Patents by Inventor James E. Blessing

James E. Blessing has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 10892153
    Abstract: Apparatus (e.g., ion source), systems (e.g., residual gas analyzer), and methods provide extended life and improved analytical stability of mass spectrometers in the presence of contamination gases while achieving substantial preferential ionization of sampled gases over internal background gases. One embodiment is an ion source that includes a gas source, nozzle, electron source, and electrodes. The gas source delivers gas via the nozzle to an evacuated ionization volume and is at a higher pressure than that of the evacuated ionization volume. Gas passing through the nozzle freely expands in an ionization region of the ionization volume. The electron source emits electrons through the expanding gas in the ionization region to ionize at least a portion of the expanding gas. The electrodes create electrical fields for ion flow from the ionization region to a mass filter and are located at distances from the nozzle and oriented to limit their exposure to the gas.
    Type: Grant
    Filed: December 13, 2019
    Date of Patent: January 12, 2021
    Assignee: MKS Instruments, Inc.
    Inventors: James E. Blessing, Jonathan Leslie, Jonathan Hugh Batey
  • Publication number: 20200118806
    Abstract: Apparatus (e.g., ion source), systems (e.g., residual gas analyzer), and methods provide extended life and improved analytical stability of mass spectrometers in the presence of contamination gases while achieving substantial preferential ionization of sampled gases over internal background gases. One embodiment is an ion source that includes a gas source, nozzle, electron source, and electrodes. The gas source delivers gas via the nozzle to an evacuated ionization volume and is at a higher pressure than that of the evacuated ionization volume. Gas passing through the nozzle freely expands in an ionization region of the ionization volume. The electron source emits electrons through the expanding gas in the ionization region to ionize at least a portion of the expanding gas. The electrodes create electrical fields for ion flow from the ionization region to a mass filter and are located at distances from the nozzle and oriented to limit their exposure to the gas.
    Type: Application
    Filed: December 13, 2019
    Publication date: April 16, 2020
    Inventors: James E. Blessing, Jonathan Leslie, Jonathan Hugh Batey
  • Patent number: 10541122
    Abstract: Apparatus (e.g., ion source), systems (e.g., residual gas analyzer), and methods provide extended life and improved analytical stability of mass spectrometers in the presence of contamination gases while achieving substantial preferential ionization of sampled gases over internal background gases. One embodiment is an ion source that includes a gas source, nozzle, electron source, and electrodes. The gas source delivers gas via the nozzle to an evacuated ionization volume and is at a higher pressure than that of the evacuated ionization volume. Gas passing through the nozzle freely expands in an ionization region of the ionization volume. The electron source emits electrons through the expanding gas in the ionization region to ionize at least a portion of the expanding gas. The electrodes create electrical fields for ion flow from the ionization region to a mass filter and are located at distances from the nozzle and oriented to limit their exposure to the gas.
    Type: Grant
    Filed: June 13, 2017
    Date of Patent: January 21, 2020
    Assignee: MKS Instruments, Inc.
    Inventors: James E. Blessing, Jonathan Leslie, Jonathan Hugh Batey
  • Publication number: 20180358217
    Abstract: Apparatus (e.g., ion source), systems (e.g., residual gas analyzer), and methods provide extended life and improved analytical stability of mass spectrometers in the presence of contamination gases while achieving substantial preferential ionization of sampled gases over internal background gases. One embodiment is an ion source that includes a gas source, nozzle, electron source, and electrodes. The gas source delivers gas via the nozzle to an evacuated ionization volume and is at a higher pressure than that of the evacuated ionization volume. Gas passing through the nozzle freely expands in an ionization region of the ionization volume. The electron source emits electrons through the expanding gas in the ionization region to ionize at least a portion of the expanding gas. The electrodes create electrical fields for ion flow from the ionization region to a mass filter and are located at distances from the nozzle and oriented to limit their exposure to the gas.
    Type: Application
    Filed: June 13, 2017
    Publication date: December 13, 2018
    Inventors: James E. Blessing, Jonathan Leslie, Jonathan Hugh Batey
  • Patent number: 6239429
    Abstract: A small, high performance quadrupole mass analyzer (QMA) that is simple to manufacture and assemble with high precision due to the design of key components using high precision circular geometries that are easily machined. The QMA has a single, cylindrical insulating retainer block, which supports at the four filter rods at their mid-points and precisely positions them in the conventional quadrupole configuration. The rods are held in the retainer block by radial fasteners that extend in radially from the outer diameter of the retainer block. These fasteners also constitute the electrical connection for each rod. The retainer block has precise outer diameter for alignment with the entrance and exit electrodes, each of which has a lip of matching precise inner diameter that fits over the outer diameter of the retainer block, thereby achieving virtually perfect coaxial alignment of these parts with one another.
    Type: Grant
    Filed: October 26, 1998
    Date of Patent: May 29, 2001
    Assignee: MKS Instruments, Inc.
    Inventors: James E. Blessing, Jonathan Palk
  • Patent number: 4298450
    Abstract: A method for the hydroconversion of coal by solvent treatment at elevated temperatures and pressure wherein an alcohol having an .alpha.-hydrogen atom, particularly a secondary alcohol such as isopropanol, is utilized as a hydrogen donor solvent. In a particular embodiment, a base capable of providing a catalytically effective amount of the corresponding alcoholate anion under the solvent treatment conditions is added to catalyze the alcohol-coal reaction.
    Type: Grant
    Filed: December 5, 1977
    Date of Patent: November 3, 1981
    Assignee: The United States of America as represented by the United States Department of Energy
    Inventors: David S. Ross, James E. Blessing