Patents by Inventor James Geoffrey Maloney

James Geoffrey Maloney has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11228102
    Abstract: Various examples are provided for fragmented aperture antennas. In one example, a fragmented aperture antenna includes a two-dimensional lattice of conducting elements, where positioning of the conducting elements in adjacent rows are offset based upon a fixed skew angle. In another example, a fragmented aperture antenna includes a two-dimensional lattice comprising a combination of first and second geometric conducting elements, where a second geometric conducting element provides a connection between adjacent sides of diagonally adjacent first geometric conducting elements. In another example, a fragmented aperture antenna includes a two-dimensional lattice of conducting elements having a single common non-rectangular shape, where the conducting elements interleave in a digitated fashion. Diagonally adjacent conducting elements overlap along a portion of adjacent edges of the diagonally adjacent conducting elements.
    Type: Grant
    Filed: May 18, 2020
    Date of Patent: January 18, 2022
    Inventors: James Geoffrey Maloney, John Weber Schultz
  • Publication number: 20200350666
    Abstract: Various examples are provided for fragmented aperture antennas. In one example, a fragmented aperture antenna includes a two-dimensional lattice of conducting elements, where positioning of the conducting elements in adjacent rows are offset based upon a fixed skew angle. In another example, a fragmented aperture antenna includes a two-dimensional lattice comprising a combination of first and second geometric conducting elements, where a second geometric conducting element provides a connection between adjacent sides of diagonally adjacent first geometric conducting elements. In another example, a fragmented aperture antenna includes a two-dimensional lattice of conducting elements having a single common non-rectangular shape, where the conducting elements interleave in a digitated fashion. Diagonally adjacent conducting elements overlap along a portion of adjacent edges of the diagonally adjacent conducting elements.
    Type: Application
    Filed: May 18, 2020
    Publication date: November 5, 2020
    Inventors: James Geoffrey Maloney, John Weber Schultz
  • Patent number: 10658738
    Abstract: Various examples are provided for fragmented aperture antennas. In one example, a fragmented aperture antenna includes a two-dimensional lattice of conducting elements, where positioning of the conducting elements in adjacent rows are offset based upon a fixed skew angle. In another example, a fragmented aperture antenna includes a two-dimensional lattice comprising a combination of first and second geometric conducting elements, where a second geometric conducting element provides a connection between adjacent sides of diagonally adjacent first geometric conducting elements. In another example, a fragmented aperture antenna includes a two-dimensional lattice of conducting elements having a single common non-rectangular shape, where the conducting elements interleave in a digitated fashion. Diagonally adjacent conducting elements overlap along a portion of adjacent edges of the diagonally adjacent conducting elements.
    Type: Grant
    Filed: August 10, 2016
    Date of Patent: May 19, 2020
    Inventors: James Geoffrey Maloney, John Weber Schultz
  • Patent number: 10203202
    Abstract: Various examples of methods and systems are disclosed for non-contact determination of coating thickness. In one example, among others, a method includes illuminating a surface having a layer of a coating material with electromagnetic (EM) energy transmitted at two or more frequencies, obtaining measured reflection data from reflected EM energy, and matching the measured reflection data to modeled reflection data of a reflection model based upon minimization of an error between the measured reflection data and the modeled reflection data to determine a measured thickness of the layer. In another example, a system includes a probe configured to illuminate an area of the surface including a layer of a coating material with EM energy and receive reflected EM energy, and a processing device configured to determine a measured thickness of the layer based upon minimization of an error between measured reflection data and modeled reflection data.
    Type: Grant
    Filed: April 7, 2015
    Date of Patent: February 12, 2019
    Inventors: John Weber Schultz, Rebecca Brockway Schultz, James Geoffrey Maloney, Kathleen Cummings Maloney
  • Publication number: 20170047650
    Abstract: Various examples are provided for fragmented aperture antennas. In one example, a fragmented aperture antenna includes a two-dimensional lattice of conducting elements, where positioning of the conducting elements in adjacent rows are offset based upon a fixed skew angle. In another example, a fragmented aperture antenna includes a two-dimensional lattice comprising a combination of first and second geometric conducting elements, where a second geometric conducting element provides a connection between adjacent sides of diagonally adjacent first geometric conducting elements. In another example, a fragmented aperture antenna includes a two-dimensional lattice of conducting elements having a single common non-rectangular shape, where the conducting elements interleave in a digitated fashion. Diagonally adjacent conducting elements overlap along a portion of adjacent edges of the diagonally adjacent conducting elements.
