Patents by Inventor James Corrin

James Corrin has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Navigation for electron microscopy
    Patent number: 11688582
    Abstract: A method and system for analyzing a specimen in a microscope are disclosed.
    Type: Grant
    Filed: July 19, 2018
    Date of Patent: June 27, 2023
    Assignee: Oxford Instruments Nanotechnology Tools Limited
    Inventors: Anthony Hyde, James Holland, Simon Burgess, Peter Statham, Philippe Pinard, James Corrin
  • NAVIGATION FOR ELECTRON MICROSCOPY
    Publication number: 20210151287
    Abstract: A method and system for analyzing a specimen in a microscope are disclosed.
    Type: Application
    Filed: July 19, 2018
    Publication date: May 20, 2021
    Inventors: Anthony Hyde, James Holland, Simon Burgess, Peter Statham, Philippe Pinard, James Corrin
  • Analysis with preliminary survey
    Patent number: 10527563
    Abstract: A method and apparatus for analysis of a specimen in a microscope are provided. A first survey is performed that collects analytical data from a region of interest on the specimen surface using a first set of conditions. A second survey is performed that collects additional analytical data from selected parts of the region of interest on the specimen surface using a second set of conditions, different from the first set of conditions. The analytical data from the first survey is used to select the parts used for data collection in the second survey and to decide the order in which they are used.
    Type: Grant
    Filed: May 9, 2017
    Date of Patent: January 7, 2020
    Assignee: OXFORD INSTRUMENTS NANOTECHNOLOGY TOOLS LIMITED
    Inventors: Christian Lang, James Corrin
  • IMPROVED ANALYSIS WITH PRELIMINARY SURVEY
    Publication number: 20190187079
    Abstract: A method and apparatus for analysis of a specimen in a microscope are provided. A first survey is performed that collects analytical data from a region of interest on the specimen surface using a first set of conditions. A second survey is performed that collects additional analytical data from selected parts of the region of interest on the specimen surface using a second set of conditions, different from the first set of conditions. The analytical data from the first survey is used to select the parts used for data collection in the second survey and to decide the order in which they are used.
    Type: Application
    Filed: May 9, 2017
    Publication date: June 20, 2019
    Inventors: Christian Lang, James Corrin