Abstract: A method of testing a target electronic device implemented in a configurable integrated circuit device includes receiving a baseline design for the target electronic device in a hardware description language, establishing a fault model for the particular configurable integrated circuit device, synthesizing the fault model in the hardware description language, embedding the synthesized fault model into the baseline design to create a modified baseline design in the hardware description language which enables one or more targeted signals to be selectively corrupted, creating a fault model enabled target device on the particular configurable integrated circuit device using the modified baseline design, performing a number of fault injection experiments on the fault model enabled target device, wherein each fault injection experiment includes causing at least one of the one or more targeted signals to be corrupted within the fault model enabled target device.

Abstract: A method of testing a target electronic device implemented in a configurable integrated circuit device includes receiving a baseline design for the target electronic device in a hardware description language, establishing a fault model for the particular configurable integrated circuit device, synthesizing the fault model in the hardware description language, embedding the synthesized fault model into the baseline design to create a modified baseline design in the hardware description language which enables one or more targeted signals to be selectively corrupted, creating a fault model enabled target device on the particular configurable integrated circuit device using the modified baseline design, performing a number of fault injection experiments on the fault model enabled target device, wherein each fault injection experiment includes causing at least one of the one or more targeted signals to be corrupted within the fault model enabled target device.

Abstract: A SIR system has frontal air bags and side air bags both controlled by the same microprocessor. To guard against spurious deployment of side air bags with minimal software burden, a lateral accelerometer and an arming circuit detect side crash activity and apply an arming signal to a pulse accumulator circuit in the microprocessor which monitors the accumulator state to detect arming, thereby inhibiting deployment when the arming signal is absent. The arming circuit receives the accelerometer signal, removes the dc component which is subject to drift, adds a fixed offset voltage and compares the resultant signal to threshold values to produce an arming signal when a threshold is breached.