Abstract: A three-dimensional (3D) circuit card assembly includes a substrate package and a passive heat transfer unit. The substrate package includes a plurality of individual substrates stacked atop one another. The passive heat transfer unit includes at least one intermediate heat dissipation plate configured to receive heat from the substrate package, and a thermally conductive dissipation cover configured to dissipate the heat received from the at least one intermediate heat dissipation plate away from the 3D circuit card assembly.

Abstract: A method includes selecting one or more analysis algorithms to be used to verify an authenticity of an electronic component. Each analysis algorithm identifies a type of data to be analyzed and/or a manner in which the data is to be collected. Each analysis algorithm also defines how the data is to be analyzed to verify the authenticity of the electronic component. The method also includes obtaining data associated with the electronic component. The method further includes analyzing the data associated with the electronic component using the one or more selected analysis algorithms to determine whether the electronic component is authentic. In addition, the method includes generating an output based on the analysis. One or more characteristics of the electronic component could be compared against one or more characteristics of at least one reference component, or variations in one or more characteristics of multiple electronic components could be identified.

Abstract: A method includes selecting one or more analysis algorithms to be used to verify an authenticity of an electronic component. Each analysis algorithm identifies a type of data to be analyzed and/or a manner in which the data is to be collected. Each analysis algorithm also defines how the data is to be analyzed to verify the authenticity of the electronic component. The method also includes obtaining data associated with the electronic component. The method further includes analyzing the data associated with the electronic component using the one or more selected analysis algorithms to determine whether the electronic component is authentic. In addition, the method includes generating an output based on the analysis. One or more characteristics of the electronic component could be compared against one or more characteristics of at least one reference component, or variations in one or more characteristics of multiple electronic components could be identified.

Abstract: A semiconductor device thermal connection used to remove heat from a semiconductor device, such as an integrated circuit, includes a metallic barrier layer on the semiconductor device, and a high thermal conductivity material on the metallic barrier layer that joins the semiconductor device to a thermal heat spreader. The metallic barrier layer may be one or more sputtered layers, and the high thermal conductivity material may be a metallic material, for instance including indium, that is soldered onto the sputtered material. The high thermal conductivity material may form a primary thermal connection in conducting heat away from the semiconductor device. A secondary thermal connection may be made between the heat spreader and a heat sink. The secondary thermal connection may include a compressible solid carbon fiber material. A diaphragm may be used to contain the carbon fiber material, to prevent carbon fibers from coming into contact with the semiconductor device.

Abstract: Methods and apparatus for transferring heat according to various aspects of the present invention operate in conjunction with a heat source on a substrate. In one embodiment, a lid is adapted to engage the substrate. The lid may comprise a thermally conductive rigid body and one or more hardstops configured to limit a bond line distance between the rigid body and the heat source. A thermal interface material may be disposed in the bond line between the heat source and the lid. The thermal interface material may be adapted to provide a thermally conductive adhesive bond between the lid and the heat source.

Abstract: An internally-sealed pass-through electrical connector includes electrical conductors for carrying electrical signals through the electrical connector, a connector body or shell surrounding the connector, and an organic adhesive material within the body or shell that fills space around the conductors and between the conductors and the connector body. The connector body includes a metal portion, such as an aluminum portion, that has a roughened surface to better allow the adhesive to adhere to it. The roughened surface may be a grit blasted surface. The connector body may also include a plastic portion, such as a molded lead organizer, to aid in positioning the leads. The adhesive may have a coefficient of thermal expansion that is matched to that of the metal portion of the connector body or shell. The organic adhesive may be an epoxy material. The electrical connector may have any of a variety of configurations.

Abstract: A semiconductor device thermal connection used to remove heat from a semiconductor device, such as an integrated circuit, includes a metallic barrier layer on the semiconductor device, and a high thermal conductivity material on the metallic barrier layer that joins the semiconductor device to a thermal heat spreader. The metallic barrier layer may be one or more sputtered layers, and the high thermal conductivity material may be a metallic material, for instance including indium, that is soldered onto the sputtered material. The high thermal conductivity material may form a primary thermal connection in conducting heat away from the semiconductor device. A secondary thermal connection may be made between the heat spreader and a heat sink. The secondary thermal connection may include a compressible solid carbon fiber material. A diaphragm may be used to contain the carbon fiber material, to prevent carbon fibers from coming into contact with the semiconductor device.