Patents by Inventor James E. Boyette, Jr.
James E. Boyette, Jr. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 5635849Abstract: Disclosed is a Probe Positioning Actuator which is low in cost and mass, capable of high accelerations, relatively long stroke and compact packaging, as well as high in efficiency. The actuator assembly comprises a frame, and at least one pair of spaced apart, laterally extending, conductor carrying, flexible beams attached to the frame. A non-magnetic armature, substantially U-shaped in cross section, is attached adjacent or approximate the extended terminal ends of the beams, and a probe is attached to the base of the "U" of the armature for contacting selected points in the electrical circuit associated with the device being tested. The heart of the actuator includes a coil mounted on the upstanding legs of the U-shaped armature and arranged so that the axis of the coil is perpendicular to the base of the armature but substantially parallel to the probe tip.Type: GrantFiled: May 6, 1996Date of Patent: June 3, 1997Assignee: International Business Machines CorporationInventors: Jiann-Chang Lo, Michael Servedio, James M. Hammond, James E. Boyette, Jr., Hans-George H. Kolan
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Patent number: 5598104Abstract: A probe positioning apparatus for use in a probe testing system is disclosed. The probe positioning apparatus includes a probe tip, a probe actuator connected to the probe tip, a probe plate coupled to the probe actuator and a magnetic probe plate clamp that magnetically couples the probe plate. The magnetic coupling forms a slip plane that provides collision compliance for the probe positioning apparatus. One embodiment of the magnetic probe clamp uses a set of shoulder screws to provide quick attachment and release of the probe plate from the probe clamp. A second embodiment uses a magnetic shunt to disable the magnetic connection of the clamp from the probe plate.Type: GrantFiled: October 13, 1994Date of Patent: January 28, 1997Assignee: International Business Machines CorporationInventor: James E. Boyette, Jr.
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Patent number: 5550483Abstract: Probing system performance is improved by dynamically positioning a test probe at a test site during the gantry settling interval using a high performance secondary positioner to compensate for the inherent moving mass oscillational displacements. A primary positioner positions the gantry and its associated test probe to within a predetermined axis distance of the test site and a secondary positioner dynamically maintains the test probe at a target position corresponding to the test site during the settling interval by imparting compensating displacements to the test probe to counteract the displacement errors incurred as the primary positioner attempts to settle the gantry at the test site. Similarly, automatic machine tool performance is improved by dynamically positioning a work tool at a work site during the gantry settling interval using a high performance secondary positioner to compensate for the inherent moving mass oscillational displacements.Type: GrantFiled: November 18, 1994Date of Patent: August 27, 1996Assignee: International Business MachinesInventors: James E. Boyette, Jr., James M. Hammond, Jiann-Chang Lo, James C. Mahlbacher, Michael Servedio, Ali R. Taheri
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Patent number: 5543726Abstract: A system for probing both sides of a high density printed circuit board includes an open frame extending around the circuit board when it is held in a test position by a circuit board carrier. The frame includes two parallel rail structures extending above, and at opposite ends of, the circuit board in the test position. The frame also includes another two parallel rail structures extending below, and at opposite ends of, the circuit board. The upper and lower rail structures extend perpendicularly to one another, and are fastened together at the corners of the frame by means of compression bolt assemblies. Two gantry structures are moved in a first direction between the upper rail structures, while two other gantry structures are moved in a direction perpendicular to the first direction between the lower rail structures. A carriage moves along each gantry structure, and a probe is mounted on each carriage to be moved toward and away from the adjacent surface of the circuit board.Type: GrantFiled: January 3, 1994Date of Patent: August 6, 1996Assignee: International Business Machines CorporationInventors: James E. Boyette, Jr., Jiann-Chang Lo, Michael Servedio
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Patent number: 5532611Abstract: Disclosed is a Probe Positioning Actuator which is low in cost and mass, capable of high accelerations, relatively long stroke and compact packaging, as well as high in efficiency. The actuator assembly comprises a frame, and at least one pair of spaced apart, laterally extending, conductor carrying, flexible beams attached to the frame. A non-magnetic armature, substantially U-shaped in cross section, is attached adjacent or approximate the extended terminal ends of the beams, and a probe is attached to the base of the "U" of the armature for contacting selected points in the electrical circuit associated with the device being tested. The heart of the actuator includes a coil mounted on the upstanding legs of the U-shaped armature and arranged so that the axis of the coil is perpendicular to the base of the armature but substantially parallel to the probe tip.Type: GrantFiled: May 26, 1995Date of Patent: July 2, 1996Assignee: International Business Machines CorporationInventors: Jiann-Chang Lo, Michael Servedio, James M. Hammond, James E. Boyette, Jr., Hans-George H. Kolan
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Patent number: 5467020Abstract: A mechanism is provided for testing circuit traces extending along a flexible substrate, which is fed in a longitudinal direction between an upper plate and a lower plate. The upper plate includes a number of upper apertures extending across the flexible substrate and a number of upper segments, also extending across the flexible substrate, between adjacent apertures. The lower plate includes lower segments extending under the upper apertures and lower apertures extending under the upper segments. Two upper test probes are moved above the flexible substrate, while two lower test probes are moved under the flexible substrate. Tests are applied to both sides of the flexible substrate as the probes are brought into contact with test points in the areas accessible through the upper and lower apertures, with segments extending along the apertures on the opposite sides of the flexible substrate providing a backing surface for probe contact.Type: GrantFiled: March 29, 1994Date of Patent: November 14, 1995Assignee: International Business Machines CorporationInventors: James E. Boyette, Jr., James C. Mahlbacher