Patents by Inventor James P. Nuxoll

James P. Nuxoll has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices
    Patent number: 6490188
    Abstract: Disclosed are semiconductor devices having terminal arrangements in which mirrored pairs of the semiconductor devices can be tested by a common test device.
    Type: Grant
    Filed: September 4, 2001
    Date of Patent: December 3, 2002
    Assignee: Micron Technology, Inc.
    Inventors: James P. Nuxoll, Steven L. Hamren
  • Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices
    Patent number: 6442056
    Abstract: Disclosed are semiconductor devices having terminal arrangements in which mirrored pairs of the semiconductor devices can be tested by a common test device.
    Type: Grant
    Filed: April 30, 2001
    Date of Patent: August 27, 2002
    Assignee: Micron Technology, Inc.
    Inventors: James P. Nuxoll, Steven L. Hamren
  • Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices
    Publication number: 20020044476
    Abstract: Disclosed are semiconductor devices having terminal arrangements in which mirrored pairs of the semiconductor devices can be tested by a common test device.
    Type: Application
    Filed: September 4, 2001
    Publication date: April 18, 2002
    Inventors: James P. Nuxoll, Steven L. Hamren
  • Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices
    Patent number: 6307769
    Abstract: Disclosed are semiconductor devices having terminal arrangements in which mirrored pairs of the semiconductor devices can be tested by a common test device.
    Type: Grant
    Filed: September 2, 1999
    Date of Patent: October 23, 2001
    Assignee: Micron Technology, Inc.
    Inventors: James P. Nuxoll, Steven L. Hamren
  • Semiconductor devices having mirrored terminal arrangements, devices including same, and methods of testing such semiconductor devices
    Publication number: 20010022740
    Abstract: Disclosed are semiconductor devices having terminal arrangements in which mirrored pairs of the semiconductor devices can be tested by a common test device.
    Type: Application
    Filed: April 30, 2001
    Publication date: September 20, 2001
    Inventors: James P. Nuxoll, Steven L. Hamren
  • Apparatus for loading and unloading burn-in boards
    Patent number: 5842272
    Abstract: An apparatus for rapidly and automatically handling packaged integrated circuits (ICs) during the loading or unloading of burn-in boards. The apparatus also segregates and offloads packaged ICs into a plurality of reservoirs for controlled delivery into suitable transport media on the basis of the level of functionality attained by each part during the burn-in process. The apparatus is computer controlled, with operator interface and an electronic control panel. The apparatus employs a linear induction motor drive system to rapidly, precisely and accurately move the ICs both between a loading/unloading location and a staging location, and at the staging location itself during the segregation and offloading steps. The system may be extended to operate in either the single or dual mode, employing two sorting and offloading components to unload a single device under test board.
    Type: Grant
    Filed: February 28, 1996
    Date of Patent: December 1, 1998
    Assignee: Micron Technology, Inc.
    Inventor: James P. Nuxoll
  • Apparatus for loading and unloading burn-in boards
    Patent number: 5509193
    Abstract: An apparatus for rapidly and automatically handling packaged integrated circuits (ICs) during the loading or unloading of burn-in boards. The apparatus also segregates and offloads packaged ICs into a plurality of reservoirs for controlled delivery into suitable transport media on the basis of the level of functionality attained by each part during the burn-in process. The apparatus is computer controlled, with operator interface and an electronic control panel. The apparatus employs a linear induction motor drive system to rapidly, precisely and accurately move the ICs both between a loading/unloading location and a staging location, and at the staging location itself during the segregation and offloading steps. The system may be extended to operate in either the single or dual mode, employing two sorting and offloading components to unload a single device under test board.
    Type: Grant
    Filed: May 6, 1994
    Date of Patent: April 23, 1996
    Assignee: Micron Technology, Inc.
    Inventor: James P. Nuxoll