Abstract: A vehicle lidar assembly includes a casing having a front cover and a back cover connected to the front cover defining a casing cavity between the front cover and the back cover. The front cover has an attachment feature designed to directly connect to a vehicle. The back cover is supported by the front cover and has fins designed to dissipate heat. The assembly includes a laser module disposed in the casing cavity. The laser module includes a housing having a hermetically-sealed cavity. The housing includes a base that is connected to the back cover. The laser module includes a laser disposed in the hermetically-sealed cavity 30 and supported by the base.

Abstract: A Lidar system includes a casing, a light emitter stationary relative to the casing, and a photodetector pivotally supported by the casing. The system includes a reflector assembly and the light emitter is aimed at the reflector assembly. The reflector assembly includes a rotational shaft and a reflector is fixed to the rotational shaft. A rotational motor is engaged with the rotational shaft. The aim of the photodetector may be adjusted, and the rotational motor may independently adjust the reflector assembly to correspondingly aim the reflector assembly.

Abstract: An automotive electronic sensor assembly includes a light source configured to generate light into a field of view. A detector is configured to receive light reflected off an object in the field of view. The assembly also includes a temperature regulation system. The temperature regulation system includes a thermoelectric cooler coupled to the automotive electronic sensor assembly and a heat exchanger coupled to the thermoelectric cooler and including a passage for accommodating fluid from a cooling system of a vehicle.

Abstract: A scanning probe microscope and method for using the same are disclosed. The Scanning probe microscope includes a probe mount for connecting a cantilever arm and a probe signal generator. The probe position signal generator generates a position signal indicative of a position of the probe relative to one end of the cantilever arm. The probe position signal generator includes a first light source that directs a light beam at a first reflector positioned on the cantilever arm and a detector that detects a position of the light beam after the light beam has been reflected from the first reflector. A second reflector reflects the light beam after the light beam is reflected from the first reflector and before the light beam enters the detector, the second reflector passing light from a second light source that illuminates the sample.

Abstract: A scanning probe microscope and method for using the same are disclosed. The Scanning probe microscope includes a probe mount for connecting a cantilever arm and a probe signal generator. The probe position signal generator generates a position signal indicative of a position of the probe relative to one end of the cantilever arm. The probe position signal generator includes a first light source that directs a light beam at a first reflector positioned on the cantilever arm and a detector that detects a position of the light beam after the light beam has been reflected from the first reflector. A second reflector reflects the light beam after the light beam is reflected from the first reflector and before the light beam enters the detector, the second reflector passing light from a second light source that illuminates the sample.

Abstract: An integrated cantilever sensor array system that accurately detects and measures the presence of target substances in various environmental conditions. The integrated cantilever sensor array system comprises a cantilever sensor measurement head, a cantilever sensor system for measuring the oscillatory properties of the cantilevers and a measurement chamber. The measurement head includes a cantilever array having at least one cantilever, a light source and a detector positioned to detect incoming light reflected by the cantilevers within the cantilever array. The cantilever sensor system measures the oscillatory properties generated by the cantilevers within the cantilever array. The system includes the cantilever array and a detection system that measures a signal related to the bending of the cantilever. In addition, optional components such as a high frequency clock, Q-Control, may be added to more accurately measure the oscillation of the cantilevers within the cantilever array.