Abstract: A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

Abstract: A system for quantifying x-ray backscatter system performance is disclosed. The system includes one or more x-ray backscatter detectors, an x-ray tube, a support, and a plurality of rods mounted on the support and arranged in groups. Each group of rods includes at least two rods having the same width. The system also includes a user interface configured to connect to the x-ray backscatter detectors to receive a backscatter signal from the x-ray backscatter detectors associated with the x-ray tube, where the user interface plots a modulation transfer function representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

Abstract: A system for quantifying x-ray backscatter system performance may include a support; a plurality of rods mounted on the support; the rods of the plurality of rods arranged parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width; and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, apply a transfer function to generate a transfer curve representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

Abstract: Embodiments of the present disclosure provide systems and methods for detecting one or more thermal and/or mechanical properties of a structure. The method may include forming one or more test structures from a material that forms the structure, generating and storing calibration data determined from the one or more test structures, emitting X-ray radiation into the structure, detecting X-ray scatter from the structure, and determining the one or more properties of the structure based on the detected X-ray scatter and the calibration data.

Abstract: Inspection systems employing radiation filters with different attenuation characteristics to determine specimen irregularities, and related methods are disclosed. An inspection system includes a radiation emitter configured to emit a radiation beam along a radiation trajectory. Some of the radiation may be reflected by the specimen as backscatter and received by at least one radiation detector of the inspection system along the radiation trajectory. Irregularities and various materials of the specimen may produce backscatter radiation at different energies and/or scatter angles which may be identified by employing radiation filters having different attenuation characteristics. By employing these filters in communication with the radiation emitter and the radiation detector, the backscatter radiation passed through the filters may be measured and integrated at different positions of the radiation beam to produce a composite image of the specimen.

Abstract: A system for quantifying x-ray backscatter system performance may include a support; a plurality of rods mounted on the support; the rods of the plurality of rods arranged parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width; and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, apply a transfer function to generate a transfer curve representing x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

Abstract: A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and forming a one-dimensional image of the item from the detected reflected energy waves.

Abstract: Embodiments of the present disclosure provide systems and methods for detecting one or more thermal and/or mechanical properties of a structure. The method may include forming one or more test structures from a material that forms the structure, generating and storing calibration data determined from the one or more test structures, emitting X-ray radiation into the structure, detecting X-ray scatter from the structure, and determining the one or more properties of the structure based on the detected X-ray scatter and the calibration data.

Abstract: A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

Abstract: The present disclosure is generally directed to of method linear feature detection in a structure by providing a first digital image of the structure, creating a second corresponding digital image of the structure from the first digital image and determining a direction to shift pixels of the second corresponding digital image. A pixel shift value may be input to shift pixels of the second corresponding digital image, and pixels of the second corresponding digital image are shifted by the input pixel shift value in the determined direction. A third corresponding digital image of the structure may be calculated by subtracting the second corresponding digital image of the structure from the first digital image of the structure.

Abstract: Inspection systems employing radiation filters with different attenuation characteristics to determine specimen irregularities, and related methods are disclosed. An inspection system includes a radiation emitter configured to emit a radiation beam along a radiation trajectory. Some of the radiation may be reflected by the specimen as backscatter and received by at least one radiation detector of the inspection system along the radiation trajectory. Irregularities and various materials of the specimen may produce backscatter radiation at different energies and/or scatter angles which may be identified by employing radiation filters having different attenuation characteristics. By employing these filters in communication with the radiation emitter and the radiation detector, the backscatter radiation passed through the filters may be measured and integrated at different positions of the radiation beam to produce a composite image of the specimen.

Abstract: A system for quantifying x-ray backscatter system performance may include a support, a plurality of rods mounted on the support, the rods of the plurality of rods arranged in parallel to each other, having generally curved outer surfaces, and being arranged in groups of varying widths, each group of the groups having at least two of the rods of a same width, and a user interface configured to be connected to receive a backscatter signal from an x-ray backscatter detector associated with an x-ray tube, and generate a display representing photon counts of x-ray backscatter for each rod of the plurality of rods from x-rays transmitted by the x-ray tube.

Abstract: The present disclosure is generally directed to of method linear feature detection in a structure by providing a first digital image of the structure, creating a second corresponding digital image of the structure from the first digital image and determining a direction to shift pixels of the second corresponding digital image. A pixel shift value may be input to shift pixels of the second corresponding digital image, and pixels of the second corresponding digital image are shifted by the input pixel shift value in the determined direction. A third corresponding digital image of the structure may be calculated by subtracting the second corresponding digital image of the structure from the first digital image of the structure.

