Abstract: A method of retrofitting a probe station having a head plate (12), so that the probe station (10) is adapted to mate with a predetermined probe card dish (16) and any tester (18) out of a set of testers. A depression is then machined into the head plate to create a head plate-tooling plate attachment region. Next, fastening and alignment items are provided and installed in this region. Further, a set of tooling plates (110) are provided, each having fastening and alignment items adapted to mate to the fastening and alignment items on the attachment regions and defining an aperture designed to engage the predetermined probe card dish. The user may then select a desired one of the tooling plates and mate and fasten the selected tooling plate to the head plate-tooling plate attachment region using the alignment and fastening items.

Abstract: A docking system that allows a Teradyne J750-type tester to be mounted to both a probe station and a handler using uniform docking hardware. Any desired probe stations may be converted into an A-type configuration so that the J750 may be used on both probe stations and handlers. In one aspect, a head stage is designed to mount uniform docking hardware to convert a probe station to an A-type configuration. In another aspect, the uniform docking hardware includes two separate mounting assemblies. One of the mounting assemblies has two kinematic docking units placed thereon. The other of the mounting assemblies has a single kinematic docking unit. The separate mounting assemblies allows ease of assembly to the probe station and is less costly to manufacture.

Abstract: Embodiments of an apparatus and method for cleaning the probes of a probe device are disclosed. In an illustrated embodiment, a cleaning apparatus comprises a cleaning member having a cleaning surface and a support member for supporting the cleaning member. An adjustment mechanism is operable to adjust the tilt orientation of the cleaning surface relative to the probe tips to maximize contact between the probe tips and the cleaning surface when the probe tips are rubbed against the cleaning surface to remove debris therefrom. In particular embodiments, the adjustment mechanism comprises one or more adjusting screws and one or more corresponding hold-down screws extending generally co-axially through the adjusting screws.

Abstract: A docking system that allows a Teradyne J750-type tester to be mounted to both a probe station and a handler using uniform docking hardware. Any desired probe stations may be converted into an A-type configuration so that the J750 may be used on both probe stations and handlers. In one aspect, a head stage is designed to mount uniform docking hardware to convert a probe station to an A-type configuration. In another aspect, the uniform docking hardware includes two separate mounting assemblies. One of the mounting assemblies has two kinematic docking units placed thereon. The other of the mounting assemblies has a single kinematic docking unit. The separate mounting assemblies allows ease of assembly to the probe station and is less costly to manufacture.