Abstract: A method and apparatus allowing for simultaneous direct viewing and electronic capture of images in an electron microscope (TEM). For this, the usual opaque direct viewing plate in the TEM is replaced in form and in function by a two-sided direct viewing plate including at least one scintillator. This plate produces light emissions from both its upper and lower surfaces, which allows an electronic camera below the plate to be used simultaneously with direct human viewing from above the plate. The method and apparatus are also compatible with traditional permanent image recording units that are often desired in such microscopes.

Abstract: A method and apparatus allowing for simultaneous direct viewing and electronic capture of images in an electron microscope (TEM). For this, the usual opaque direct viewing plate in the TEM is replaced in form and in function by a two-sided direct viewing plate including at least one scintillator. This plate produces light emissions from both its upper and lower surfaces, which allows an electronic camera below the plate to be used simultaneously with direct human viewing from above the plate. The method and apparatus are also compatible with traditional permanent image recording units that are often desired in such microscopes.

Abstract: A method of imaging a specimen by transmission of electrons with energies below 1 MeV including the steps of passing a beam of electrons having energies that are less than 1 MeV through the specimen to produce a first transmitted electron beam; passing the first transmitted electron beam through an imaging screen to generate a light image and a second transmitted electron beam; preventing more than about 95% of the second transmitted electron beam from reflecting back to the imaging screen; and focusing the generated light image onto an electronic camera. The imaging screen includes a support structure and a light generating layer, in which the support structure has a thickness that is less than one half the Kanaya-Okayama range of electrons in the imaging screen.

Abstract: The invention provides for a device for generating, amplifying and detecting secondary electrons from a surface of a sample. The device may comprise a scanning electron microscope. The invention also provides for a method for generating, amplifying and detecting secondary electrons from a surface of a sample.

Abstract: The invention provides for a device for generating, amplifying and detecting secondary electrons from a surface of a sample. The device may comprise a scanning electron microscope. The invention also provides for a method for generating, amplifying and detecting secondary electrons from a surface of a sample.

Abstract: The ultrasonic weld inspection method comprises transmitting an ultrasonic wave through the molten metal portion of the weld while the weld is being formed and determining if a weld defect is present in the molten metal. If no defect is detected in the molten metal, the welding process continues. However, if a defect is detected in the molten metal, the welding electrodes remain at that position until the defect has dissipated. In this manner, defects are removed from the weld before the weld metal solidifies.