Patents by Inventor James Henry McGee, JR.

James Henry McGee, JR. has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Stationary bath for testing electronic components
    Patent number: 10481198
    Abstract: A system and method for stress-testing of electronic components are disclosed. The system and method include a stationary bath including a tub that defines an aperture in a plane, in which a plurality of slots are positionable and defined inside the tub and oriented orthogonally with respect to the plane. A dielectric fluid in the tub is heated by a heating element to a predetermined temperature value. A board is configured to be retrievably placed with one of the plurality of slots, the board having a plurality of sockets operable to receive corresponding electronic components.
    Type: Grant
    Filed: January 18, 2018
    Date of Patent: November 19, 2019
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: David Wayne Kaase, Joseph Milton Yehle, James Henry McGee, Jr., Clemon Howell
  • STATIONARY BATH FOR TESTING ELECTRONIC COMPONENTS
    Publication number: 20190204377
    Abstract: A system and method for stress-testing of electronic components are disclosed. The system and method include a stationary bath including a tub that defines an aperture in a plane, in which a plurality of slots are positionable and defined inside the tub and oriented orthogonally with respect to the plane. A dielectric fluid in the tub is heated by a heating element to a predetermined temperature value. A board is configured to be retrievably placed with one of the plurality of slots, the board having a plurality of sockets operable to receive corresponding electronic components.
    Type: Application
    Filed: January 18, 2018
    Publication date: July 4, 2019
    Inventors: David Wayne Kaase, Joseph Milton Yehle, James Henry McGee, JR., Clemon Howell
  • Method and apparatus for automated surge stress testing of a device under test using voltage and current waveforms
    Patent number: 9874600
    Abstract: Surge testing systems and methods to surge test a device under test (DUT) in which a host computer controls a pulse generator and an oscilloscope to automatically apply a high voltage pulse from the pulse generator through a current limiter to the DUT, the oscilloscope provides one or more current or voltage waveforms representing a voltage or current associated with the DUT and/or the pulse generator, and the host computer determines a pass or fail condition of the DUT for the applied high voltage pulse according to the waveform or waveforms.
    Type: Grant
    Filed: November 12, 2015
    Date of Patent: January 23, 2018
    Assignee: TEXAS INSTRUMENTS INCORPORATED
    Inventors: Joseph Milton Yehle, James Henry McGee, Jr.
  • METHOD AND APPARATUS FOR AUTOMATED SURGE STRESS TESTING USING VOLTAGE AND CURRENT WAVEFORMS
    Publication number: 20170139000
    Abstract: Surge testing systems and methods to surge test a device under test (DUT) in which a host computer controls a pulse generator and an oscilloscope to automatically apply a high voltage pulse from the pulse generator through a current limiter to the DUT, the oscilloscope provides one or more current or voltage waveforms representing a voltage or current associated with the DUT and/or the pulse generator, and the host computer determines a pass or fail condition of the DUT for the applied high voltage pulse according to the waveform or waveforms.
    Type: Application
    Filed: November 12, 2015
    Publication date: May 18, 2017
    Applicant: Texas Instruments Incorporated
    Inventors: Joseph Milton Yehle, James Henry McGee, JR.