    Type: Application
    Filed: August 10, 2016
    Publication date: February 16, 2017
    Inventors: James Geoffrey Maloney, John Weber Schultz
  • Patent number: 9473106
    Abstract: A thin-film bulk acoustic wave delay line device providing true-time delays and a method of fabricating same. An exemplary device can comprise several thin-film layers including thin-film transducer layers, thin-film delay layers, and stacks of additional thin-film materials providing acoustic reflectors and matching networks. The layer material selection and layer thicknesses can be controlled to improve impedance matching between transducers and the various delay line materials. For example, the transducer layers and delay layers can comprise piezoelectric and amorphous forms of the same material. The layers can be deposited on a carrier substrate using standard techniques. The device can be configured so that mechanical waves propagate solely within the thin films, providing a substrate-independent device. The device, so constructed, can be of a small size, e.g. 40 ?m per side, and capable of handling high power levels, potentially up to 20 dBm, with low insertion loss of approximately 3 dB.
    Type: Grant
    Filed: June 21, 2012
    Date of Patent: October 18, 2016
    Assignee: Georgia Tech Research Corporation
    Inventors: Adam Wathen, William Hunt, Farasat Munir, Kyle Spencer Davis, James Geoffrey Maloney, Ryan Sloan Westafer
  • Publication number: 20150285621
    Abstract: Various examples of methods and systems are disclosed for non-contact determination of coating thickness. In one example, among others, a method includes illuminating a surface having a layer of a coating material with electromagnetic (EM) energy transmitted at two or more frequencies, obtaining measured reflection data from reflected EM energy, and matching the measured reflection data to modeled reflection data of a reflection model based upon minimization of an error between the measured reflection data and the modeled reflection data to determine a measured thickness of the layer. In another example, a system includes a probe configured to illuminate an area of the surface including a layer of a coating material with EM energy and receive reflected EM energy, and a processing device configured to determine a measured thickness of the layer based upon minimization of an error between measured reflection data and modeled reflection data.
    Type: Application
    Filed: April 7, 2015
    Publication date: October 8, 2015
    Inventors: John Weber Schultz, Rebecca Brockway Schultz, James Geoffrey Maloney, Kathleen Cummings Maloney
  • Publication number: 20130162369
    Abstract: A thin-film bulk acoustic wave delay line device providing true-time delays and a method of fabricating same. An exemplary device can comprise several thin-film layers including thin-film transducer layers, thin-film delay layers, and stacks of additional thin-film materials providing acoustic reflectors and matching networks. The layer material selection and layer thicknesses can be controlled to improve impedance matching between transducers and the various delay line materials. For example, the transducer layers and delay layers can comprise piezoelectric and amorphous forms of the same material. The layers can be deposited on a carrier substrate using standard techniques. The device can be configured so that mechanical waves propagate solely within the thin films, providing a substrate-independent device. The device, so constructed, can be of a small size, e.g. 40 ?m per side, and capable of handling high power levels, potentially up to 20 dBm, with low insertion loss of approximately 3 dB.
    Type: Application
    Filed: June 21, 2012
    Publication date: June 27, 2013
    Applicant: Georgia Tech Research Corporation
    Inventors: Adam Wathen, William Hunt, Farasat Munir, Kyle Spencer Davis, James Geoffrey Maloney, Ryan Sloan Westafer
  • Patent number: 6323809
    Abstract: The present invention provides a fragmented aperture antenna. The antenna includes a planar layer having a plurality of conductive and substantially non-conductive areas. Each area has a periphery that extends along a grid of first and second sets of parallel lines so that each area comprises one or more contiguous elements defined by the parallel lines. The locations of the conducting materials in the fragmented aperture antenna are determined by a multi-stage optimization procedure that tailors the performance of the antenna to a particular application. The resulting configuration and arrangement of conductive and substantially non-conductive areas enable communication of electromagnetic energy wirelessly in a specific direction to the planar layer when an electrical connection is made to at least one of the conductive areas.
    Type: Grant
    Filed: May 26, 2000
    Date of Patent: November 27, 2001
    Assignee: Georgia Tech Research Corporation
    Inventors: James Geoffrey Maloney, Morris Philip Kesler, Paul H. Harms, Glenn Stanley Smith
  • Patent number: 5689275
    Abstract: A photonic bandgap antenna (PBA) (10') utilizes a periodic bandgap material (PBM), which is essentially a dielectric, to transmit, receive, or communicate electromagnetic radiation encoded with information. Further, a photonic bandgap transmission line (PBTL) (10") can also be constructed with the PBM. Because the PBA (10') and PBTL (10") do not utilize metal, the PBA (10') and PBTL (10") can be used in harsh environments, such as those characterized by high temperature and/or high pressure, and can be easily built into a dielectric structure such as a building wall or roof. Further, the PBA (10') and PBTL (10") inhibit scattering by incident electromagnetic radiation at frequencies outside those electromagnetic frequencies in the bandgap range associated with the PBM.
    Type: Grant
    Filed: May 16, 1995
    Date of Patent: November 18, 1997
    Assignee: Georgia Tech Research Corporation
    Inventors: Ricky Lamar Moore, Morris Philip Kesler, James Geoffrey Maloney, Brian Leon Shirley