Abstract: Disclosed embodiments include systems and methods of correcting induction logging data for relative dip. Initial induction logging data is measured at a plurality of frequencies. One example embodiment includes displaying dip corrected data for a plurality of different relative dip angles, which may further be displayed with a qualitative indicator displayed over many depth samples for selecting or validating a correct relative dip angle. The data may be iteratively processed using an automated relative dip correction algorithm and analyzed by the user to obtain and apply the best relative dip correction angle to induction logging data. Once dip corrected, the induction logging data can be used with resistivity methodologies generally designed for instances where no dip is present in the formation under analysis.

Abstract: Disclosed embodiments include systems and methods of correcting induction logging data for relative dip. Initial induction logging data is measured at a plurality of frequencies. One example embodiment includes displaying dip corrected data for a plurality of different relative dip angles, which may further be displayed with a qualitative indicator displayed over many depth samples for selecting or validating a correct relative dip angle. The data may be iteratively processed using an automated relative dip correction algorithm and analyzed by the user to obtain and apply the best relative dip correction angle to induction logging data. Once dip corrected, the induction logging data can be used with resistivity methodologies generally designed for instances where no dip is present in the formation under analysis.