Patents by Inventor James P. Hubner

James P. Hubner has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Patent number: 6943869
    Abstract: A method and apparatus for measuring strain on a surface of a substrate utilizes a substrate surface coated with at least one coating layer. The coating layer provides both luminescence and photoelasticity. The coating layer is illuminated with excitation light, wherein longer wavelength light is emitted having a polarization dependent upon stress or strain in the coating. At least one characteristic of the emitted light is measured, and strain (if present) on the substrate is determined from the measured characteristic.
    Type: Grant
    Filed: April 4, 2003
    Date of Patent: September 13, 2005
    Assignees: Resesarch Foundation, Inc., Visteon Global Technologies, Inc.
    Inventors: James P. Hubner, Peter G. Ifju, Kirk S. Schanze, Shujun Jiang, Yao Liu, David A. Jenkins
  • Publication number: 20040066503
    Abstract: A method and apparatus for measuring strain on a surface of a substrate utilizes a substrate surface coated with at least one coating layer. The coating layer provides both luminescence and photoelasticity. The coating layer is illuminated with excitation light, wherein longer wavelength light is emitted having a polarization dependent upon stress or strain in the coating. At least one characteristic of the emitted light is measured, and strain (if present) on the substrate is determined from the measured characteristic.
    Type: Application
    Filed: April 4, 2003
    Publication date: April 8, 2004
    Inventors: James P. Hubner, Peter G. Ifju, Kirk S. Schanze, Shujun Jiang, Yao Liu, David A. Jenkins, Wissam El-Ratal