Patents by Inventor James David Weiland

James David Weiland has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Fitting a neural prosthesis using impedance and electrode height
    Patent number: 8190267
    Abstract: The invention is a method of automatically adjusting an electrode array to the neural characteristics of an individual subject. The response to electrical neural stimulation varies from subject to subject. Measure of impedance may be used to predict the electrode height from the neural tissue and, thereby, predict the threshold of perception. Alternatively, electrode height may be measured directly to predict the threshold of perception. Also, impedance measurement may be used to quickly identify defective electrodes and proper electrode placement.
    Type: Grant
    Filed: October 26, 2007
    Date of Patent: May 29, 2012
    Assignee: Second Sight Medical Products, Inc.
    Inventors: Robert J. Greenberg, Ione Fine, Arup Roy, Matthew J. McMahon, Mark S. Humayun, James David Weiland, Alan M. Horsager, Dao Min Zhou, Amy Hines, Sumit Yadav, Rongqing Dai
  • Fitting a neural prosthesis using impedance and electrode height
    Patent number: 8180454
    Abstract: The invention is a method of automatically adjusting an electrode array to the neural characteristics of an individual subject. The response to electrical neural stimulation varies from subject to subject. Measure of impedance may be used to predict the electrode height from the neural tissue and, thereby, predict the threshold of perception. Alternatively, electrode height may be measured directly to predict the threshold of perception. Also, impedance measurement may be used to quickly identify defective electrodes and proper electrode placement.
    Type: Grant
    Filed: December 1, 2006
    Date of Patent: May 15, 2012
    Assignee: Second Sight Medical Products, Inc.
    Inventors: Robert J. Greenberg, Ione Fine, Arup Roy, Matthew J. McMahon, Mark S. Humayun, James David Weiland, Alan M. Horsager, Dao Min Zhou, Amy Hines, Sumit Yadav, Rongqing Dai
  • Fitting a Neural Prosthesis Using Impedance and Electrode Height
    Publication number: 20080294223
    Abstract: The invention is a method of automatically adjusting an electrode array to the neural characteristics of an individual subject. The response to electrical neural stimulation varies from subject to subject. Measure of impedance may be used to predict the electrode height from the neural tissue and, thereby, predict the threshold of perception. Alternatively, electrode height may be measured directly to predict the threshold of perception. Also, impedance measurement may be used to quickly identify defective electrodes and proper electrode placement.
    Type: Application
    Filed: October 26, 2007
    Publication date: November 27, 2008
    Inventors: Robert J. Greenberg, Ione Fine, Arup Roy, Matthew J. McMahon, Mark S. Humayun, James David Weiland, Alan M. Horsager, Dao Min Zhou, Amy Hines, Sumit Yadav, Rongqing Dai