Abstract: An optical fibre bend sensor (10) measures the degree and orientation of bending present in a sensor length (30) portion of a fibre assembly (26). Within a multicored fibre (30, 32,34), cores (62, 66) are grouped in non-coplanar pairs. An arrangement of optical elements (28, 36, 38) define within each core pair (62, 66) two optical paths (122, 124) which differ along the sensor length (30): one core (62) of a pair (62, 66) is included in the first path (122), and the other core (66) in the second path (124). A general bending of the sensor region (30) will lengthen one core (62, 66) with respect to the other. Interrogation of this length differential by means of interferometry generates interferograms from which the degree of bending in the plane of the core pair is extracted. Bend orientation can be deduced from data extracted from multiple core pairs.

Abstract: An optical fiber bend sensor (10) measures the degree and orientation of bending present in a sensor length (30) portion of a fiber assembly (26). Within a multicored fiber (30, 32,34), cores (62, 66) are grouped in non-coplanar pairs. An arrangement of optical elements (28, 36, 38) define within each core pair (62, 66) two optical paths (122, 124) which differ along the sensor length (30): one core (62) of a pair (62, 66) is included in the first path (122), and the other core (66) in the second path (124). A general bending of the sensor region (30) will lengthen one core (62, 66) with respect to the other. Interrogation of this length differential by means of interferometry generates interferograms from which the degree of bending in the plane of the core pair is extracted. Bend orientation can be deduced from data extracted from multiple core pairs.

Abstract: An optical fiber bend sensor (10) measures the degree and orientation of bending present in a sensor length (30) portion of a fiber assembly (26). Within a multicored fiber (30, 32, 34), cores (62, 66) are grouped in non-coplanar pairs. An arrangement of optical elements (28, 36, 38) define within each core pair (62, 66) two optical paths (122, 124) which differ along the sensor length (30): one core (62) of a pair (62, 66) is included in the first path (122), and the other core (66) in the second path (124). A general bending of the sensor region (30) will lengthen one core (62, 66) with respect to the other. Interrogation of this length differential by means of interferometry generates interferograms from which the degree of bending in the plane of the core pair is extracted. Bend orientation can be deduced from data extracted from multiple core pairs.

Abstract: A sensor system (10) incorporating an interferometer operates as an optical strain gauge. The system (10) is arranged to generate interferograms characterised by an optical path difference between light traversing a sensor arm (12) of the interferometer and light traversing a reference arm (58). Each arm incorporates a highly birefringent optical fibre (38, 58) capable of supporting light propagation at two velocities in two different polarisation modes. A first interferogram is generated between light coupled into the fast eigenmodes of each fibre and a second is generated between light coupled into the slow eigenmodes. Mean optical group delay (.tau..sub.MGD) and differential optical group delay (.tau..sub.DGD) of these interferograms are affected differently by temperature and strain and thus provide a means of discriminating between these attributes of the sensor environment. Thus simultaneous measurement of strain and temperature is achieved.

Abstract: A sensor system in an interferometric arrangement has a sensor arm and a reference arm. The reference arm is in a stable environment and the sensor arm is arranged to be subject to variations in strain and/or temperature. Radiation from a broadband source propagates through the arrangement and a broadband interferogram is generated as an air gap is scanned. The interferogram is recorded on an oscilloscope and analyzed using signal processing software on a computer. From the analysis the changes in group delay and optical dispersion of the light in the sensor arm due to strain and temperature changes is measured, and values for the strain and/or temperature changes calculated. A narrowband light source may be used for accurate calibration of path length differences during scanning. The strain and temperature on the sensor arm may be calibrated or tested using clamps and a thermal enclosure.