Abstract: Doped adhesive tape is used during the manufacture of aircraft, including positioning marks, covering orifices from debris, allowing locations to be marked. Any doped adhesive tape inadvertently left in sub-assemblies during the manufacturing process can be detected using backscatter X-ray inspection technology. Detection is facilitated in one embodiment by making the tape thicker, to produce an increased mass density, and in another embodiment by adding a dopant comprising an element that is readily detected by the backscatter X-ray technology. The element can be iodine, and can be incorporated into the backing layer or the adhesive layer of the tape during manufacturing. The use of both thicker tape and a dopant can be used in combination to facilitate detection. If the doped adhesive tape is detected after components are assembled using a backscatter X-ray inspection device, then the doped adhesive tape is removed.

Abstract: A method for detecting discrepancies in an item is provided. The method comprises: directing energy waves at the item along at least one dimension, wherein a portion of the energy waves are reflected back from the item; detecting reflected energy waves from the item along at least one dimension and recording the intensity of the detected reflected energy waves, and forming a one-dimensional image of the item from the detected reflected energy waves.

Abstract: A method for detecting an anomaly associated with a structure is described. The method includes obtaining a baseline scan of the structure, changing at least one condition associated with the structure which is intended to impart a movement of the structure or a movement of objects within the structure, obtaining a secondary scan of the structure, the secondary scan obtained from a same position, with respect to the structure, as the baseline scan, determining any differences between the baseline scan and the secondary scan, and identifying at least one of a foreign object proximate the structure and a structural anomaly associated with the structure based on any differences between the baseline scan and the secondary scan.

Abstract: Doped adhesive tape is used during the manufacture of aircraft, including positioning marks, covering orifices from debris, allowing locations to be marked. Any doped adhesive tape inadvertently left in sub-assemblies during the manufacturing process can be detected using backscatter X-ray inspection technology. Detection is facilitated in one embodiment by making the tape thicker, to produce an increased mass density, and in another embodiment by adding a dopant comprising an element that is readily detected by the backscatter X-ray technology. The element can be iodine, and can be incorporated into the backing layer or the adhesive layer of the tape during manufacturing. The use of both thicker tape and a dopant can be used in combination to facilitate detection. If the doped adhesive tape is detected after components are assembled using a backscatter X-ray inspection device, then the doped adhesive tape is removed.

Abstract: Doped adhesive tape is used during the manufacture of aircraft, including positioning marks, covering orifices from debris, allowing locations to be marked. Any doped adhesive tape inadvertently left in sub-assemblies during the manufacturing process can be detected using backscatter X-ray inspection technology. Detection is facilitated in one embodiment by making the tape thicker, to produce an increased mass density, and in another embodiment by adding a dopant comprising an element that is readily detected by the backscatter X-ray technology. The element can be iodine, and can be incorporated into the backing layer or the adhesive layer of the tape during manufacturing. The use of both thicker tape and a dopant can be used in combination to facilitate detection. If the doped adhesive tape is detected after components are assembled using a backscatter X-ray inspection device, then the doped adhesive tape is removed.

Abstract: The different advantageous embodiments provide a system for identifying a likelihood of detecting objects with a backscatter x-ray system comprising a structure having a number of objects, a plurality of databases, and a processor unit configured to execute a detection analysis process. The processor unit executes the detection analysis process to identify the number of objects, identify a number of densities associated with each of the number of objects, determine a likelihood of detecting each of the number of objects with the backscatter x-ray system, and generate a three-dimensional diagram of the likelihood of detecting each of the number of objects.

Abstract: An apparatus for applying rolling massaging pressure to opposite sides of a bodily extremity. Two parallel tension rods extend through two spaced shafts having massaging rollers rotatably mounted on the shafts between the tension rods. One shaft is fixed in use to the tension rods and compression springs on ends of the tension rods beyond the second shaft bias the shaft mounted rollers toward each other. At least one shaft has extended ends to act as handles for manipulating the apparatus. The initial distance between the rollers can be adjusted before use. A latch is provided to hold the rollers well apart during insertion of a bodily extremity between the rollers, then release to allow the compression spring loaded pressure to be applied.