Abstract: Apparatuses, systems, and techniques to perform collision-free motion generation (e.g., to operate a real-world or virtual robot). In at least one embodiment, at least a portion of the collision-free motion generation is performed in parallel.

Abstract: In an embodiment, a universal test cell includes a plurality of test slots configured to receive a plurality of universal test containers each including similar dimensions. Each universal test container is configured to enclose each of a plurality of different devices to test. Each universal test container includes an external electrical interface configured to couple to each of the plurality of different devices to test. The universal test cell is configured to test the plurality of different devices while each is located within a universal test container of the plurality of universal test containers. The universal test cell includes a plurality of universal electrical interfaces that are each configured to couple with the external electrical interface of each universal test container.

Abstract: In one embodiment, a universal test container can include a universal external electrical interface configured to couple to each of a plurality of different devices to test. In addition, the universal test container is configured to enclose each of the plurality of different devices to test.

Abstract: In an embodiment, a universal test floor system includes a first robot that is configured to pack a plurality of universal test containers each including similar dimensions into a universal bin. Each universal test container is configured to enclose each of a plurality of different devices to test. The universal test floor system includes a universal conveyor configured to transport the universal bin. The first robot is configured to put the universal bin onto the universal conveyor and a second robot is configured to remove it. A universal test cell system is configured to receive the universal bin. The universal test cell system includes a plurality of test slots configured to receive a plurality of universal test containers. The universal test cell system is configured to test the plurality of different devices while each is located within one of the plurality of universal test containers.

Abstract: In an embodiment, a testing system includes a frame, a DUT (device under test) testing module. The frame has at least one aperture extending from a front side of the frame to a rear side of the frame. The DUT testing module is inserted into the at least one aperture. The DUT testing module is operable to receive and hold a DUT receptacle including an electrical interface, an air flow interface, and a DUT coupled to the electrical interface. The DUT receptacle is configured to enclose and hold inside the DUT. Further, the DUT testing module is operable to couple to and to use the electrical interface and the air flow interface to perform a test at a controlled temperature on the DUT that is inside of the DUT receptacle.

Abstract: In an embodiment, a test floor apparatus includes at least one conveyor, a vertical stack buffer, and an automated handling station. The vertical stack buffer is operable to hold a plurality of DUT (device under test) receptacles and operable to place a DUT receptacle on the at least one conveyor to enable a corresponding DUT to be inserted into the DUT receptacle. The automated handling station is operable to access the DUT receptacle from the at least one conveyor and is operable to open the DUT receptacle to position the corresponding DUT in a manner that couples the corresponding DUT to an electrical interface of the DUT receptacle and that encloses the corresponding DUT inside the DUT receptacle to facilitate testing of the corresponding DUT.

Abstract: In an embodiment, a testing apparatus includes an air mixing chamber, a docking unit, and a DUT (device under test) test execution unit. The air mixing chamber includes a first air inlet operable to receive a first air flow, a second air inlet operable to receive a second air flow, and an air outlet operable to output a mixed air flow. The docking unit is operable to receive and to securely hold a DUT (device under test) receptacle including an electrical interface, an air flow interface, and a DUT coupled to the electrical interface. The DUT receptacle is configured to enclose and hold inside the DUT. The docking unit is operable to couple to the electrical interface and to the air flow interface. The docking unit is operable to receive and to send the mixed air flow to the DUT receptacle. A DUT test execution unit is coupled to the docking unit. The DUT test execution unit is operable to perform a test on the DUT that is inside of the DUT receptacle.

Abstract: In one embodiment, a universal test container can include a universal external electrical interface configured to couple to each of a plurality of different devices to test. In addition, the universal test container is configured to enclose each of the plurality of different devices to test.

Abstract: In an embodiment, a universal test floor system includes a first robot that is configured to pack a plurality of universal test containers each including similar dimensions into a universal bin. Each universal test container is configured to enclose each of a plurality of different devices to test. The universal test floor system includes a universal conveyor configured to transport the universal bin. The first robot is configured to put the universal bin onto the universal conveyor and a second robot is configured to remove it. A universal test cell system is configured to receive the universal bin. The universal test cell system includes a plurality of test slots configured to receive a plurality of universal test containers. The universal test cell system is configured to test the plurality of different devices while each is located within one of the plurality of universal test containers.

Abstract: In an embodiment, a testing system includes a frame, a DUT (device under test) testing module. The frame has at least one aperture extending from a front side of the frame to a rear side of the frame. The DUT testing module is inserted into the at least one aperture. The DUT testing module is operable to receive and hold a DUT receptacle including an electrical interface, an air flow interface, and a DUT coupled to the electrical interface. The DUT receptacle is configured to enclose and hold inside the DUT. Further, the DUT testing module is operable to couple to and to use the electrical interface and the air flow interface to perform a test at a controlled temperature on the DUT that is inside of the DUT receptacle.

Abstract: In an embodiment, a universal test cell includes a plurality of test slots configured to receive a plurality of universal test containers each including similar dimensions. Each universal test container is configured to enclose each of a plurality of different devices to test. Each universal test container includes an external electrical interface configured to couple to each of the plurality of different devices to test. The universal test cell is configured to test the plurality of different devices while each is located within a universal test container of the plurality of universal test containers. The universal test cell includes a plurality of universal electrical interfaces that are each configured to couple with the external electrical interface of each universal test container.

Abstract: In an embodiment, a test floor apparatus includes at least one conveyor, a vertical stack buffer, and an automated handling station. The vertical stack buffer is operable to hold a plurality of DUT (device under test) receptacles and operable to place a DUT receptacle on the at least one conveyor to enable a corresponding DUT to be inserted into the DUT receptacle. The automated handling station is operable to access the DUT receptacle from the at least one conveyor and is operable to open the DUT receptacle to position the corresponding DUT in a manner that couples the corresponding DUT to an electrical interface of the DUT receptacle and that encloses the corresponding DUT inside the DUT receptacle to facilitate testing of the corresponding DUT.

Abstract: In an embodiment, a testing apparatus includes an air mixing chamber, a docking unit, and a DUT (device under test) test execution unit. The air mixing chamber includes a first air inlet operable to receive a first air flow, a second air inlet operable to receive a second air flow, and an air outlet operable to output a mixed air flow. The docking unit is operable to receive and to securely hold a DUT (device under test) receptacle including an electrical interface, an air flow interface, and a DUT coupled to the electrical interface. The DUT receptacle is configured to enclose and hold inside the DUT. The docking unit is operable to couple to the electrical interface and to the air flow interface. The docking unit is operable to receive and to send the mixed air flow to the DUT receptacle. A DUT test execution unit is coupled to the docking unit. The DUT test execution unit is operable to perform a test on the DUT that is inside of the DUT receptacle.