Abstract: A wafer map host system and methodology that supports the use of and manipulation of wafer map information for multiple semiconductor processes is disclosed. The system includes a database for storing wafer maps; an interface for providing interfaces to a plurality of wafer manufacturing processes and/or equipment; and a wafer map processor coupled between said database and said interface for managing relationships of various tasks during a wafer map data transaction between the processes and/or equipment and the database. The tasks include deciding which wafer map is required, which equipment is involved, what is the manufacturing flow being used, how to re-map the various bin assignments considering the next manufacturing process, and merging two or more wafer map data for the next manufacturing process.