Abstract: An apparatus for handling one or more tubulars includes a body defining at least a portion of a tapered bowl. A plurality of slips may be disposed at least partially within the bowl and configured to slide along a surface of the bowl. Each of the slips includes a radial engaging surface and a tapered engaging surface. The radial engaging surface may have a plurality of gripping structures extending inwardly therefrom that are configured to engage an outer surface of a first tubular having a substantially constant outer diameter. The tapered engaging surface may be configured to engage a tapered outer surface of a second tubular.

Abstract: An apparatus for handling one or more tubulars. The apparatus may include a body defining at least a portion of a tapered bowl. A plurality of slips may be disposed at least partially within the bowl and configured to slide along a surface of the bowl. Each of the slips may include a radial engaging surface and a tapered engaging surface. The radial engaging surface may have a plurality of gripping structures extending inwardly therefrom that are configured to engage an outer surface of a first tubular having a substantially constant outer diameter. The tapered engaging surface may be configured to engage a tapered outer surface of a second tubular.

Abstract: Testing of a multi-module data processing system (20) includes performing a functional test on a module (42, 44, 46, 48, 50, 54) concurrently with an erase operation of a non-volatile memory module (34, 36). Because the erase operation requires multiple clock cycles to complete, and little or no interaction with a tester, a set of test patterns may be run on one or more of the modules (42, 44, 46, 48, 50, 54) while the erase operation is being performed. Between each test pattern, a special reset signal is provided to a reset unit (39) of a system integration unit (38). The special reset signal resets the modules (42, 44, 46, 48, 50, 54), without affecting the erase operation of the flash memory module (34, 36), in order to perform each test of the modules (42, 44, 46, 48, 50, 54) from a known state. Concurrent testing in this manner reduces the time required to test a multi-module data processing system.