Abstract: A tester for storage peripheral devices, such as Winchester disk drives, is provided. The tester comprises a test module which contains one or more ports. The storage peripheral device under test is placed into a carrier which is in turn inserted into the port. The carrier preferably includes a base comprised of a printed circuit board, a front panel, a frame and electronics and electronic connectors. The unit under test is connected to the base via the electronic connectors. The carrier is inserted into mating engagement with the test module. Environmental control is achieved by varying the amount of air flow through the test ports. Historical memory is provided on board the carrier to monitor carrier use. Optional magnetic latch means are provided on the carrier to indicate test status of the device under test.