Abstract: The invention relates to a system, an user equipment and a method for providing access to mobile communication services, allowing a user to regularly access his/her mobile services and applications through an Internet connection, but pretending to use a regular mobile device. The invention is based on an alternative user equipment equipped with a subscriber identity module to which it is associated the same telephone number as a subscriber identity module that is equipping the user's main regular mobile device, so that the alternative user equipment can access at least one communication service that is also available to the main regular mobile device.

Abstract: The invention relates to a system, an user equipment and a method for providing access to mobile communication services, allowing a user to regularly access his/her mobile services and applications through an Internet connection, but pretending to use a regular mobile device. The invention is based on an alternative user equipment equipped with a subscriber identity module to which it is associated the same telephone number as a subscriber identity module that is equipping the user's main regular mobile device, so that the alternative user equipment can access at least one communication service that is also available to the main regular mobile device.

Abstract: A method for measuring an integrated circuit (IC) structure by measuring an imprint of the structure, a method for preparing a test site for the above measuring, and IC so formed. The method for preparing the test site includes incrementally removing the structure from the substrate so as to reveal an imprint of the removed bottom surface of the structure in a top surface of the substrate. The imprint can then be imaged using an atomic force microscope (AFM). The image can be used to measure the bottom surface of the structure.

Abstract: A method for measuring an integrated circuit (IC) structure by measuring an imprint of the structure, a method for preparing a test site for the above measuring, and IC so formed. The method for preparing the test site includes incrementally removing the structure from the substrate so as to reveal an imprint of the removed bottom surface of the structure in a top surface of the substrate. The imprint can then be imaged using an atomic force microscope (AFM). The image can be used to measure the bottom surface of the structure.

Abstract: A method for measuring an integrated circuit (IC) structure by measuring an imprint of the structure, a method for preparing a test site for the above measuring, and IC so formed. The method for preparing the test site includes incrementally removing the structure from the substrate so as to reveal an imprint of the removed bottom surface of the structure in a top surface of the substrate. The imprint can then be imaged using an atomic force microscope (AFM). The image can be used to measure the bottom surface of the structure.

Abstract: A process for making an electronic device which comprises applying a non-aqueous solder mask ink which is substantially free from organic solvent to a dielectric substrate containing electrically conductive metal circuitry, exposing the solder mask ink to actinic radiation and/or particle beam radiation optionally followed by thermal treatment, whereby the solder mask ink is applied to selected areas of the substrate under the control of a computer by ink jet printing and wherein the solder mask ink comprises the components: A) 30-90 parts acrylate functional monomers which are mono or higher acrylate functional monomers comprising from 5-95% by weight of one or more monofunctional monomers; B) 0.1-30 parts metal adhesion promoting organic compound; C) 0-30 parts initiator, D) 0-10 parts polymer and/or prepolymer; E) 0-5 parts colorant; E) 0-5 parts surfactant; and Wherein all parts are by weight.

Abstract: A method for measuring an integrated circuit (IC) structure by measuring an imprint of the structure, a method for preparing a test site for the above measuring, and IC so formed. The method for preparing the test site includes incrementally removing the structure from the substrate so as to reveal an imprint of the removed bottom surface of the structure in a top surface of the substrate. The imprint can then be imaged using an atomic force microscope (AFM). The image can be used to measure the bottom surface of the structure.