Abstract: A method for growing nanocrystalline diamond (NCD) on Ga2O3 to provide thermal management in Ga2O3-based devices. A protective SiNx interlayer is deposited on the Ga2O3 before growth of the NCD layer to protect the Ga2O3 from damage caused during growth of the NCD layer. The presence of the NCD provides thermal management and enables improved performance of the Ga2O3-based device.

Abstract: A method for product assembly control comprising the steps of assembling the product in response to one or more assembly steps, tracking completion of the assembly steps, where a next one of the assembly steps is not started until each prior one of the assembly steps is completed, and tracking components consumed while performing the assembly steps.

Abstract: A maintenance database is provided, which includes maintenance instruction documents. A communications system generates alarm messages, which include maintenance instructions for resolving the alarm condition. The communications system may distribute these alarm messages to appropriate personnel. A direct maintenance viewer receives alarm messages and presents an interface for viewing the maintenance instructions. The maintenance instruction documents may present maintenance instructions as a series of main steps. Each main step may include one or more detailed step. Each main step or detailed step may have a media file associated therewith. Media files may include audio instructions, photographs, diagrams, three-dimensional models, and/or video instructions. The direct maintenance viewer may forward alarm messages and return acknowledgement and resolution messages.

Abstract: The present invention is directed to a method and system for automating data storage array components testing. A serial number of a data storage array component (i.e., product) is used to determine if the product is of high priority (rank) in comparison with other products in a queue and there is any test cell available for testing the product. Next, if a test is required, the product type and test requirements of the product are retrieved from a database based on the serial number, and the product is routed to the test cell from an assembly line. Then the product and a storage component interface module of the test cell are positioned so that the product and the storage component interface module face each other. The storage component interface module is chosen based on the test requirements retrieved from the database. Next the product is docked into the storage component interface so that the product is connected to the storage component interface module. Then the test is run to completion.