Patents by Inventor James N. Hilfiker

James N. Hilfiker has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Ellipsometric investigation and analysis of textured samples
    Patent number: 8570513
    Abstract: System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures.
    Type: Grant
    Filed: November 3, 2011
    Date of Patent: October 29, 2013
    Assignee: J.A. Woollam Co., Inc.
    Inventors: James N. Hilfiker, Jianing Sun, Ping He, Martin M. Liphardt
  • Ellipsometric investigation and analysis of textured samples
    Publication number: 20120057158
    Abstract: System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures.
    Type: Application
    Filed: November 3, 2011
    Publication date: March 8, 2012
    Inventors: James N. Hilfiker, Jianing Sun, Ping He, Martin M. Liphardt
  • Ellipsometric investigation and analysis of textured samples
    Patent number: 8059276
    Abstract: System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures.
    Type: Grant
    Filed: December 8, 2008
    Date of Patent: November 15, 2011
    Assignee: J.A. Woollam Co., Inc
    Inventors: James N. Hilfiker, Jianing Sun, Ping He, Martin M. Liphardt
  • System for controlling intensity of a beam of electromagnetic radiation and method for investigating materials with low specular reflectance and/or are depolarizing
    Patent number: 7821637
    Abstract: Disclosed is a system for controlling focus, angle of incidence and intensity of an electromagnetic beam over a spectrum of wavelengths, and methodology for optimizing investigation of samples which demonstrate low specular reflectance and/or are depolarizing of a polarized beam of electromagnetic radiation, such as solar cells.
    Type: Grant
    Filed: February 21, 2008
    Date of Patent: October 26, 2010
    Assignee: J.A. Woollam Co., Inc.
    Inventors: Galen L. Pfeiffer, Martin M. Liphardt, James N. Hilfiker
  • Ellipsometric investigation and analysis of textured samples
    Publication number: 20090103094
    Abstract: System for, and method of ellipsometric investigation of and analysis of samples which have, for instance, a non-random effectively “regular” textured surface, and/or a surface characterized by an irregular array of faceted structures.
    Type: Application
    Filed: December 8, 2008
    Publication date: April 23, 2009
    Inventors: James N. Hilfiker, Jianing Sun, Ping He, Martin M. Liphardt
  • Sample analysis methodology utilizing electromagnetic radiation
    Patent number: 7385697
    Abstract: Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.
    Type: Grant
    Filed: May 20, 2004
    Date of Patent: June 10, 2008
    Assignee: J.A. Woollam Co., Inc.
    Inventors: John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil, Craig M. Herzinger, Blaine D. Johs, James N. Hilfiker
  • Sample analysis methodology utilizing electromagnetic radiation
    Publication number: 20040257567
    Abstract: Simultaneous use of wavelengths in at least two ranges selected from RADIO, MICRO, FIR, IR, NIR-VIS-NUV, UV, DUV, VUV EUV, XRAY in a regression procedure to evaluate parameters in mathematical dispersion structures to model dielectric functions.
    Type: Application
    Filed: May 20, 2004
    Publication date: December 23, 2004
    Inventors: John A. Woollam, Corey L. Bungay, Thomas E. Tiwald, Martin M. Liphardt, Ronald A. Synowicki, Gregory K. Pribil, Craig M. Herzinger, Blaine D. Johs, James N. Hilfiker
  • Method for evaluating sample system anisotropic refractive indices and orientations thereof in multiple dimensions
    Patent number: 6441902
    Abstract: Disclosed is a method of evaluating sample system anisotropic refractive indices, and orientations thereof with respect to an alignment surface, in multiple dimensions. The preferred method involves a sequence of steps which allows overcoming mathematical model parameter correlation during mathematical regression parameter evaluation, even though individually, steps of the present invention method wherein anisotropic refractive indices, or differences therebetween, are evaluated, require that only a relatively simple one dimensional data set be acquired.
    Type: Grant
    Filed: December 29, 1999
    Date of Patent: August 27, 2002
    Assignee: J. A. Woollam Co. Inc.
    Inventors: James N. Hilfiker, Corey L. Bungay, Craig M. Herzinger