Patents by Inventor James M. Jarboe

James M. Jarboe has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • CPU-based system and method for testing embedded memory
    Patent number: 6865694
    Abstract: A CPU-based system 10 and method for testing embedded memory. The technique employs the on-chip CPU 20 itself to test the embedded memory 24. An assembly code program is loaded into the device under test (DUT) 12 to test the memories, determine a repair solution, and write out the repair solution and raw failure information to the tester for defect analysis. The test is driven by an external programmable clock that is provided by the tester to allow the DUT 12 to run up to its maximum input clock rate in order to maximize throughput. The test is not dependent on the pattern rate of the tester.
    Type: Grant
    Filed: April 30, 2002
    Date of Patent: March 8, 2005
    Assignee: Texas Instruments Incorporated
    Inventors: Nicholas H. Schutt, James M. Jarboe, Jr., Bibo Chen
  • CPU-based system and method for testing embedded memory
    Publication number: 20030204782
    Abstract: A CPU-based system 10 and method for testing embedded memory. The technique employs the on-chip CPU 20 itself to test the embedded memory 24. An assembly code program is loaded into the device under test (DUT) 12 to test the memories, determine a repair solution, and write out the repair solution and raw failure information to the tester for defect analysis. The test is driven by an external programmable clock that is provided by the tester to allow the DUT 12 to run up to its maximum input clock rate in order to maximize throughput. The test is not dependent on the pattern rate of the tester.
    Type: Application
    Filed: April 30, 2002
    Publication date: October 30, 2003
    Inventors: Nicholas H. Schutt, James M. Jarboe, Bibo Chen