the central axis. The first elements includes a plurality of common elements having a common form and a reference element having a reference form that is different than the common form. The system further comprises a detector array and an optical system. The optical system is adapted to provide an image of the first elements when light reflects off a surface of a test object, passes through the aperture, and is received by the detector array. The reference form may be configured to facilitate an association between the common elements and the spot images of the common elements.

Abstract: A system for determining a surface shape of a test object includes a pattern having a plurality of first elements dispose about a central axis and defining an aperture containing the central axis. The first elements includes a plurality of common elements having a common form and a reference element having a reference form that is different than the common form. The system further comprises a detector array and an optical system. The optical system is adapted to provide an image of the first elements when light reflects off a surface of a test object, passes through the aperture, and is received by the detector array. The reference form may be configured to facilitate an association between the common elements and the spot images of the common elements.

Abstract: A system for determining the shape of an object and/or a distance of the object from the system includes a first plurality of light source, a second plurality of light sources, and a detector or detector array. The first plurality of light sources are disposed about a central axis and are separated from the central axis by radial distances defining an aperture in the first plurality of light sources. The system also includes an optical system adapted to provide light from the second plurality of light sources through the aperture to the object. The system may further include a computer configured to determine the shape of the object and/or the distance of the object from the system using light from the first and second plurality of light sources that is reflected from the object and received by the detector.

Abstract: A system for mapping a three-dimensional structure includes a projecting optical system adapted to project light onto an object, a correction system adapted to compensate the light for at least one aberration in the object, an imaging system adapted to collect light scattered by the object and a wavefront sensor adapted to receive the light collected by the imaging system and to sense a wavefront of the received light. For highly aberrated structures, a number of wavefront measurements are made which are valid over different portions of the structure, and the valid wavefront data is stitched together to yield a characterization of the total structure.

Abstract: A system includes a light pattern generator having light spots for illuminating front and back surfaces of a cornea with polarized light; one or more detectors for receiving one or more of first spot images from light reflected off the front surface, and second spot images from light reflected off the back surface, the light reflected off the front surface having a first polarization and the light reflected off the back surface having a second polarization; a polarization element in an optical path between the back surface and the one or more detectors, the polarization element being configured to attenuate an intensity of the light reflected off the front surface by an amount greater than an amount by which it attenuates the light reflected off the back surface; and a processor for determining a geometric characteristic of the cornea using at least the second plurality of spot images.

Abstract: The described DC to AC inverter efficiently controls the amount of electrical power used to drive a cold cathode fluorescent lamp (CCFL). The output is a fairly pure sine wave which is proportional to an input control voltage. The output waveform purity is ensured by driving a symmetrical rectangular waveform into a second-order, low pass filter at the resonant frequency of the filter for all conditions of line voltage and delivered power. Operating stress on the step-up transformer is minimized by placing the load (lamp) directly across the secondary side of the transformer. When configured to regulate delivered power, the secondary side may be fully floated which practically eliminates a thermometer effect on the operation of the lamp. All of the active elements, including the power switches, may be integrated into a monolithic silicon circuit.