Patents by Inventor James Hager
James Hager has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Patent number: 11869758Abstract: Systems and methods disclosed herein utilize an interface positioned between an ion source and an ion guide of a mass spectrometry system that can be useful to control transmission ions from an ion source to a downstream mass analyzer. In various aspects, the present disclosure provides methods of modulating an introduction of ions into an ion guide. In some embodiments, the present disclosure provides methods of making and using disclosed interface elements and mass spectrometry systems. In some embodiments, implementations of the present disclosure are useful in mass spectrometry systems, including, for example, improving signal-to-noise and reducing contamination.Type: GrantFiled: August 21, 2019Date of Patent: January 9, 2024Inventor: James Hager
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Patent number: 11810771Abstract: In one aspect, a mass analyzer is disclosed, which comprises a quadrupole having an input end for receiving ions and an output end through which ions can exit the quadrupole, said quadrupole having a plurality of rods to at least some of which an RF voltage can be applied for generating a quadrupolar field for causing radial confinement of the ions as they propagate through the quadrupole and further generating fringing fields in proximity of said output end. The mass analyzer further includes at least a voltage source for applying a voltage pulse to at least one of said rods so as to excite radial oscillations of at least a portion of the ions passing through the quadrupole at secular frequencies thereof, where the radially-excited ions interact with the fringing fields as they exit the quadrupole such that their radial oscillations are converted into axial oscillations.Type: GrantFiled: January 29, 2018Date of Patent: November 7, 2023Assignee: DH Technologies Development Pte. Ltd.Inventor: James Hager
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Publication number: 20230147220Abstract: Systems and methods disclosed herein utilize an interface positioned between an ion source and an ion guide of a mass spectrometry system that can be useful to control transmission ions from an ion source to a downstream mass analyzer. In various aspects, the present disclosure provides methods of modulating an introduction of ions into an ion guide. In some embodiments, the present disclosure provides methods of making and using disclosed interface elements and mass spectrometry systems. In some embodiments, implementations of the present disclosure are useful in mass spectrometry systems, including, for example, improving signal-to-noise and reducing contamination.Type: ApplicationFiled: August 21, 2019Publication date: May 11, 2023Inventor: James Hager
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Publication number: 20230027201Abstract: In one aspect, a mass spectrometer is disclosed, which comprises a Fourier Transform (FT) mass analyzer having an input port for receiving ions and an exit port through which the ions exit the FT mass analyzer, a detector disposed downstream of said FT analyzer for detecting ions exiting the FT analyzer, and a multi-segment ion guide having a plurality of segments, said multi-segment ion guide being disposed upstream of said FT mass analyzer and having an input port for receiving ions and an output port through which ions exit the FT mass analyzer. The segments of the ion guide are configured to be independently activated via application of a DC offset voltage thereto so as to adjust a length through which ions passing through the ion guide experience collisional cooling.Type: ApplicationFiled: January 14, 2021Publication date: January 26, 2023Applicant: DH TECHNOLOGIES DEVELOPMENT PTE. LTD.Inventor: James HAGER
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Publication number: 20230010966Abstract: In one aspect, a method of calibrating a Fourier Transform (FT) multipole mass spectrometer is disclosed, which comprises measuring a plurality of secular frequencies of a calibrant ion in a multipole FT mass analyzer for a plurality of RF voltages (VRF) applied to at least one rod of the multipole mass analyzer adjusted q analyzer, calculating Mathieu ? and q parameters for each of 5 the measured secular frequencies, and determining RF voltage amplitude (VRF) for each calculated q parameter. For each calculated q parameter, an offset RF voltage amplitude (?VRF) corresponding to a deviation of the applied VRF and the calculated VRF is determined so as to generate a ?VRFv.s. q calibration curve.Type: ApplicationFiled: September 29, 2020Publication date: January 12, 2023Inventor: James Hager
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Publication number: 20220384173Abstract: In various aspects, methods and systems disclosed herein are capable of operating a Fourier Transform Mass Spectrometry (FTMS) quadrupole mass analyzer in two operational modes: transmitting mode and trapping mode. In the trapping mode, ions are first trapped and cooled within the FTMS quadrupole mass analyzer prior to being subjected to an excitation pulse and ejected from the FTMS quadrupole mass analyzer for detection. However, in transmitting mode, the FTMS quadrupole mass analyzer may provide more rapid analysis because the excitation pulse is applied to the ions of an ion beam that is being continuously transmitted through the FTMS quadrupole mass analyzer.Type: ApplicationFiled: September 29, 2020Publication date: December 1, 2022Inventor: James Hager
