Patents by Inventor James I. HARDY

James I. HARDY has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 11592377
    Abstract: A sensor for measuring the fatigue life of a structure subjected to repetitive loads is disclosed. The sensor includes a backing material arranged for securement to the structure, and a foil arranged for securement to the backing material. The foil includes a conductive path along which electrical current flows at an initial resistance measured prior to the structure being subjected to repetitive loads. A crack initiation feature in the form of a notch is located on the conductive path. In response to repetitive loads applied to the structure, one or more cracks propagate from the crack initiation feature across the conductive path to cause electrical resistance to increase whereby the progression of fatiguing of the structure may be determined.
    Type: Grant
    Filed: April 20, 2020
    Date of Patent: February 28, 2023
    Assignee: Vishay Measurements Group, Inc.
    Inventors: Thomas P. Kieffer, James I. Hardy, Robert B. Watson
  • Publication number: 20210325284
    Abstract: A sensor for measuring the fatigue life of a structure subjected to repetitive loads is disclosed. The sensor includes a backing material arranged for securement to the structure, and a foil arranged for securement to the backing material. The foil includes a conductive path along which electrical current flows at an initial resistance measured prior to the structure being subjected to repetitive loads. A crack initiation feature in the form of a notch is located on the conductive path. In response to repetitive loads applied to the structure, one or more cracks propagate from the crack initiation feature across the conductive path to cause electrical resistance to increase whereby the progression of fatiguing of the structure may be determined.
    Type: Application
    Filed: April 20, 2020
    Publication date: October 21, 2021
    Applicant: Vishay Measurements Group, Inc.
    Inventors: Thomas P. KIEFFER, James I. HARDY, Robert B. WATSON