Patents by Inventor James L. Novak
James L. Novak has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).
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Publication number: 20090164147Abstract: A stress wave sensor comprising a piezoelectric film and means therein for connection to sensor electronics. The piezoelectric film preferably comprises polyvinylidene fluoride. Also a stress wave sensor system and methods employing one or more such stress wave sensors, preferably attached to a vehicle transparent component, most preferably to the vehicle windshield.Type: ApplicationFiled: February 26, 2009Publication date: June 25, 2009Inventors: Philip W. Kithil, Jame L. Novak, Daniel J. Du Rocher
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Patent number: 7516645Abstract: A stress wave sensor comprising a piezoelectric film and means therein for connection to sensor electronics. The piezoelectric film preferably comprises polyvinylidene fluoride. Also a stress wave sensor system and methods employing one or more such stress wave sensors, preferably attached to a vehicle transparent component, most preferably to the vehicle windshield.Type: GrantFiled: June 8, 2007Date of Patent: April 14, 2009Assignee: Methode Electronics, Inc.Inventors: Philip W. Kithil, James L. Novak, Daniel J. Du Rocher
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Patent number: 7475587Abstract: A stress wave sensor comprising a piezoelectric film and means therein for connection to sensor electronics. The piezoelectric film preferably comprises polyvinylidene fluoride. Also a stress wave sensor system and methods employing one or more such stress wave sensors, preferably attached to a vehicle transparent component, most preferably to the vehicle windshield.Type: GrantFiled: July 30, 2004Date of Patent: January 13, 2009Assignee: Methode Electronics, IncInventors: Philip W. Kithil, James L. Novak, Daniel J. Du Rocher
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Patent number: 7376507Abstract: A geophysics-based method for determining the position of a stationary earth object uses the periodic changes in the gravity vector of the earth caused by the sun- and moon-orbits. Because the local gravity field is highly irregular over a global scale, a model of local tidal accelerations can be compared to actual accelerometer measurements to determine the latitude and longitude of the stationary object.Type: GrantFiled: May 27, 2004Date of Patent: May 20, 2008Assignee: Sandia CorporationInventors: Michael R. Daily, Steven B. Rohde, James L. Novak
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Patent number: 6369588Abstract: A system for electrically measuring variations over a flexible web has a capacitive sensor including spaced electrically conductive, transmit and receive electrodes mounted on a flexible substrate. The sensor is held against a flexible web with sufficient force to deflect the path of the web, which moves relative to the sensor.Type: GrantFiled: November 9, 1999Date of Patent: April 9, 2002Inventors: Gerard E. Sleefe, Thomas J. Rudnick, James L. Novak
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Patent number: 5793176Abstract: Linear and other features on a workpiece are tracked by measuring the fields generated between electrodes arrayed in pairs. One electrode in each pair operates as a transmitter and the other as a receiver, and both electrodes in a pair are arrayed on a carrier. By combining and subtracting fields between electrodes in one pair and between a transmitting electrode in one pair and a receiving electrode in another pair, information describing the location and orientation of the sensor relative to the workpiece in up to six degrees of freedom may be obtained. Typical applications will measure capacitance, but other impedance components may be measured as well. The sensor is designed to track a linear feature axis or a protrusion or pocket in a workpiece. Seams and ridges can be tracked by this non-contact sensor. The sensor output is useful for robotic applications.Type: GrantFiled: April 2, 1993Date of Patent: August 11, 1998Assignee: Sandia CorporationInventor: James L. Novak
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Patent number: 5764066Abstract: A sensing system locates an object by sensing the object's effect on electric fields. The object's effect on the mutual capacitance of electrode pairs varies according to the distance between the object and the electrodes. A single electrode pair can sense the distance from the object to the electrodes. Multiple electrode pairs can more precisely locate the object in one or more dimensions.Type: GrantFiled: June 19, 1997Date of Patent: June 9, 1998Assignee: Sandia CorporationInventors: James L. Novak, Ben Petterson
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Patent number: 5602486Abstract: An apparatus and method for sensing impedances of materials placed in contact therewith. The invention comprises a plurality of drive electrodes and one or more sense electrodes. Both rotating electric fields and differently shaped electric fields are provided for, as are analysis of structure and composition at different orientations and depths.Type: GrantFiled: November 10, 1994Date of Patent: February 11, 1997Assignee: Sandia CorporationInventor: James L. Novak
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Patent number: 5537048Abstract: An apparatus and method for processing materials by sensing roller, in which the sensing roller has a plurality of conductive rings (electrodes) separated by rings of dielectric material. Sensing capacitances or impedances between the electrodes provides information on thicknesses of the materials being processed, location of wires therein, and other like characteristics of the materials.Type: GrantFiled: March 14, 1994Date of Patent: July 16, 1996Assignee: Sandia CorporationInventor: James L. Novak
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Patent number: 5473257Abstract: A system and method are provided for establishing the feed rate of a workpiece along a feed path with respect to a machine device. First and second sensors each having first and second sensing electrodes which are electrically isolated from the workpiece are positioned above, and in proximity to the desired surfaces of the workpiece along a feed path. An electric field is developed between the first and second sensing electrodes of each sensor and capacitance signals are developed which are indicative of the contour of the workpiece. First and second image signals representative of the contour of the workpiece along the feed path are developed by an image processor. The time delay between corresponding portions of the first and second image signals are then used to determine the feed rate based upon the separation of the first and second sensors and the amount of time between corresponding portions of the first and second image signals.Type: GrantFiled: August 26, 1994Date of Patent: December 5, 1995Assignee: Sandia CorporationInventors: James L. Novak, James J. Wiczer
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Patent number: 5378994Abstract: A system and a method is provided for imaging desired surfaces of a workpiece. A sensor having first and second sensing electrodes which are electrically isolated from the workpiece is positioned above and in proximity to the desired surfaces of the workpiece. An electric field is developed between the first and second sensing electrodes of the sensor in response to input signals being applied thereto and capacitance signals are developed which are indicative of any disturbances in the electric field as a result of the workpiece. An image signal of the workpiece may be developed by processing the capacitance signals. The image signals may provide necessary control information to a machining device for machining the desired surfaces of the workpiece in processes such as deburring or chamfering. Also, the method and system may be used to image dimensions of weld pools on a workpiece and surfaces of glass vials.Type: GrantFiled: December 9, 1993Date of Patent: January 3, 1995Inventors: James L. Novak, James J. Wiczer
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Patent number: 5281921Abstract: A system and a method for imaging desired surfaces of a workpiece. A sensor having first and second sensing electrodes which are electrically isolated from the workpiece is positioned above and in proximity to the desired surfaces of the workpiece. An electric field is developed between the first and second sensing electrodes of the sensor in response to input signals being applied thereto and capacitance signals are developed which are indicative of any disturbances in the electric field as a result of the workpiece. An image signal of the workpiece may be developed by processing the capacitance signals. The image signals may provide necessary control information to a machining device for machining the desired surfaces of the workpiece in processes such as deburring or chamfering. Also, the method and system may be used to image dimensions of weld pools on a workpiece and surfaces of glass vials.Type: GrantFiled: April 24, 1990Date of Patent: January 25, 1994Inventors: James L. Novak, James J. Wiczer