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Publication number: 20210327700Abstract: Systems and methods described herein utilize a multipole ion guide that can receive ions from an ion source for transmission to downstream mass analyzers, while preventing unwanted/interfering/contaminating ions from being transmitted into the high-vacuum chambers of mass spectrometry systems. In various aspects, RF and/or DC signals can be provided to auxiliary electrodes interposed within a quadrupole rod set so as to control or manipulate the transmission of ions from the multipole ion guide.Type: ApplicationFiled: August 21, 2019Publication date: October 21, 2021Inventor: James Hager
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Publication number: 20210134573Abstract: In one aspect, a mass analyzer is disclosed, which comprises a quadrupole having an input end for receiving ions and an output end through which ions can exit the quadrupole, said quadrupole having a plurality of rods to at least some of which an RF voltage can be applied for generating a quadrupolar field for causing radial confinement of the ions as they propagate through the quadrupole and further generating fringing fields in proximity of said output end. The mass analyzer further includes at least a voltage source for applying a voltage pulse to at least one of said rods so as to excite radial oscillations of at least a portion of the ions passing through the quadrupole at secular frequencies thereof, where the radially-excited ions interact with the fringing fields as they exit the quadrupole such that their radial oscillations are converted into axial oscillations.Type: ApplicationFiled: January 29, 2018Publication date: May 6, 2021Inventor: James Hager
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Patent number: 9997340Abstract: A mass spectrometer apparatus and method for conducting simultaneous MS/MS analysis including: a device to select a precursor ion having a specified m/z; a gas-filled collision cell; an RF-only multipole mass spectrometer, the mass spectrometer having a generator attached thereto for generating at least two auxiliary AC fields in the RF-only multipole mass spectrometer; a gate for providing a repulsive DC or AC barrier downstream to an exit of the RF-only multipole mass spectrometer; an ion detection system situated downstream from the DC or AC barrier for measuring an ion current derived from ions that overcome the repulsive barrier. The mass spectrometer may also be configured so that each of the auxiliary AC fields are generated by the introduction of individual auxiliary AC frequencies and each frequency is amplitude modulated at a unique frequency.Type: GrantFiled: September 12, 2014Date of Patent: June 12, 2018Assignee: DH Technologies Development Pte. Ltd.Inventors: James Hager, Christopher M Lock
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Publication number: 20160225593Abstract: A mass spectrometer apparatus and method for conducting simultaneous MS/MS analysis including: a device to select a precursor ion having a specified m/z; a gas-filled collision cell; an RF-only multipole mass spectrometer, the mass spectrometer having a generator attached thereto for generating at least two auxiliary AC fields in the RF-only multipole mass spectrometer; a gate for providing a repulsive DC or AC barrier downstream to an exit of the RF-only multipole mass spectrometer; an ion detection system situated downstream from the DC or AC barrier for measuring an ion current derived from ions that overcome the repulsive barrier. The mass spectrometer may also be configured so that each of the auxiliary AC fields are generated by the introduction of individual auxiliary AC frequencies and each frequency is amplitude modulated at a unique frequency.Type: ApplicationFiled: September 12, 2014Publication date: August 4, 2016Inventors: James Hager, Christopher M Lock
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Patent number: 9202676Abstract: In some embodiments, a quantitative analysis of at least one ion signal associated with a sample, which is detected by a mass spectrometer having at least two tandem quadrupole instruments, is employed to select one of the following operational modes for further mass analysis of the sample: (a) utilizing both quadrupole instruments as mass resolving filters, and (b) utilizing one quadrupole instrument as a mass resolving filter and utilizing the other as a linear ion trap. In some embodiments, the quantitative analysis of the ion signal comprises comparing the ion signal intensity with a predefined threshold.Type: GrantFiled: November 28, 2012Date of Patent: December 1, 2015Assignee: DH Technologies Development Pte. Ltd.Inventors: John Lawrence Campbell, James Hager
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Publication number: 20150235828Abstract: In some embodiments, a quantitative analysis of at least one ion signal associated with a sample, which is detected by a mass spectrometer having at least two tandem quadrupole instruments, is employed to select one of the following operational modes for further mass analysis of the sample: (a) utilizing both quadrupole instruments as mass resolving filters, and (b) utilizing one quadrupole instrument as a mass resolving filter and utilizing the other as a linear ion trap. In some embodiments, the quantitative analysis of the ion signal comprises comparing the ion signal intensity with a predefined threshold.Type: ApplicationFiled: November 28, 2012Publication date: August 20, 2015Applicant: DH Technologies Development Pte. Ltd.Inventors: John Lawrence Campbell, James Hager
