Abstract: A spectrometer for detecting one or more wavelength components of sample radiation is disclosed. The spectrometer includes: a detector comprising a two-dimensional rectilinear array of pixels for generating signals representing an image based on collected sample radiation; one or more optical components arranged to form a spatial pattern based on spectral features of the sample radiation the spatial pattern including a plurality of aligned substantially parallel fringes oriented at a non-zero skew angle to the two-dimensional rectilinear array; and an analyser arranged to receive the signals and provide an output related to the one or more wavelengths. The spectrometer suppresses column/row noise in the detector. Also disclosed is a method of suppressing noise when signals are extracted and processed from detector arrays.

Abstract: A spectrometer for detecting one or more wavelength components of sample radiation is disclosed. The spectrometer includes: a detector comprising a two-dimensional rectilinear array of pixels for generating signals representing an image based on collected sample radiation; one or more optical components arranged to form a spatial pattern based on spectral features of the sample radiation the spatial pattern including a plurality of aligned substantially parallel fringes oriented at a non-zero skew angle to the two-dimensional rectilinear array; and an analyser arranged to receive the signals and provide an output related to the one or more wavelengths. The spectrometer suppresses column/row noise in the detector. Also disclosed is a method of suppressing noise when signals are extracted and processed from detector arrays.