Abstract: A method for identification of a sample of a material is disclosed. The method includes illuminating a sample at a plurality of excitation wavelengths, measuring the intensity at each of the plurality of excitation wavelengths, locating the values of maxima in the three-dimensional intensity contour, comparing the maxima to a library of values of known maxima associated with known species, generating a model of a three-dimensional intensity contour based on maxima values comprising values of likely maxima from the library, comparing the model of an intensity contour to the measured contour to determine residual errors, outputting the species associated with the maxima values used to generate the model as an indicator of species, determining corrections to the model of a three-dimensional intensity contour to generate a corrected model, and returning to the comparison step to test the corrected model.

Abstract: An optical imager, such as a microscope for performing multiple frequency fluorometric measurements comprising a light source, such as a laser source is disclosed. The system is used to excite a sample into the fluorescent state. Light from the excited sample is collected by a microscope. The microscope utilizes conventional confocal optics optimized to have a very narrow depth of field, thus limiting the information collected to a thin planar region. Measurements are taken over the fluorescence lifetime of the sample simultaneously from the excitation source and from the excited sample. Information is taken in a matrix and comparison of the image matrix and the standard during simultaneous measurements yields output information.