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Publication number: 20140353491Abstract: Methods and systems for creating a region for ion-ion reactions within a mass spectrometer are described. In various aspects, the methods and systems can confine a first group of ions in a sub-volume of a multipole ion trap, and introduce a second group of oppositely-charged ions into the multipole ion trap while maintaining the first group of ions within the sub-volume. In various embodiments, the methods and systems can operated at reduced pressures.Type: ApplicationFiled: December 6, 2012Publication date: December 4, 2014Applicant: DH Technologies Development Pte,Ltd.Inventors: James Hager, John Lawrence Campbell
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Patent number: 7880140Abstract: A multipole mass filter having improved mass resolution. The multipole mass filer having a first electrode set coupled to at least a RF voltage source and a second electrode set interposed and parallel to the first electrode set. The second electrode set having a variable AC voltage coupled to two radially opposing electrodes of the second electrode set.Type: GrantFiled: May 2, 2007Date of Patent: February 1, 2011Assignee: DH Technologies Development Pte. LtdInventors: Michael-Mircea Guna, James Hager
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Publication number: 20100176291Abstract: A mass analyzer system includes an ion inlet that receives a flow of ions, a multi-mode ion controller that controls some or all of the ions, and a multi-mode mass analyzer, in communication with the ion controller, that performs at least one of analyzing and controlling some or all of the ions. The system also includes a detector, in communication with the multi-mode mass analyzer, that detects some or all of the ions and a processor that controls the operation of at least one of the multi-mode ion controller and the multimode mass analyzer.Type: ApplicationFiled: January 8, 2010Publication date: July 15, 2010Applicant: MDS Analytical TechnologiesInventors: James Hager, Darin Latimer
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Patent number: 7622712Abstract: A method of operating a mass spectrometer system having an ion trap is provided. The method comprises encoding a selected characteristic in at least one of the first group of precursor ions and the first plurality of fragments, wherein the encoding operation is applied to at least one of the first group of precursor ions and the first plurality of fragments without being applied to other ions such that the first plurality of fragment ions has the first selected characteristic and the other ions lack the first selected characteristic.Type: GrantFiled: February 20, 2008Date of Patent: November 24, 2009Assignees: MDS Analytical Technologies, Applied Biosystems Inc.Inventor: James Hager
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Patent number: 7569813Abstract: A method of operating an ion trap spectrometer system having an ion trap is provided.Type: GrantFiled: August 21, 2007Date of Patent: August 4, 2009Assignees: MDS Analytical Technologies, a business unit of MDS Inc., Applied Biosystems, LLCInventor: James Hager
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Publication number: 20080272295Abstract: A multipole mass filter having improved mass resolution. The multipole mass filer having a first electrode set coupled to at least a RF voltage source and a second electrode set interposed and parallel to the first electrode set. The second electrode set having a variable AC voltage coupled to two radially opposing electrodes of the second electrode set.Type: ApplicationFiled: May 2, 2007Publication date: November 6, 2008Inventors: Michael Mircea-Guna, James Hager
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Publication number: 20080230691Abstract: A method of operating a mass spectrometer system having an ion trap is provided. The method comprises encoding a selected characteristic in at least one of the first group of precursor ions and the first plurality of fragments, wherein the encoding operation is applied to at least one of the first group of precursor ions and the first plurality of fragments without being applied to other ions such that the first plurality of fragment ions has the first selected characteristic and the other ions lack the first selected characteristic.Type: ApplicationFiled: February 20, 2008Publication date: September 25, 2008Applicant: MDS Analytical Technologies, a business unit of MDS Inc., doing business through its Sciex divisiInventor: James Hager
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Publication number: 20070114376Abstract: A mass spectrometer system having an ion trap and a downstream mass spectrometer is provided. A plurality of groups of ions are provided to the ion trap and a first mass-to-charge ratio is selected. The downstream mass spectrometer is configured to filter out one of (i) ions having a first unselected mass-to-charge ratio different from the first mass-to-charge ratio, and (ii) mass signals for ions having the first unselected mass-to-charge ratio different from the first mass-to-charge ratio.Type: ApplicationFiled: October 25, 2006Publication date: May 24, 2007Applicants: Sciex Division of MDS Inc., Applera CorporationInventor: James Hager