Patents by Inventor James Edward Blessing

James Edward Blessing has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Monitoring Radical Particle Concentration Using Mass Spectrometry
    Publication number: 20240264116
    Abstract: A monitoring system detects and measures a quantity of radical particles within a gas. A test chamber is coupled to a flow channel that transmits a gas. The test chamber defines an aperture connecting the test chamber and the flow channel, and the aperture permits a subset of the gas to enter the test chamber from the flow channel. An ionizer is positioned within the test chamber and generates radical ions from radical particles of the subset of the gas. A mass spectrometer measures a quantity of the radical ions, thereby providing a measurement of the radical particles in the gas.
    Type: Application
    Filed: March 29, 2024
    Publication date: August 8, 2024
    Applicant: MKS Instruments, Inc.
    Inventors: Chenglong Yang, Jimmy Liu, James Edward Blessing
  • Monitoring radical particle concentration using mass spectrometry
    Patent number: 11971386
    Abstract: A monitoring system detects and measures a quantity of radical particles within a gas. A test chamber is coupled to a flow channel that transmits a gas. The test chamber defines an aperture connecting the test chamber and the flow channel, and the aperture permits a subset of the gas to enter the test chamber from the flow channel. An ionizer is positioned within the test chamber and generates radical ions from radical particles of the subset of the gas. A mass spectrometer measures a quantity of the radical ions, thereby providing a measurement of the radical particles in the gas.
    Type: Grant
    Filed: December 16, 2021
    Date of Patent: April 30, 2024
    Assignee: MKS Instruments, Inc.
    Inventors: Chenglong Yang, Jimmy Liu, James Edward Blessing
  • Ion source with gas delivery for high-fidelity analysis
    Patent number: 11768176
    Abstract: In a system for processing gas, a gas analyzer in a gas analyzer chamber measures a quantity of ions generated from a gas. An ionization source includes an ionization chamber and an electron source for generating ions for the gas analyzer. The ionization chamber encompasses an ionization region in which particles of the gas are charged to form the ions. A channel directs the gas from a gas source into the ionization chamber, and the channel extends to a surface of the ionization chamber. An ionization source vacuum pump is in gaseous communication with the ionization chamber via a substantially large opening, and operates to draw gas from the ionization chamber.
    Type: Grant
    Filed: January 6, 2022
    Date of Patent: September 26, 2023
    Assignee: MKS Instruments, Inc.
    Inventor: James Edward Blessing
  • Ion Source with Gas Delivery for High-Fidelity Analysis
    Publication number: 20230213479
    Abstract: In a system for processing gas, a gas analyzer in a gas analyzer chamber measures a quantity of ions generated from a gas. An ionization source includes an ionization chamber and an electron source for generating ions for the gas analyzer. The ionization chamber encompasses an ionization region in which particles of the gas are charged to form the ions. A channel directs the gas from a gas source into the ionization chamber, and the channel extends to a surface of the ionization chamber. An ionization source vacuum pump is in gaseous communication with the ionization chamber via a substantially large opening, and operates to draw gas from the ionization chamber.
    Type: Application
    Filed: January 6, 2022
    Publication date: July 6, 2023
    Inventor: James Edward Blessing
  • Monitoring Radical Particle Concentration Using Mass Spectrometry
    Publication number: 20220196597
    Abstract: A monitoring system detects and measures a quantity of radical particles within a gas. A test chamber is coupled to a flow channel that transmits a gas. The test chamber defines an aperture connecting the test chamber and the flow channel, and the aperture permits a subset of the gas to enter the test chamber from the flow channel. An ionizer is positioned within the test chamber and generates radical ions from radical particles of the subset of the gas. A mass spectrometer measures a quantity of the radical ions, thereby providing a measurement of the radical particles in the gas.
    Type: Application
    Filed: December 16, 2021
    Publication date: June 23, 2022
    Inventors: Chenglong Yang, Jimmy Liu, James Edward Blessing