Abstract: An intensified charge coupled image sensor comprises an image intensifier tube including an evacuated envelope having therein a photoemissive cathode, a charge coupled device spaced from said cathode, and a frame member for supporting the charge coupled device. The charge coupled device has a first surface and a second surface with a conductive boundary on the first surface. The frame member has a coefficient of expansion closely matching that of the charge coupled device and a first and second surface with a conductive pattern formed on one of the surfaces. The conductive boundary of the CCD and the conductive pattern of the frame member are in register and bonded together by a braze material to form a unitized structure of superior strength. The method of forming the conductive boundary and the conductive pattern is described as is the brazing method.

Abstract: An improved electron discharge device comprises an evacuated envelope having at least one alumina ceramic insulator member. Within the device is a source of electrons, and an electron multiplier assembly including an anode. A high resistance material is diffused into the ceramic insulator to reduce luminescence within the insulator. The method of diffusion includes the steps of applying an opaque coating of a high resistance material to a surface of the ceramic insulator member and then firing the member in a reducing atmosphere at a temperature within the range of about 1500.degree. C. to 1550.degree. C. until the high resistance material diffuses into the surface of the member forming a diffusion region.

Abstract: An intensified charge coupled image sensor comprises an inverter image intensifier tube having an evacuated envelope with a longitudinally extending optical axis. The sensor has a photoemissive cathode and a charge coupled device spaced from the cathode. The charge coupled device includes an A register, a B register, a C register and a plurality of electrodes disposed on a surface thereof. The charge coupled device is resiliently held by a holder plate which has an imaging aperture therethrough. In the preferred embodiment, the imaging aperture is centered about the optical axis and permits electron emission from the cathode to impinge upon at least a portion of the A and B register. Other imaging aperture configurations limit electron impingement to a single column of pixels in the A and B registers and to the A register only.