Patents by Inventor James Mattheis

James Mattheis has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 7317194
    Abstract: An optical imager, such as a microscope for performing multiple frequency fluorometric measurements comprising a light source, such as a laser source is disclosed. The system is used to excite a sample into the fluorescent state. Light from the excited sample is collected by a microscope. The microscope utilizes conventional confocal optics optimized to have a very narrow depth of field, thus limiting the information collected to a thin planar region. Measurements are taken over the fluorescence lifetime of the sample simultaneously from the excitation source and from the excited sample. Information is taken in a matrix and comparison of the image matrix and the standard during simultaneous measurements yields output information.
    Type: Grant
    Filed: January 23, 2004
    Date of Patent: January 8, 2008
    Assignee: Horiba Jobin Yuon, Inc.
    Inventors: Salvatore Atzeni, James Mattheis, Raymond Kaminski
  • Publication number: 20060289785
    Abstract: The invention relates to methods and devices for luminescent (e.g., fluorometric) measurement. The disclosure includes frequency domain and single photon counting methods and utilizes low capacitance semiconductor light emitting devices.
    Type: Application
    Filed: January 6, 2006
    Publication date: December 28, 2006
    Inventors: David McLoskey, Glenn Baker, Salvatore Atzeni, James Mattheis
  • Publication number: 20060241872
    Abstract: A method for identification of a material by analysis of a sample of the material is disclosed. The method comprises illuminating the sample to be identified with excitation light at a plurality of excitation wavelengths. The intensity of light emitted is measured at a plurality of emission wavelengths for excitation light at each of the plurality of excitation wavelengths to define a measured three-dimensional intensity contour. The measured three dimensional intensity contour is substantially continuous. The values of maxima are located in the three-dimensional intensity contour. The maximum values are compared to a library of values of known maxima associated with known species to obtain a likely more precise identification of a likely maxima. A model of a three-dimensional intensity contour is generated based on maxima values comprising values of likely maxima from the library.
    Type: Application
    Filed: April 25, 2005
    Publication date: October 26, 2006
    Inventors: Adam Gilmore, James Mattheis
  • Publication number: 20060017921
    Abstract: An optical imager, such as a microscope for performing multiple frequency fluorometric measurements comprising a light source, such as a laser source is disclosed. The system is used to excite a sample into the fluorescent state. Light from the excited sample is collected by a microscope. The microscope utilizes conventional confocal optics optimized to have a very narrow depth of field, thus limiting the information collected to a thin planar region. Measurements are taken over the fluorescence lifetime of the sample simultaneously from the excitation source and from the excited sample. Information is taken in a matrix and comparison of the image matrix and the standard during simultaneous measurements yields output information.
    Type: Application
    Filed: July 19, 2005
    Publication date: January 26, 2006
    Inventors: Glenn Baker, Salvatore Atzeni, James Mattheis, Raymond Kaminski
  • Publication number: 20040223152
    Abstract: An optical imager, such as a microscope for performing multiple frequency fluorometric measurements comprising a light source, such as a laser source is disclosed. The system is used to excite a sample into the fluorescent state. Light from the excited sample is collected by a microscope. The microscope utilizes conventional confocal optics optimized to have a very narrow depth of field, thus limiting the information collected to a thin planar region. Measurements are taken over the fluorescence lifetime of the sample simultaneously from the excitation source and from the excited sample. Information is taken in a matrix and comparison of the image matrix and the standard during simultaneous measurements yields output information.
    Type: Application
    Filed: January 23, 2004
    Publication date: November 11, 2004
    Inventors: Salvatore Atzeni, James Mattheis, Raymond Kaminski