Patents by Inventor James R. Melcher, deceased

James R. Melcher, deceased has filed for patents to protect the following inventions. This listing includes patent applications that are pending as well as patents that have already been granted by the United States Patent and Trademark Office (USPTO).

  • Apparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometer
    Patent number: 5990677
    Abstract: Apparatus and methods are disclosed which provide increased sensitivity, selectivity and dynamic range for non-contact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application. A measurement apparatus for measuring one or more MUT properties includes an electromagnetic winding structure which, when driven by an electric signal, imposes a magnetic field in the MUT and senses an electromagnetic response. An analyzer is provided for applying the electric signal to the winding structure. A property estimator is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.
    Type: Grant
    Filed: May 9, 1997
    Date of Patent: November 23, 1999
    Assignee: Massachusetts Institute of Technology
    Inventors: Neil J. Goldfine, James R. Melcher, deceased
  • Apparatus and methods for obtaining increased sensitivity, selectivity and dynamic range in property measurement using magnetometers
    Patent number: 5629621
    Abstract: Apparatus and methods are disclosed which provide increased sensitivity, selectivity and dynamic range for non-contact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application.A measurement apparatus for measuring one or more MUT properties includes an electromagnetic winding structure which, when driven by an electric signal, imposes a magnetic field in the MUT and senses an electromagnetic response. An analyzer is provided for applying the electric signal to the winding structure. A property estimator is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.
    Type: Grant
    Filed: June 2, 1995
    Date of Patent: May 13, 1997
    Assignee: Massachusetts Institute of Technology
    Inventors: Neil J. Goldfine, James R. Melcher, deceased
  • Magnetometer having periodic winding structure and material property estimator
    Patent number: 5453689
    Abstract: Apparatus and methods are disclosed which provide increased sensitivity, selectivity and dynamic range for non-contact measurement of actual physical and/or kinematic properties of conducting and magnetic materials. The apparatus and methods are based upon various methods for increasing sensitivity, selectivity and dynamic range through proper construction of a magnetometer sensor and for proper selection of operating point parameters for the application. A measurement apparatus for measuring one or more MUT properties includes an electromagnetic winding structure which, when driven by an electric signal, imposes a magnetic field in the MUT and senses an electromagnetic response. An analyzer is provided for applying the electric signal to the winding structure. A property estimator is coupled to the winding structure and translates sensed electromagnetic responses into estimates of one or more preselected properties of the material.
    Type: Grant
    Filed: December 6, 1991
    Date of Patent: September 26, 1995
    Assignee: Massachusetts Institute of Technology
    Inventors: Neil J. Goldfine, James R. Melcher, deceased
  • Apparatus and methods for measuring permeability and conductivity in materials using multiple wavenumber magnetic interrogations
    Patent number: RE36986
    Abstract: Devices and analytical techniques are disclosed for measuring spatial profiles of complex permeability and conductivity of a material by multiple wavenumber interrogations. Coil array structures are disclosed which define a number of different fundamental wavelengths (or wavenumbers). Spatially periodic interrogation signals (of temporal frequency ".omega.") from the coil array structures are attenuated by varying degrees in the material undergoing analysis, depending on the wavenumber ("k"), thereby permitting the derivation of composite complex permeability/conductivity profile.
    Type: Grant
    Filed: May 14, 1993
    Date of Patent: December 12, 2000
    Assignee: Massachusetts Institute of Technology
    Inventor: James R. Melcher, deceased