Abstract: An integrated circuit includes an I/O pad and a protection device coupled to the I/O pad and a first supply node. A transient event detector includes a latch; a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to a first supply node, and a second current electrode coupled to a data input of the latch, wherein the latch is configured to store an indication that a transient event occurred. An event level sensor includes a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to the protection device, and a second current electrode coupled to a load circuit; a rectifier device coupled between the second current electrode and a capacitor; a second transistor having a control electrode coupled to the capacitor; and an output circuit configured to place a current on a first sense bus proportional to a current through the load circuit.

Abstract: A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnormally high parameter values (e.g. abnormally low or high voltage, temperature, or clock frequency) may be detected. Abnormal clock detection may also detect a stopped clock signal, including a clock signal stopped at a low logic level or at a high logic level. Furthermore, abnormal clock detection may detect an abnormal duty cycle of a clock signal. A sampled bandgap reference may be used to provide accurate voltage and current references while consuming a minimal amount of power. Upon detection of an abnormal parameter value, one or more tamper indications may be provided to initiate tampering countermeasures, such as limiting access to the IC.

Abstract: An integrated circuit includes an I/O pad and a protection device coupled to the I/O pad and a first supply node. A transient event detector includes a latch; a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to a first supply node, and a second current electrode coupled to a data input of the latch, wherein the latch is configured to store an indication that a transient event occurred. An event level sensor includes a first transistor having a first current electrode coupled to the I/O pad, a control electrode coupled to the protection device, and a second current electrode coupled to a load circuit; a rectifier device coupled between the second current electrode and a capacitor; a second transistor having a control electrode coupled to the capacitor; and an output circuit configured to place a current on a first sense bus proportional to a current through the load circuit.

Abstract: Systems and methods for electronically converting an analog signal to a digital signal are disclosed. The systems and methods may include, for a first bit value, setting a first conversion value to include a first offset; using the output of a first comparison, setting a second conversion value; and if the first bit value has a predetermined relationship to the first offset bit value, removing the first offset from the second conversion value, and, using the output of a second comparison, setting a third conversion value.

Abstract: Systems and methods for electronically converting an analog signal to a digital signal are disclosed. The systems and methods may include, for a first bit value, setting a first conversion value to include a first offset; using the output of a first comparison, setting a second conversion value; and if the first bit value has a predetermined relationship to the first offset bit value, removing the first offset from the second conversion value, and, using the output of a second comparison, setting a third conversion value.

Abstract: A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnormally high parameter values (e.g. abnormally low or high voltage, temperature, or clock frequency) may be detected. Abnormal clock detection may also detect a stopped clock signal, including a clock signal stopped at a low logic level or at a high logic level. Furthermore, abnormal clock detection may detect an abnormal duty cycle of a clock signal. A sampled bandgap reference may be used to provide accurate voltage and current references while consuming a minimal amount of power. Upon detection of an abnormal parameter value, one or more tamper indications may be provided to initiate tampering countermeasures, such as limiting access to the IC.

Abstract: A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnormally high parameter values (e.g. abnormally low or high voltage, temperature, or clock frequency) may be detected. Abnormal clock detection may also detect a stopped clock signal, including a clock signal stopped at a low logic level or at a high logic level. Furthermore, abnormal clock detection may detect an abnormal duty cycle of a clock signal. A sampled bandgap reference may be used to provide accurate voltage and current references while consuming a minimal amount of power. Upon detection of an abnormal parameter value, one or more tamper indications may be provided to initiate tampering countermeasures, such as limiting access to the IC.

Abstract: A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.

Abstract: A method and apparatus for limiting access to an integrated circuit (IC) upon detection of abnormal conditions is provided. At least one of abnormal voltage detection, abnormal temperature detection, and abnormal clock detection are provided with low power consumption. Both abnormally low and abnormally high parameter values (e.g. abnormally low or high voltage, temperature, or clock frequency) may be detected. Abnormal clock detection may also detect a stopped clock signal, including a clock signal stopped at a low logic level or at a high logic level. Furthermore, abnormal clock detection may detect an abnormal duty cycle of a clock signal. A sampled bandgap reference may be used to provide accurate voltage and current references while consuming a minimal amount of power. Upon detection of an abnormal parameter value, one or more tamper indications may be provided to initiate tampering countermeasures, such as limiting access to the IC.

Abstract: A system for compensating for variations in the frequency of an input clock signal having a first frequency includes a coarse counter that receives the input clock signal, counts a predetermined number of clock pulses of the input clock signal, and generates a coarse compensated clock signal having a second frequency. A first compensation module adjusts a clock pulse of the input clock signal based on a coarse compensation value. A residual period adjustment module accumulates a fine compensation value for each clock pulse of the coarse compensated clock signal. A fine counter operates at a third frequency of a fine clock signal, receives an adjusted delay value based on the accumulated fine compensation value, counts a number of fine clock pulses in each clock pulse of the coarse compensated clock signal, and generates a fine compensated clock signal having the second frequency.

Abstract: A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.

Abstract: A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.

Abstract: A programmable-gain amplifier has a first input node coupled to receive a first input signal and a control input coupled to receive a gain select signal. The programmable-gain amplifier includes a differential amplifier having a first input and a first output and a plurality of capacitors. A first terminal of each of the plurality of capacitors is coupled to the first input of the differential amplifier, and a second terminal of each of the plurality of capacitors is coupled to the first input node during a sampling phase of the programmable-gain amplifier and selectively coupled to the first output of the differential amplifier, based on the gain select signal, during a gain phase of the programmable-gain amplifier.

Abstract: A single-ended SAR ADC includes an additional capacitor, a self-test engine, and independent control of sample and hold conditions, which allows for quick and accurate testing of the ADC.

Abstract: A measurement circuit and method for measuring a quiescent current of a circuit under test are provided. The measurement circuit comprises: a comparator having a first input terminal for receiving a reference voltage, a second input terminal coupled to the circuit under test, and an output terminal; a current source having a first terminal coupled to a first power supply voltage terminal, and a second terminal for providing a current to the circuit under test; a first switch having a first terminal coupled to the second terminal of the current source, a second terminal coupled to the circuit under test, and a control terminal coupled to the output terminal of the comparator; and a first counter having a first input terminal coupled to the output terminal of the comparator, a second input terminal for receiving a clock signal, and an output terminal for providing a first counter value associated with the quiescent current.

Abstract: A programmable-gain amplifier has a first input node coupled to receive a first input signal and a control input coupled to receive a gain select signal. The programmable-gain amplifier includes a differential amplifier having a first input and a first output and a plurality of capacitors. A first terminal of each of the plurality of capacitors is coupled to the first input of the differential amplifier, and a second terminal of each of the plurality of capacitors is coupled to the first input node during a sampling phase of the programmable-gain amplifier and selectively coupled to the first output of the differential amplifier, based on the gain select signal, during a gain phase of the programmable-gain amplifier.

Abstract: A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided.

Abstract: A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided.

Abstract: A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided.

Abstract: A data converter for converting analog signals to digital signals, or for converting digital signals to analog signals is provided. In one embodiment, a production self-test is provided. In one embodiment, a high-speed lower-resolution method or mode for a data converter is provided. In one embodiment, a differential data converter with a more stable comparator common mode voltage is provided. In one embodiment, the input range of a digitally calibrated data converter is provided and maintained so that there is no loss in input range due to the calibration. In one embodiment, digital post-processing of an uncalibrated result using a previously stored calibration value is provided.