Patents by Inventor James Ernest Chorn

James Ernest Chorn has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7590504
    Abstract: A graphical user interface (GUI) that configures a test for a circuit. More particularly, the circuit includes a built-in-self-test (BIST) compatible device and has a test configuration. The device has an associated value. Moreover, the circuit, the device, and the associated value are defined in a circuit definition. The GUI includes a GUI object representing the circuit, a GUI object representing the BIST compatible device, and a GUI object representing the associated value. Furthermore, at least one of the GUI objects is configured to allow a modification to the GUI object and to reconfigure the test configuration in response to the GUI object modification. Also, the GUI object is further configured to modify itself to reflect a modification of the circuit definition. More particularly, the device may be an interconnect built-in self-test (IBIST) compatible device having registers, ports and lanes of the ports.
    Type: Grant
    Filed: August 16, 2006
    Date of Patent: September 15, 2009
    Assignee: ASSET InterTech, Inc.
    Inventors: James Ernest Chorn, Thomas Green Hudiburgh, Jay Joseph Nejedlo, Edward Keith Simpson
  • Patent number: 7562274
    Abstract: Methods and apparatus for performing a data driven test on a circuit including at least one built-in-self-test compatible device. In one embodiment, the method includes describing the device using a descriptive language including setting at least one default value associated with the device. The method also includes defining a scan path associated with the device, defining a netlist of the circuit, and configuring a test control program for the circuit. Additionally, the method includes changing the default value associated with the device. Testing the circuit after changing the value and using the test control program is also included wherein a portion of the test control program associated with the value remains substantially unmodified.
    Type: Grant
    Filed: August 16, 2006
    Date of Patent: July 14, 2009
    Assignee: Asset Intertech, Inc.
    Inventors: James Ernest Chorn, Thomas Green Hudiburgh, Jay Joseph Nejedlo, Edward Keith Simpson, Walter Michael Coldewey